• Journal of the Korean Vacuum Society
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• v.4 no.1
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• pp.51-59
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• 1995

(001)방향 GaAs 기판과 Si/Co 박막의 계면반응 및 상평형에 관한 연구를 300-$700^{\circ}C$ 열처리 구간에서 행하였다. 반응에 의한 상전이 과정은 glancing angle X-ray diffraction(GXRD), Auger electron spectroscopy(AES) 및 cross-sectional transmission electron microscopy(GXRD), Auger electron spectroscopy(AES) 및 corss-sectional transmission electron microscopy(XTEM)을 이용하여 분석하였다. Si/Co/GaAs계의 계면반응에서 Co는 $380^{\circ}C$에서 GaAs 기판 및 Si와 반응하여 Co2GaAs과 Co2Si상을 형성하였다. $420^{\circ}C$에서 열처리 후, Co층은 모두 소모되었으며 단면구조는 Si/CoSi/CoGa(CoAs)/Co2GaAs/GaAs으로 전이되었다. $460^{\circ}C$까지 온도를 올려 계속적인 반응을 일으키면 CoGa와 CoAs이 분해되면서 CoSi가 성장하였고, $600^{\circ}C$에서는 Co2GaAs마저 분해되고 CoSi상이 성장하여 GaAs와 계면을 형성하였다. CoSi와 GaAs사이의 계면은 $700^{\circ}C$의 고온까지 안정하였으며 이러한 계면반응 결과는 계산에 의하여 구한 Si-Co-Ga-As 4원계 상태도로부터 이해될 수 있었다.

• Journal of the Korean Vacuum Society
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• v.5 no.1
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• pp.54-61
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• 1996

Indium-tin oxide (ITO) films were deposited on the glass substrate by the reactive -ionized cluster beam deposition(ICBD) method. In the oxygen atmosphere, indium cluster formed through the nozzle is ionized by the electron bombardment and is accelerated to be deposited on the substrate. And tin is simultaneoulsy evaporated from the boron-nitride crucible. The chracteristics of films were examined by the X-ray photoelectron spectroscopy(XPS), glancing angle X-ray diffractrion(GXRD) and the electrical properties. were measured by 4-point-probe and Hall effect measurement system . From the XPS spectrum , it was found that indium and tin atoms combined with the oxygen to form oxide$(In_2O_3, SnO_2)$. In the case of films with high tin-concentration, the GXRD spectra show that the main $In_2O_3$ peak of (222) plane, but also sub peaks((440) peak etc.) and $SnO_2$ peaks were detected. From that results, itis concluded that the heavily dopped tin component (more than 14 at. %) disturbs to form $In_2O_3$(222) phase. Four-point-probe and Hall effect measurement show that, in the most desirable case, the transmittance of the films is more then 90% in visible range and its resistivity is $$\rho$=3.55 \times10^{-4}\Omega$cm and its mobility is $\mu$=42.8 $\textrm{cm}^2$/Vsec.

• Korean Journal of Materials Research
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• v.11 no.8
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• pp.671-678
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• 2001

All solid-state thin film micro supercapacitor, which consists of $RuO_2$/LiPON/$RuO_2$ multi layer structure, was fabricated on Pt/Ti/Si substrate using a $RuO_2$ electrode. Bottom $RuO_2$ electrode was grown by dc reactive sputtering system with increasing $O_2/[Ar+O_2]$ ratio at room temperature, and a LiPON electrolyte film was subsequently deposited on the bottom $RuO_2$ electrode at pure nitrogen ambient by rf reactive sputtering system. Room temperature charge-discharge measurements based on a symmetric $RuO_2$/LiPON/$RuO_2$ structure clearly demonstrates the cyclibility dependence on the microstructure of the $RuO_2$ electrode. Using both glancing angle x-ray diffraction (GXRD) and transmission electron microscopy (TEM) analysis, it was found that the microstructure of the $RuO_2$ electrode was dependent on the oxygen flow ratio. In addition, x- ray photoelectron spectroscopy(XPS) examination shows that the Ru-O binding energy is affected by increasing oxygen flow ratio. Furthermore, TEM and AES depth profile analysis after cycling demonstrates that the interface layer formed by interfacial reaction between LiPON and $RuO_2$ act as a main factor in the degradation of the cyclibility of the thin film micro-supercapacitor.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.13 no.9
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• pp.751-757
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• 2000

The r.f. power effect for Pt doping is investigated on structural and electrochemical properties of amorphous vanadium oxide(V$_2$O$_{5}$) film, grown by direct current (d.c.) magnetron sputtering. Room temperature charge-discharge measurements based on a half-cell with a constant current clearly indicated that the Pt doping could improve the cyclibility of V$_2$O$_{5}$ cathode film. Using glancing angle x-ray diffraction(GXRD) and high-resolution transmission electron microscopy (HRTEM) analysis, we found that the Pt doping with 10W r.f. power induces more random amorphous structure than undoped V$_2$O$_{5}$ film. As the r.f. power of Pt target increases. large amount of Pt atoms incorporates into the amorphous V$_2$O$_{5}$ film and makes $\alpha$-PtO$_2$microcrystalline phase in the amorphous V$_2$O$_{5}$ matrix. These results suggest that the semiconducting $\alpha$-PtO$_2$ microcrystalline phase in amorphous matrix lead to a drastically faded cyclibility of 50W Pt doped V$_2$O$_{5}$ cathode film. Possible explanations are given to describe the Pt doping effect on cyclibillity of the amorphous V$_2$O$_{5}$ cathode film battery. film battery.

• Korean Journal of Materials Research
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• v.13 no.9
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• pp.587-592
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• 2003

The thin films of 316L stainless steel were made on glass and S45C substrate by Ion beam assisted deposition with reactive atmosphere of argon and nitrogen. The films were deposited at the various conditions of ion beam power and the ratios of Ar/$N_2$gas. Properties of these films were analyzed by glancing x-ray diffraction method(GXRD), AES, potentiodynamic test, and salt spray test. The results of GXRD showed that austenite phase could be appeared by $N_2$ion beam treatment and the amount of austenite phase increased with the amount of nitrogen gas. The films without plasma ion source treatment had the weak diffraction peak of ferrite phase. But under the Ar plasma ion beam treatment, the strong diffraction peaks of ferrite phase were appeared and the grain size was increased from 12 to 16 nm. Potentiodynamic polarization test and salt spray test indicated that the corrosion properties of the STS 316L films with nitrogen ion source treatment were better than bulk STS 316L steel and STS 316L films with Ar ion source treatment.

• Korean Journal of Materials Research
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• v.12 no.8
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• pp.669-675
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• 2002

CrN film coated by AIP method, improved the mechanical properties (Hardness, Roughness, wear and fatigue) of Ti-6Al-4V alloy. The properties were studied using GXRD, XPS, Hardness, Roughness, wear and fatigue testers. CrN thin film thickness was about 7.5$\mu\textrm{m}$ and grew with (111) orientation. Hardness of CrN thin film was very high (Hv 1390) and roughness of the surface layer was greatly improved (Ra=0.063$\mu\textrm{m}$) compared with matrix alloy (Ra=0.321$\mu\textrm{m}$). Such changes of hardness and roughness could be contributed to improving the wear resistance and fatigue life. Striation like pattern with dimples and voids, a typical fatigue fracture mode, was observed throughout the specimen.

• Proceedings of the Korean Vacuum Society Conference
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• 2000.02a
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• pp.161-161
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• 2000

Ferromagnetic 3d 전이금속과 paramagnetic 5d 금속으로 이루어지진 Pt-Co 계는 자기이방적 (magnetic anisotropy) 성질로 인하여 많은 관심을 모으고 있는 계로서는 다층박막 및 합금박막에 대한 지기적 성질에 대한 많은 연구가 있어 왔다. 최근 sputtering method 에 의해 제작된 Pt-Co 합금박막에 대해 Ar 기체분압에 따라 보자력 (coercivity)이 변화되고 PMA (perpendicular magnetic anisotropy)를 갖는 것을 관측하였다. PMA의 근원은 주로 계면에서의 anisotropy 에너지와 관련이 있는 것으로 이해되기 때문에 합금박막의 경우는 PMA가 불가능한 것으로 여겨져 왔다. 그럼으로서 PMA에 대한 근원에 대한 명확한 해석이 필요하게 되었다. 또한 보자력(coercivity)은 불순물의 함량이 감소할수록, 그리고 내부적 변형이 제거될수록 감소하기 때문에, 계면 및 결정구조와 관련이 있는 것으로 알려져 있다. 이러한 자기적 특성을 관찰하고자 [Pt(51 )/Co(112 )]4, [Pt(90 )/Co(66 )]4, 그리고 [Pt(121 )/Co(30 )]4, 다층박막과 이들 박막을 80kV Ar+ 이온선 혼합후 박막의 결정성 변화를 관찰하기 위하여 GXRD (glancing x-ray diffraction) 스펙트럼을 얻어보았다. 그 결과 세 system 모두 disordered fcc 합금박막임을 확인하였다. fcc(111) 방향에 대한 평균 격자공간(lattice spacing)의 크기변화는 한층 당의 Co 두께가 두꺼울수록 거의 선형적으로 감소함을 볼수 있었다. MOKE 실험에 의하면, 이들 다층박막이나 합금박막의 경우 모두, in-plane 방향에 대해 자화 용이축(easy magnetization axis)을 가지고 있었다. 그리고 보자력의 크기에 있어서, 다층 박막의 경우에 있어서 Co 층에 두께 두꺼울수록 보자력의 크기가 감소하였지만 그림1에서와 같이 합금박막의 경우는 정반대로 Co층의 두께가 얇을수록 보자력의 크기가 감소함을 관찰하였다.

• Korean Journal of Materials Research
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• v.5 no.5
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• pp.503-511
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• 1995

금속/실리콘계에 대한 이온선 혼합시의 비정질상 및 결정상 형성여부를 예측할 수 있는 모델(ADF Model)과초기 결정상 예측 모델(PDF Model)의 적용을 실험적으로 조사하기 위하여 Ni/Si계에 대한 이온선 혼합을 온도와 이온선량을 변수로 하여 행하였으며 상형ㅅㅇ과정을 해석하였다. 이온선 혼합은 80keV가속기를 이용하여 상온~20$0^{\circ}C$의 온도 범위에서 1.0 $\times$ $10^{15}$Ar^{+}$/$cm^{2}$~2.0 $\times$ $10^{-16}$Ar^{+}$/$cm^{2}$의 이온선량을 변화시키면서 실험하였고, 상분석은 TEM과 GXRD를 이용하였다. Ni/Si게에 대한 ADF값은 0.804로 양의 값을 가지므로 이온선 혼합시 비정실상이 형성되고, $Ni_{2}$Si상이 다른 화합물상보다 훨씬 큰 음의 PDF값을 갖으므로 초기 결정상이 $Ni_{2}$Si가 될 것을 예측하였다. 이러한 예측은 실험결과와 매우 잘 일치하였다. 이상의 연구결과로부터 ADF 및 PDF모델을 이용하여 박막에서 형성되는 상을 보다 정확히 예측할수 잇음을 알 수 있었다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.07a
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• pp.889-892
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• 2000

We have investigated the Pt doping effect on structural and electrochemical properties of amorphous vanadium oxide film, grown by radio frequency magnetron sputtering. Room temperature charge-discharge measurements based on a half-cell with a constant current clearly indicated that the Pt doping could improve the cyclibility of V$_2$O$_{5}$ cathode film. Using glancing angle x-ray diffraction (GXRD) and high resolution transmission electron microscopy (HRTEM) analysis, we found that the Pt doping with l0W r.f. power induce more random amorphous structure than undoped V$_2$O$_{5}$ film. As the r.f. power of Pt increases, large amount of Pt incorporates into amorphous V$_2$O$_{5}$ and makes PtOx microcrystalline phase in amorphous matrix. This result suggests that the semicondcuting PtOx microcrystalline phase in amorphous matrix lead to a drastically faded cyclibility of 50W Pt doped V$_2$O$_{5}$ cathode film. Possible explanations are given to describe the Pt doping effect on cyclibility of vanadium oxide cathode film.de film.

• Journal of the Korean institute of surface engineering
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• v.29 no.2
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• pp.93-99
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• 1996

In this work BN thin films were deposited on Si substrate by R. F. sputtering method at $200^{\circ}C$ and in Ar + $N_2$ mixed gas atmosphere. In order to investigate the effect of ion bombardment on substrate for c-BN bonding, substrate bias voltage was applied. The optimum substrate bias voltage for c-BN bonding was determined by FTIR analysis on specimens which were deposited with various bias voltages. Then BN thin film was deposited with this optimum condition and its phase, morphology, chemical composition, and refractive index were compared with those of BN film which was deposited without bias voltage. FTIR results showed that BN films deposited with substrate bias voltage were composed of mixed phases of c-BN and h-BN, while those deposited without bias voltage were h-BN only. When pure Ar gas was used for sputtering gas, BN films were delaminated easily from substrate in air, while when 10% $N_2$ gas was added to the sputtering gas, although c-BN specific infrared peak was reduced, delamination did not occur. GXRD and TEM results showed that BN films were amorphous phases regardless of substrate bias voltage, and AES results showed that the chemical compositions of B/N were about 1.7~1.8. The refractive index of BN film deposited with bias voltage was higher than that without bias voltage. The reason is believed to be the existence of c-BN bonding in BN film and the higher density of film that deposited with the substrate bias voltage.