• Journal of Korean Institute of Fire Investigation
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• v.11 no.1
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• pp.37-40
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• 2008

This paper deals with damage patterns of cabinet panel for low voltage deteriorated by flame. In order to analyze damage patterns, we used Metallurgical Microscope, x-ray system, and Fourier Transform Infrared spectroscopy. Firstly, Metallurgical microscope was used for analysis of electrical causes, such as electric short and overload Secondly, X-ray system was used for analysis of internal characteristics of circuit breakers. Lastly, Fourier Transform Infrared spectroscopy was used for analysis of damage direction by flame.

• Proceedings of the Korea Institute of Fire Science and Engineering Conference
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• 2008.04a
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• pp.269-272
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• 2008

This paper deals with damage patterns of cabinet panel for low voltage deteriorated by flame. In order to analyze damage patterns, we used Metallurgical Microscope, x-ray system, and Fourier Transform Infrared spectroscopy. Firstly, Metallurgical microscope was used for analysis of electrical causes, such as electric short and overload. Secondly, X-ray system was used for analysis of internal characteristics of circuit breakers. Lastly, Fourier Transform Infrared spectroscopy was used for analysis of damage direction by flame. The following results were obtained.