• Journal of the Korean Vacuum Society
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• v.12 no.S1
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• pp.33-35
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• 2003

The electrooptic properties of the reflected light in a reflective mode, $45^{\circ}C$twisted nematic liquid crystal (TNLC) cell were investigated in the voltage regions near and away from the Freedericksz transition threshold. The measured reflectivity away from the threshold voltage ($V_th$) could not be described by the model which assurnes a constant tilt angle as well as a linearized distribution of twist angle across the cell, although the data are well fitted near $V_th$. We found that in the voltage region away from $V_th$, the model considering the distributions of the tilt angle and the twist angle should be applied for the calculation of the reflectivity. The director-axis distributions were obtained from the numerical integration of the Euler-Lagrange equation.