• 제목/요약/키워드: Electronic Short Circuit Tester

검색결과 2건 처리시간 0.015초

전기자동차용 2차전지를 위한 스마트 ICT형 전자식 외부 단락시험기 개발 (Development of Smart ICT-Type Electronic External Short Circuit Tester for Secondary Batteries for Electric Vehicles)

  • 정태욱;신병철
    • 한국산업융합학회 논문집
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    • 제25권3호
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    • pp.333-340
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    • 2022
  • Recently, the use of large-capacity secondary batteries for electric vehicles is rapidly increasing, and accordingly, the demand for technologies and equipment for battery reliability evaluation is increasing significantly. The existing short circuit test equipment for evaluating the stability of the existing secondary battery consists of relays, MCs, and switches, so when a large current is energized during a short circuit, contact fusion failures occur frequently, resulting in high equipment maintenance and repair costs. There was a disadvantage that repeated testing was impossible. In this paper, we developed an electronic short circuit test device that realizes stable switching operation when a large-capacity power semiconductor switch is energized with a large current, and applied smart ICT technology to this electronic short circuit stability test system to achieve high speed and high precision through communication with the master. It is expected that the inspection history management system based on data measurement, database format and user interface will be utilized as essential inspection process equipment.

실리콘 카바이드와 실리콘 MOSFET의 단락회로 특성비교 (SiC MOSFET Compared to Si Power Devices during Short Circuit Test)

  • 탄탓;아쉬라프 아흐무드;박종후
    • 전력전자학회:학술대회논문집
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    • 전력전자학회 2013년도 추계학술대회 논문집
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    • pp.89-90
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    • 2013
  • Higher power density, higher operational temperature, lower on state resistance and higher switching frequency capabilities of Silicon Carbide (SiC) technology devices compared to Silicon (Si) devices makes it has higher promising market. One of the most developed SiC devices is the power MOSFET. This study tests the SiC MOSFET under short circuit conditions taking into account the effect of gate voltage characteristics. The results will be compared to IGBT and MOSFET Si devices with similar ratings. A tester circuit was designed to perform the short circuit operation.

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