• 한국표면공학회:학술대회논문집
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• 한국표면공학회 2014년도 추계학술대회 논문집
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• pp.176-177
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• 2014

The new algorithm was proposed to quantify symmetry recorded in convergent beam electron diffraction (CBED) patterns and symmetry mapping. The proposed algorithm is based on the normalized cross-correlation coefficient (${\gamma}$) for quantifying the amount of symmetry in a CBED pattern. The quantification and mapping procedures are automatically controlled by the script implemented in Gatan Digital Micrograph$^{(c)}$. We apply the quantitative CBED measurement to a strained Si sample to test the sensitivity to defects.

• Applied Microscopy
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• 제37권3호
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• pp.199-208
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• 2007

본 장치는 실험자가 레이저 빔과 광학 렌즈를 조정하여 이미지 및 회절도형의 형성, 보강 및 소멸간섭과 같은 파동광학 현상을 이해하도록 제작된 실험 장치이다. 실험장치는 광원으로 쓰이는 레이저빔과 빔의 광축을 정렬하는 광원 부분과 시료대, 대물렌즈, 중간렌즈, 확대렌즈, CCD system, 컴퓨터, 그리고 렌즈를 상하 조절하는 경통부분으로 구성된다. 본 장치를 통해서 다양한 회절격자의 이미지 및 회절도형을 최대 약 44배 확대할 수 있고, 최대 약 5um의 분해능을 가지고 분석할 수 있다. 이 장치는 전자현미경 이용자들이 TEM의 원리를 보다 쉽게 이해하는데 도움을 주리라 기대한다.

• Journal of the Optical Society of Korea
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• 제14권2호
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• pp.127-130
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• 2010

We have developed an efficient electron beam (e-beam) source, a microcolumn, that can be used as a source module for of microscopy and its applications. To obtain a low operating voltage, a very sharp cold field electron emitter was developed by electrochemically etching a tungsten wire. Laser diffraction was used for the fabrication of high-quality electron lenses and for their precise alignment. The measurement of the e-beam currents, and SEM images captured by the microcolumn confirmed the potential of the device as a very good e-beam source.

• 한국광물학회지
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• 제4권1호
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• pp.51-55
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• 1991

산청 할로이사이트의 전자 회절분석 및 레플리카와 박편을 이용한 형태 연구결과 관산 할로이사이트는 반경이 서로 다른 몇 개의 관들이 중첩되어 있으며 내부의 작은 관은 원형이나 외부의 큰 관은 다각형으로서 두 관 사이에 삼각형의 공극이 형성되어 있음이 관찰되었다. 할로이사이트의 단면은 대체로 직경이 500${\AA}$보다 작으면 원형을 이루고 그보다 크면 다각형을 이룬다. 다각형의 단면을 갖는 할로이사이트의 전자 회절상은 이들이 이층 단사 구조를 갖고 있음을 지시한다.

• 한국전자현미경학회:학술대회논문집
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• 한국현미경학회 1995년도 제26회 춘계학술대회 연제초록
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• pp.52-52
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• 1995

• Applied Microscopy
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• 제43권2호
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• pp.88-97
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• 2013

Technical investigation to figure out the problems arising during in-situ heating electron backscatter diffraction (EBSD) analysis inside scanning electron microscopy (SEM) was carried out. EBSD patterns were successfully acquired up to $830^{\circ}C$ without degradation of EBSD pattern quality in steels. Several technical problems such as image drift and surface microstructure pinning were taking place during in-situ experiments. Image drift problem was successfully prevented in constant current supplying mode. It was revealed that the surface pinning problem was resulted from the $TiO_2$ oxide particle formation during heating inside SEM chamber. Surface pinning phenomenon was fairly reduced by additional platinum and carbon multi-layer coating before in-situ heating experiment, furthermore was perfectly prevented by improvement of vacuum level of SEM chamber via leakage control. Plane view in-situ observation provides better understanding on the overall feature of recrystallization phenomena and cross sectional in-situ observation provides clearer understanding on the recrystallization mechanism.

• 한국결정학회지
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• 제14권2호
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• pp.79-83
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• 2003

Electrolytic MnO₂ (EMD)의 미세구조를 X선 회절 및 투과전자현미경 분석을 통해 연구하였다. 벌크에 대한 X선 회절 실험은 전헝적인 EMD 재료의 분말 회절패턴을 나타내었다. 투과전자현미경 분석은 EMD가 약 0.2㎛크기의 입자로 이루어져 있고, 각각의 입자가다시 10 nm 정도의 결정립으로 이루어진 이중 미세구조를 가짐을 나타내었다. 나노 결정립에 대한 전자빔 마이크로 회절 분석 결과, EMD 입자는 여러 상의 혼합체로서 약 50%의 Ramsdellite, 30%의 ε-MnO₂, 15%의 Pyrolusite 상으로 이루어져 있음을 확인하였다. 한편, X선 분말 회절패턴 상의 약 67°에 위치한 ｛1120｝ 피크와 (0001) 면에 대한 고분해능 이미지는 ε-MnO₂ 상의 존재를 입증하였다.

• 열처리공학회지
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• 제24권3호
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• pp.140-143
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• 2011

In this work, Ga doped ZnO (GZO) films were prepared by radio frequency (RF) magnetron sputtering without intentional substrate heating on glass substrate and then the effect of the intense electron irradiation on structural and electrical properties and the NOx gas sensitivity were investigated. Although as deposited GZO films showed a diffraction peak for ZnO (002) in the XRD pattern, GZO films that electron irradiated at electron energy of 900 eV showed the higher intense diffraction peaks than that of the as deposited GZO films. The electrical property of the films are also influenced with electron's energy. As deposited GZO films showed the three times higher resistivity than that of the films irradiated at 900 eV In addition, the sensitivity for NOx gas is also increased with electron irradiation energy and the film sensor showed the proportionally increased gas sensitivity with NOx concentration. This approach is promising in gaining improvement in the performance of thin film gas sensors used for the detection of hazard gas phase.

• 열처리공학회지
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• 제36권4호
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• pp.193-197
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• 2023

Transparent and conducting titanium (Ti) doped indium oxide (TIO) thin films were deposited on the poly-imide (PI) substrate with radio frequency magnetron sputtering and then electron irradiation was conducted on the TIO film's surface to investigate the effect electron irradiation on the crystallization and opto-electrical properties of the films. All x-ray diffraction (XRD) pattern showed two diffraction peaks of the In₂O₂ (431) and (444) planes with regardless of the electron beam irradiation energy. In the AFM analysis, the surface roughness of as deposited films was 3.29 nm, while the films electron irradiated at 700 eV, show a lower RMS roughness of 2.62 nm. In this study, the FOM of as deposited TIO films is 6.82 × 10^-3 Ω^-1, while the films electron irradiated at 500 eV show the higher FOM value of 1.0 × 10^-2 Ω^-1. Thus, it is concluded that the post-deposition electron beam irradiation at 500 eV is the one of effective methods of crystallization and enhancement of opto-electrical performance of TIO thin film deposited on the PI substrate.

• Applied Microscopy
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• 제45권1호
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• pp.23-31
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• 2015

Dark field (DF) transmission electron microscopy image has become a popular characterization method for two-dimensional material, graphene, since it can visualize grain structure and multilayer islands, and further provide structural information such as crystal orientation relations, defects, etc. unlike other imaging tools. Here we present microstructure of graphene, particularly, using DF imaging. High-angle grain boundary formation wass observed in heat-treated chemical vapor deposition-grown graphene on the Si substrate using patch-quilted DF imaging processing, which is supposed to occur by strain around multilayer islands. Upon the crystal orientation between layers the multilayer islands were categorized into the oriented one and the twisted one, and their local structure were compared. In addition information from each diffraction spot in selected area diffraction pattern was summarized.