• 제목/요약/키워드: Dislocation density

검색결과 224건 처리시간 0.028초

Characteristics of Barkhausen Noise Properties and Hysteresis Loop on Tensile Stressed Rolled Steels

  • Kikuchi, Hiroaki;Ara, Katsuyuki;Kamada, Yasuhiro;Kobayashi, Satoru
    • Journal of Magnetics
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    • 제16권4호
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    • pp.427-430
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    • 2011
  • The rolled steels for welded structure applied tensile stress have been examined by means of magnetic Barkhausen noise (MBN) method and of a physical parameter obtained from a hysteresis loop. The behaviors of MBN parameters and coercive force with tensile stress were discussed in relation to microstructure changes. There is no change in MBN parameters and coercive force below yield strength. The coercive force rises rapidly with tensile stress above yield strength. On the other hand, the rms voltage and the peak in averaged rms voltage take a maximum around yield strength and then decreases. The magnetomotive force at peak in the averaged rms voltage shows a minimum around yield strength. These phenomena are attributed to the combined effects of cell texture and dislocation density. In addition, the behaviors of MBN parameters around yield strength may be reflected by the localized changes in strain field due to the formation of dislocation tangles.

GaAs on Si substrate with dislocation filter layers for wafer-scale integration

  • Kim, HoSung;Kim, Tae-Soo;An, Shinmo;Kim, Duk-Jun;Kim, Kap Joong;Ko, Young-Ho;Ahn, Joon Tae;Han, Won Seok
    • ETRI Journal
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    • 제43권5호
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    • pp.909-915
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    • 2021
  • GaAs on Si grown via metalorganic chemical vapor deposition is demonstrated using various Si substrate thicknesses and three types of dislocation filter layers (DFLs). The bowing was used to measure wafer-scale characteristics. The surface morphology and electron channeling contrast imaging (ECCI) were used to analyze the material quality of GaAs films. Only 3-㎛ bowing was observed using the 725-㎛-thick Si substrate. The bowing shows similar levels among the samples with DFLs, indicating that the Si substrate thickness mostly determines the bowing. According to the surface morphology and ECCI results, the compressive strained indium gallium arsenide/GaAs DFLs show an atomically flat surface with a root mean square value of 1.288 nm and minimum threading dislocation density (TDD) value of 2.4×107 cm-2. For lattice-matched DFLs, the indium gallium phosphide/GaAs DFLs are more effective in reducing the TDD than aluminum gallium arsenide/GaAs DFLs. Finally, we found that the strained DFLs can block propagate TDD effectively. The strained DFLs on the 725-㎛-thick Si substrate can be used for the large-scale integration of GaAs on Si with less bowing and low TDD.

고에너지비소 이온 주입후 2단계 열처리시 2차결함에 대한 연구 (A Study on Secondary Defects in Silicon after 2-step Annealing of the High Energy $^{75}AS^+$ Ion Implanted Silicon)

  • 윤상현;곽계달
    • 한국전기전자재료학회논문지
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    • 제11권10호
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    • pp.796-803
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    • 1998
  • Intrinsic and proximity gettering are popular processes to get higher cumulative production yield and usually adopt multi-step annealing and high energy ion implantation, respectively. In order to test the combined processed of these, high energy \ulcornerAs\ulcorner ion implantation and 2-step annealing process were adopted. After the ion implantation followed by 2-step annealing, the wafers were cleaved and etched with Wright etchant. The morphology of cross section on samples was inspected by FESEM. The concentration profile of As was measured by SRP. The location and type of secondary defects inspected by HRTEM were dependent on the 1st annealing temperatures. That is, a line of dislocation located at $1.5mutextrm{m}$ apart from the surface at $600^{\circ}C$ lst annealing was changed to some dislocation lines or loops nearby the surface at 100$0^{\circ}C$. The density of dislocation line was reduced but the size of the defects was enlarged as the temperature increased.

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종자결정을 활용한 다결정 규소 잉곳 내의 구조적 결함 규명 (Structural defects in the multicrystalline silicon ingot grown with the seed at the bottom of crucible)

  • 이아영;김영관
    • 한국결정성장학회지
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    • 제24권5호
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    • pp.190-195
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    • 2014
  • 방향성 응고법으로 잉곳을 성장시킬 때 발생하는 온도 구배에 의해 잉곳 내에 결함이 생성되고 잔류 응력이 남게 된다. 이 결함과 잔류 응력은 잉곳의 성장 조건에 따라 달라지며, 웨이퍼의 특성에 큰 영향을 미칠 수 있다. 성장 속도의 변화에 상관 없이 대부분의 잉곳에서는 하부 영역에 비해 상부 영역에서 결정립과 쌍정경계의 크기가 작았으며, 결정립계뿐만 아니라 결정립 내에도 전위 밀도가 높았다. 이것은 상부 영역에서 성장 중에 받는 열 응력이 하부 영역보다 크다는 것을 암시한다. 두 잉곳 간의 차이를 보았을 때에는 성장 속도가 느린 잉곳에서 전위 밀도가 감소하였으며, 웨이퍼의 평탄도, 뒤틀림, 휨, 절단자국이 낮게 측정되었다. 따라서 다결정 성장 공정에서는 냉각 속도가 결함이나 잔류 응력의 발생에 미치는 영향이 크며, 그로 인하여 웨이퍼의 특성이 달라지는 것을 알 수 있었다.

Stimulated Emission with 349-nm Wavelength in GaN/AlGaN MQWs by Optical Pumping

  • Kim, Sung-Bock;Bae, Sung-Bum;Ko, Young-Ho;Kim, Dong Churl;Nam, Eun-Soo
    • Applied Science and Convergence Technology
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    • 제26권4호
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    • pp.79-85
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    • 2017
  • The crack-free AlGaN template has been successfully grown by using selective area growth with triangular GaN facet. The triangular GaN stripe structure was obtained by vertical growth rate enhanced mode with low growth temperature of $950^{\circ}C$ and high growth pressure of 500 torr. The lateral growth rate enhanced mode of AlGaN for crack-free and flat surface was also investigated. Low pressure of 30 torr and high V/III ratio of 4400 were favorable for lateral growth of AlGaN. It was confirmed that the $4{\mu}m$ -thick $Al_{0.2}Ga_{0.8}N$ was crack-free over entire 2-inch wafer. The dislocation density of $Al_{0.2}Ga_{0.8}N$ was as low as ${\sim}7.6{\times}10^8/cm^2$ measured by cathodoluminescence. Based on the high quality AlGaN with low dislocation density, the ultraviolet laser diode epitaxy with cladding, waveguide and GaN/AlGaN multiple quantum well (MQW) was grown by metalorganic chemical vapor deposition. The stimulated emission at 349 nm with full width at half maximum of 1.8 nm from the MQW was observed through optical pumping experiment with 193 nm KrF laser. We also have fabricated the deep ridge type ultraviolet laser diode (UV-LD) with $5{\mu}m-wide$ and $700{\mu}m-long$ cavity for electrical properties. The turn on voltage was below 5 V and the resistance was ${\sim}55{\Omega}$ at applied voltage of 10 V. The amplified spontaneous emission spectrum of UV-LD was also observed from pulsed current injection.

열처리에 따른 미세구조 변화가 Ti 판재의 부식특성에 미치는 영향 (The Effect of Microstructural Evolution on Corrosion Property of Ti Plate with Heat Treatment)

  • 김민규;이찬수;김태규;김혜성
    • 열처리공학회지
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    • 제31권1호
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    • pp.12-17
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    • 2018
  • We investigated the corrosion behavior of commercially pure cold working processed (CP)-Ti with coarse-grained (CG) microstructure heat-treated at $400^{\circ}C$ and $600^{\circ}C$, respectively. It is observed that corrosion resistance of as-received CP-Ti heat-treated at $400^{\circ}C$, at which recrystallization proceeds, is largely improved. Interestingly, the mechanical property of CP-Ti sample at $400^{\circ}C$ was scarcely deteriorated. It is attributed to the decrease of the defects such as strain variance and dislocation density. On the other hand, the annealing treatment at $600^{\circ}C$ of CP-Ti plate causes to grain growth with the noticeable reduction of mechanical property. Hence, it is considered that defect density such as strain and dislocation density is important microstructural parameter for the improvement of corrosion resistance. The introduction of proper annealing treatment can help to improve corrosion resistance without scarifying mechanical property of CP-Ti.

직각 쐐기와 응착접촉 하는 반무한 평판 내 전위: 제2부 - 보정 함수의 근사 및 응용 (Dislocation in Semi-infinite Half Plane Subject to Adhesive Complete Contact with Square Wedge: Part II - Approximation and Application of Corrective Functions)

  • 김형규
    • Tribology and Lubricants
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    • 제38권3호
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    • pp.84-92
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    • 2022
  • In Part I, developed was a method to obtain the stress field due to an edge dislocation that locates in an elastic half plane beneath the contact edge of an elastically similar square wedge. Essential result was the corrective functions which incorporate a traction free condition of the free surfaces. In the sequel to Part I, features of the corrective functions, Fkij,(k = x, y;i,j = x,y) are investigated in this Part II at first. It is found that Fxxx(ŷ) = Fxyx(ŷ) where ŷ = y/η and η being the location of an edge dislocation on the y axis. When compared with the corrective functions derived for the case of an edge dislocation at x = ξ, analogy is found when the indices of y and x are exchanged with each other as can be readily expected. The corrective functions are curve fitted by using the scatter data generated using a numerical technique. The algebraic form for the curve fitting is designed as Fkij(ŷ) = $\frac{1}{\hat{y}^{1-{\lambda}}I+yp}$$\sum_{q=0}^{m}{\left}$$\left[A_q\left(\frac{\hat{y}}{1+\hat{y}} \right)^q \right]$ where λI=0.5445, the eigenvalue of the adhesive complete contact problem introduced in Part I. To investigate the exponent of Fkij, i.e.(1 - λI) and p, Log|Fkij|(ŷ)-Log|(ŷ)| is plotted and investigated. All the coefficients and powers in the algebraic form of the corrective functions are obtained using Mathematica. Method of analyzing a surface perpendicular crack emanated from the complete contact edge is explained as an application of the curve-fitted corrective functions.

중수로 압력관 재료의 조사 열화에 따른 인장거동 특성 (Tensile Behavior Characteristics of CANDU Pressure Tube Material Degraded by Neutron Irradiations)

  • 안상복;김영석;김정규
    • 대한기계학회논문집A
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    • 제26권1호
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    • pp.188-195
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    • 2002
  • To investigate the degradation of mechanical properties induced mainly by neutron irradiation, the tensile tests were conducted from room temperature to 300\\`c using the irradiated and the unirradiated Zr-2.5Nb pressure tube materials. The irradiated longitudinal and transverse specimens were collected from the coolant inlet, middle, and outlet parts of M-11 tube which had been operated in Wolsung CANDU Unit-1 and exposed to different operating temperatures and irradiation fluences. The different tensile behavior was characterized not by the fluences of irradiation but by the tensile loading direction. The transverse specimen showed the higher strength and lower elongation than those of the longitudinal one. It was believed that these phenomena resulted from the microstructure anisotropy caused by the extrusion process. The increased strength hardening and decreased elongation embrittlement of the irradiated material were compard to those of the unirradiated one. While the tensile strength of the inlet was higher than that of the outlet, the elongation of the inlet was lower than that of outlet. Considering the operation condition, it was proposed that the operating temperature could be a more effective parameter than the irradiation fluence for long-time life. Through the TEM observation, it was found that while the a-type dislocation density was increased, the c-type dislocation was not changed in the irradiated. The fact that the higher dislocation density was sequentially distributed over the inlet, the middle, and the outlet parts was consistent with the distribution of the tensile strength.