• Title/Summary/Keyword: Device safety

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A Study on Safety, Performance and Clinical effectiveness Test Guideline of Versatile Ophthalmic Laser System (다목적 안과용 레이저 시스템 안전성 성능평가 및 임상적 유효성평가 가이드라인 수립을 위한 연구)

  • Kim, You Rim;Yu, Woo Jin;Park, Ho Joon;Jang, Won Seuk
    • Journal of Biomedical Engineering Research
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    • v.40 no.6
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    • pp.250-259
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    • 2019
  • Ophthalmic Laser System is widely used in Selective Laser Trabeculoplasty of Open Angle Glaucoma and Ocular Hypertension. Versatile ophthalmic laser system is a medical device with technology that checks the condition of the treatment area by irradiating a continuous laser pulse on the treatment area, and monitoring the microbubble reaction caused by the temperature increase of the melanosome through the ultrasonic signal and the optical signal sensor. It performs selective laser treatment without damaging the photoreceptor by controlling the wavelength of the laser when microbubbles are detected. This study aims to suggest a guideline for evaluating safety, performance and clinical effectiveness of Versatile Ophthalmic Laser System in accordance with the growing technology. International Standards, Regulations, and Clinical Trial Protocols were investigated and analyzed for this study. As a result of this study, the safety, performance and clinical effectiveness test guideline for Versatile Ophthalmic Laser System were proposed. This guideline will ensure the safety and efficacy of Medical device, and furthermore it is expected to be able to promote the development of technology development by supporting a clinical trial plan.

FAST (floating absorber for safety at transient) for the improved safety of sodium-cooled burner fast reactors

  • Kim, Chihyung;Jang, Seongdong;Kim, Yonghee
    • Nuclear Engineering and Technology
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    • v.53 no.6
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    • pp.1747-1755
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    • 2021
  • This paper presents floating absorber for safety at transient (FAST) which is a passive safety device for sodium-cooled fast reactors with a positive coolant temperature coefficient. Working principle of the FAST makes it possible to insert negative reactivity passively in case of temperature rise or voiding of coolant. Behaviors of the FAST in conventional oxide fuel-loaded and metallic fuel-loaded SFRs are investigated assuming anticipated transients without scram (ATWS) scenarios. Unprotected loss of flow (ULOF), unprotected loss of heat sink (ULOHS), unprotected transient overpower (UTOP) and unprotected chilled inlet temperature (UCIT) scenarios are simulated at end of life (EOL) conditions of the oxide and the metallic SFR cores, and performance of the FAST to improve the reactor safety is analyzed in terms of reactivity feedback components, reactor power and maximum temperatures of fuel and coolant. It is shown that FAST is able to improve the safety margin of conventional burner-type SFRs during ULOF, ULOHS, UTOP and UCIT.

A Study on Accident Frequency by Installing Safety Devices in the LPG Heating and Drying Furnace (LPG 가열로 및 건조로의 안전장치 설치에 따른 사고빈도에 관한 연구)

  • Song, Dong-Woo;Kim, Ki-Sung;Kim, Choong-Hee;Lee, Seong-Gueong;Lee, Su-Kyung
    • Journal of the Korean Institute of Gas
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    • v.19 no.4
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    • pp.49-54
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    • 2015
  • The purpose of this study is to assess the risk of depending on the presence or absence of safety device of domestic heating and drying furnaces, by derivation and analysis of accident frequency of safety devices through FTA (Fault Tree Analysis). Installation standards are lacking in Korean for the safety device of LPG heating and drying furnace, which have a risk of explosion due to structure to trap the leaked gas. Four different safety devices were selected on the basis of NFPA and national standards for combustors of other equipment. Effects of frequency reduction in accidents were analyzed before and after installing the safety devices respectively. As a result, a minimal leakage safety device was presented for preventing damages from gas leak of domestic LPG heating and drying furnace.

Exploring Structural Stability using Arduino for the Prevention of Tower Cranes' Safety Accident : focused on ardu (타워크레인의 안전사고 예방을 위한 아두이노 기반 구조적 안정성 탐색)

  • Kim, Jun-Seok;Lee, Won-Hee;Kim, Sungae
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2019.05a
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    • pp.27-31
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    • 2019
  • Various safety accidents occur frequently at construction sites due to poor operation of construction machines and insufficient safety facilities. Among them, safety accidents on the Tawerkrain have resulted in massive casualties and property damage. Therefore, the purpose of this study is to develop safety devices to prevent safety accidents in the Tower Crane. To this end, the existing safety device was explored and the model of the Tower Crane was constructed using Arduino. The weight of the object, the weight of the pendulum, and the distance from the center axis, as well as the equation of turning and experimentation, suggested mobile weights as a safety device to identify and resolve problems with existing safety devices. This is expected to minimize the limit on the salvage distance of the tower crane, thus providing a safer working environment away from the risk of a safety accident.

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Development of Functional Auxiliary Device to Improve Induction Safety (인덕션 안전성 향상을 위한 기능보조 디바이스 개발)

  • Kim, Min-Kyoung;Seo, Dong-Min;Yoo, Dong-Hun;Yoo, Jin-Young;Jeong, Seong-Ho;Choi, Heon-Soo;Baek, Soo-Whang
    • The Journal of the Korea institute of electronic communication sciences
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    • v.16 no.6
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    • pp.1263-1270
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    • 2021
  • Recently, in the food culture life, the trend of consumers cooking is changing, and the use rate of induction cookware is increasing. Therefore, in this study, we propose the development of a functional auxiliary device to improve the safety of induction cookware to improve the convenience of cooking according to the increase in the cooking population. The proposed device is linked with IoT through the app. Through the app, the device can control the induction heating power adjustment and time reservation. In addition, an ultrasonic sensor is used to prevent the container from overflowing during cooking, and the user can safely use induction through the fine dust sensor. The implemented device conducts research assuming the actual cooking situation. Finally, it was confirmed that the user's fatigue was reduced during cooking through the device and the user's safety was improved in emergency situations such as overcooking or overflowing of water.

Development of TPMS Device and Mobile App System for Marine Emergency Notification (해양 응급상황 알림을 위한 TPMS 디바이스와 모바일 앱 시스템 개발)

  • Dong-Hwan Gong
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.24 no.3
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    • pp.49-53
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    • 2024
  • Maritime safety is a critical factor in protecting lives from accidents at sea and fostering a safer marine environment. In this study, we developed a TPMS device aimed at enhancing maritime safety, providing technological solutions for detecting accidents at sea and enabling swift responses. The device utilizes a Tube Pressure Monitoring System (TPMS) to detect tube expansion and is designed to collect real-time data and communicate with surrounding devices for rapid responses. Experimental results confirm the effective detection of pressure by TPMS (Tube Pressure Monitoring System) and stable data transmission and reception with the main IoT device. Additionally, a mobile app capable of receiving emergency alert messages and accessing information for rapid responses in emergency situations was developed. The developed device and mobile app encompass technology applicable not only in the maritime safety field but also in various other application areas, with potential for expanded application in real-world scenarios in the future. These results are expected to contribute to enhancing safety in the marine environment.

A study on the method of OLED device's lifetime test (OLED 소자의 수명 평가법에 관한 연구)

  • Choi, Young-Tae;Cho, Jai-Rip
    • Journal of the Korea Safety Management & Science
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    • v.10 no.4
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    • pp.145-152
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    • 2008
  • According to the Korea Agency for Technology and Standards under the Commerce Ministry, OLED device's lifetime is defined 50% drop of luminance. OLED device is self-emitting operating device, that means it becomes different color between pixels under using environment. That's reason of the different luminance drop ratio & chromaticity coordinates shift ratio with time. The problem is there is not recovered after luminance drop and color shift. We can recognize the difference of color as image sticking. First we studied when human recognize the difference of color and second we apply the method of OLED device's lifetime test that's able to check different color between pixels.

The study about safety evaluation of electronic interlocking device (전자연동장치 안전성 평가에 대한 연구)

  • Yang, Yoon-Seok;Lee, Jong-Woo
    • Proceedings of the KSR Conference
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    • 2006.11b
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    • pp.850-855
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    • 2006
  • Railway signal interlocking device with the reverse unit control device which is most important from country season, the subway and the high-speed railroad back, electric relay boarding and lodging accomplishes the master and servant and it comes and before from the Japanese back and an electronic interlocking device, a zone one interest in updated technology introduction Great Britain, Germany, Sweden and the United States, it quarrels about under developing it puts to practical use even from our country it shows. About reasoning lower our country subway or the country closing up shop stem there is not a possibility of throwing away the impression where the exhibition hall of foreign nation signal system is being turning out. Consequently is enormous a system well expense at the foreign corporation about under paying Oh!, it understands, with difficult always it is exposed to it is an actuality in the accident which is dangerous. In like this point of view first piece which is important securing safety of system from electronic anger of electronic interlocking device.

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A study on the method of OLED device's lifetime test (OLED 소자의 수명 평가법에 관한 연구)

  • Choi, Young-Tae;Cho, Jai-Rip
    • Proceedings of the Safety Management and Science Conference
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    • 2008.11a
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    • pp.131-143
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    • 2008
  • According to the Korea Agency for Technology and Standards under the Commerce Ministry, OLED device's lifetime is defined 50% drop of luminance. OLED device is self-emitting operating device, that means it becomes different color between pixels under using environment. That's reason of the different luminance drop ratio & chromaticity coordinates shift ratio with time. The problem is there is not recovered after luminace drop and color shift. We can recognize the difference of color as image sticking. First we studied when human recognize the difference of color and second we apply the method of OLED device's lifetime test that's able to check different color between pixels

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An Analysis of Damage Mechanism of Semiconductor Devices by ESD Using Field-induced Charged Device Model (유도대전소자모델(FCDM)을 이용한 ESD에 의한 반도체소자의 손상 메커니즘 해석)

  • 김두현;김상렬
    • Journal of the Korean Society of Safety
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    • v.16 no.2
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    • pp.57-62
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    • 2001
  • In order to analyze the mechanism of semiconductor device damages by ESD, this paper adopts a new charged-device model(CDM), field-induced charged nudel(FCDM), simulator that is suitable for rapid routine testing of semiconductor devices and provides a fast and inexpensive test that faithfully represents ESD hazards in plants. The high voltage applied to the device under test is raised by the fie]d of non-contacting electrodes in the FCDM simulator. which avoids premature device stressing and permits a faster test cycle. Discharge current md time are measured and calculated The FCDM simulator places the device at a huh voltage without transferring charge to it, by using a non-contacting electrode. The only charge transfer in the FCMD simulator happens during the discharge. This paper examine the field charging mechanism, measure device thresholds, and analyze failure modes. The FCDM simulator provides a Int and inexpensive test that faithfully represents factory ESD hazards. The damaged devices obtained in the simulator are analyzed and evaluated by SEM Also the results in this paper can be used for to prevent semiconductor devices from ESD hazards.

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