• Title/Summary/Keyword: Czochralski method

Search Result 146, Processing Time 0.021 seconds

Second harmonic generation of YCOB($YCa_4O(BO_3)_3$) (YCOB($YCa_4O(BO_3)_3$)의 제2조화파 발생)

  • 장원권
    • Korean Journal of Optics and Photonics
    • /
    • v.10 no.4
    • /
    • pp.301-305
    • /
    • 1999
  • The phase matching conditions of the new optical crystal grown by Czochralski pulling method, YCOB($YCa_4O(BO_3)_3$) with wavelength were suggested, and the second harmonic generation efficiency for the fundamental of Nd:YAG laser of 1064 nm was investigated. The variation of nonlinearity with rare earth ion doping was also investigated by measuring the second harmonic generation efficiencies of $Yb^{3+}$ + $Nd^{3+}$and ion doped YCOBs.

  • PDF

Scintillation Characteristics of CsI:X(X=Li+,K+,Rb+ Single Crystals (CsI:X(X=Li+,K+,Rb+단결정의 섬광특성)

  • Gang, Gap-Jung;Doh, Sih-Hong;Lee, Woo-Gyo;Oh, Moon-Young
    • Journal of Sensor Science and Technology
    • /
    • v.12 no.1
    • /
    • pp.1-9
    • /
    • 2003
  • CsI single crystals doped with lithium, potassium or rubidium were grown by using Czochralski method at Ar gas atmosphere. The energy resolutions of CsI(Li:0.2 mole%), CsI(K:0.5 mole%) and CsI(Rb:1.5 mole%) scintillators were 14.5%, 15.9% and 17.0% for $^{137}Cs$(0.662 MeV), respectively. The energy calibration curves of CsI(Li), CsI(K) and CsI(Rb) scintillators were linear for $\gamma$-ray energy. The time resolutions of CsI(Li:0.2 mole%), CsI(K:0.5 mole%) and CsI(Rb:1.5 mole%) scintillators measured by CFT(constant-fraction timing method) were 9.0 ns, 14.7 ns and 9.7 ns, respectively. The fluorescence decay times of CsI(Li:0.2 mole%) scintillator had a fast component and slow one of ${\tau}_1=41.2\;ns$ and ${\tau}_2=483\;ns$, respectively. The fluorescence decay times of CsI(K:0.5 mole%) scintillator were ${\tau}_1=47.2\;ns$ and ${\tau}_2=417\;ns$. And the fluorescence decay times of CsI(Rb:1.5 mole%) scintillator were ${\tau}_1=41.3\;ns$ and ${\tau}_2=553\;ns$. The phosphorescence decay times of CsI(Li:0.2 mole%), CsI(K:0.5 mole%) and CsI(Rb:1.5 mole%) scintillators were 0.51 s, 0.57 s and 0.56 s, respectively.

Scintillation Characteristics of CsI(Li) Single Crystals (CsI(Li) 단결정의 섬광특성)

  • Lee, W.G.;Doh, S.H.;Ro, T.I.;Kim, W.;Kang, H.D.;Moon, B.S.
    • Journal of Sensor Science and Technology
    • /
    • v.8 no.5
    • /
    • pp.359-367
    • /
    • 1999
  • CsI(Li) single crystals doped with 0.02, 0.1, 0.2 and 0.3 mole% lithium as an activator were grown by Czochralski method. The lattice structure of grown CsI(Li) single crystal was bcc, its lattice constant was $4.568\;{\AA}$. The absorption edge of CsI(Li) single crystal was 245 nm, and the spectral range of luminescence was $300{\sim}600\;nm$, its maximum luminescence intensity appeared at 425 nm. The energy resolutions of CsI(Li) single crystal doped with 0.2 mole% lithium were 14.5% for $^{137}Cs$(662 keV), 11.4% for $^{54}Mn$(835 keV) and 17.7% and 7.9% for $^{22}Na$(511 keV and 1275 keV), respectively. The relation formula of $\gamma$-ray energy versus energy resolution was ln (FWHM%) = -0.893lnE + 8.456 and energy calibration formula was ${\log}E_r=1.455\;{\log}(ch.)-1.277$. The phosphorescence decay time of CsI(Li) crystal doped with 0.2 mole% lithium was 0.51 s at room temperature, and its time resolution measured by CFT(constant-fraction timing method) was 9.0 ns.

  • PDF

SHG properties of MgO-doped $LiNbO_3$ single crystals

  • Lee, Jong-Soo;Kim, Chong-Don;Joo, Gi-Tae;Rhee, Bum-Ku
    • Proceedings of the Korea Association of Crystal Growth Conference
    • /
    • 1997.06a
    • /
    • pp.163-170
    • /
    • 1997
  • The MgO-doped LiNbO$_3$ single crystals were grown along c-axis by the Czochralski method with the pulling rate of 3mm/h and the rotation of 10rpm. The MgO contents were form 1 to 4 mole%. The SHG properties were investigated with the pulsed Nd:YAG laser, and thermo-optic coefficient, electro-optic coefficient of birefringence and curie temperature were measured. Phase matching temperature and Curie temperature increase similarly with MgO content until 4 mole%.

  • PDF

Crystal Growth of Yb:YAG and Fabrication of Microchip Laser Device (Yb:YAG 단결정 성장과 마이크로칩 레이저 소자 제조)

  • 이성영;김충렬;김도진;정석종;유영문
    • Journal of the Korean Ceramic Society
    • /
    • v.38 no.8
    • /
    • pp.771-776
    • /
    • 2001
  • 용액인상법으로 질소분위기 하에서 Yb$^{3+}$ 이온이 각각 5, 15, 25 at% 치환된 Yb:Y$_3$Al$_{5}$ O$_{12}$ (Yb:YAG) 단결정을 이리듐 도가니를 사용하여 성장시켰다. 양질의 단결정을 성장시키기 위한 인상속도와 회전속도는 각각 2mm/h와 10rpm이었다. 흡수 및 형광스펙트럼 측정결과, Yb$^{3+}$ 이온의 농도가 높아짐에 따라 흡수계수가 선형적으로 증가하였고, 1051nm 파장을 중심으로 1020~1050nm 영역에서 선폭이 확대된 강한 형광스펙트럼을 나타내었다. 한편, 성장된 단결정을 이용하여 마이크로칩 레이저용 소자를 정밀하게 제조하였다.

  • PDF

Measurement of Velocity and Temperature Field at the Low Prand시 Number Melt Model of the CZ Crystal Growth

  • Kim, Min-Cheol;Lee, Sang-Ho;Yi, Kyung-Woo
    • Proceedings of the Korea Association of Crystal Growth Conference
    • /
    • 1998.06a
    • /
    • pp.169-172
    • /
    • 1998
  • A phyaical model of the Czochralski method for silicon single crystals is designed to measure the change of velocities and temperature profilles in the melt. Wood's metal(Bi 50%, Pb 26.7%, Sn 13.3%, Cd 10%, m.p. 70℃) is used to simulate the silicon melt in the crucible. To measure the local velocity change, electromagnetic probe is adopted as a velocity sensor. The output voltage of the sensor shows linear relationship to the velocity of the melt.

  • PDF

Crystal Growth of Er:YAG and Er,Cr:YSGG for Medical Lasers

  • Yu, Young-Moon;Jeoung, Suk-Jong
    • Proceedings of the Korea Association of Crystal Growth Conference
    • /
    • 1998.06a
    • /
    • pp.161-164
    • /
    • 1998
  • Erbium doped garnet crystals were grown by Czochralski method. Relationshipes between crystal quality and crystal growth factors such as pulling rate, rotation rate and concentration of active ions and sensitizers were investigated. Optimum pulling and rotation rate for high quality Er:YAG crystal were 1 mm/hr and 20 rpm and for Er,Cr:YSGG crystal 2-4 mm/hr and 10 rpm respectively. The size of the crystals grown was up to 20-30 mm in diameters and 95-135 mm in length. Er:YAG crystal grown under the nitrogen atmosphere was pink and transparent and Er,Cr:YSGG under the 98% {{{{ { N}_{ 2} }}}} and 2% {{{{ { O}_{2 } }}}} was dark green and transparent. Under the polarizing microscopic observations with crossed polar, striations and {211} core facets were detected. Spectroscopic properties for Er,Cr:YSGG laser rods with <111> axis, 80 mm in length and 6.3 mm in diameter for medical laser applications of 2.79 ${\mu}$m wavelength were manufactured and then laser oscillation was achieved.

  • PDF

Crystal Growth of $Nd:LaSc_3(BO_3)_4$ by Czochralski Method (융액인상법에 의한 $Nd:LaSc_3(BO_3)_4$ 단결정 성장 연구)

  • ;;A.Y. Ageyev
    • Korean Journal of Crystallography
    • /
    • v.10 no.1
    • /
    • pp.71-75
    • /
    • 1999
  • 융액인상법에 의하여 Nd3+ 이온이 15 at% 주입된 LaSc3(BO3)4 단결정을 성장하였다. 최적의 결정성장 조건하에서 성장된 결정은 결정형이 잘 발달되고 보라색 투명하였다. 편광 현미경에 의한 결정결함 분석결과 성장된 결정 중심부에서 0.1 mm 크기의 기포가 검출되었고, B2O3가 증발하여 결정에 증착된 shoulder 부위에서는 균열이 발생되었으나 body에서는 결함이 검출되지 않았다. X선 회절에 의하여 cell parameter를 측정한 결과 a=7.73 , b=9.85 , c=12.05 , β=105.48o 및 공간군 C2/c의 monoclinic 구조로 분석되었다. 양질의 단결정을 성장하기 위한 결정성장 요소는 회전속도 10 rmp, 인상속도 1.5 mm/h이었다. 성장된 결정은 808 nm에서 강하고 넓은 흡수대와 1050∼1080 nm에 걸친 형광 방출대가 관찰되었다. 성장된 결정을 이용하여 직경 3 mm, 두께 1mm 크기의 micro-chip laser 소자의 제조기술을 확립하였다.

  • PDF

Study on Growth of $Cr^{4+}$:YAG Single Crystals by Czochralski Method (융액인상법에 의한 $Cr^{4+}$:YAG 단결정 성장 연구)

  • 송도원;정석종;조성일;유영문
    • Korean Journal of Crystallography
    • /
    • v.10 no.1
    • /
    • pp.76-82
    • /
    • 1999
  • 융액인상법에 의하여 Garnet 구조내 결정학적 8면체 및 4면체의 양이온 자리에 전하 보상이온 Mg2+, 구조 수식이온 Sc3+ 및 laser 활성이온 Cr4+을 다양한 농도로 주입한 융액으로부터 Cr4+:YAG 단결정을 성장하고, 주입된 불순이온이 흡수계수에 미치는 영향을 규명하였다. 양질의 단결정을 성장하기 위한 인상속도와 회전속도는 각각 1.5 mm/h와 10 rmp이었으며, Cr4+:YAG 단결정은 <111> 방위로 성장하였다. 성장된 결정의 결정구조 동정 및 결정격자 상수를 측정하고, 1.064 ㎛에서의 결정화분율에 따른 흡수계수, 형광방출 스펙트럼, 유효편석계수(keff)를 보고하였다.

  • PDF

Effect of mechanical backside damage upon minority carrier recombination lifetime measurement by laser/microwave photoconductance technique (기계적 후면 손상이 레이저/극초단파 광전도 기법에 의한 소수 반송자 재결합 수명 측정에 미치는 영향)

  • 조상희;최치영;조기현
    • Journal of the Korean Crystal Growth and Crystal Technology
    • /
    • v.5 no.4
    • /
    • pp.408-413
    • /
    • 1995
  • We investigated the effect of mechanical backside damage upon minority carrier recombination lifetime measurement in Czochralski silicon substrate by laser excitation/microwave reflection photoconductance decay method. The intensity of mechanical damage was evaluated by X-ray double crystal rocking curve, X-ray section topography and wet oxidation/preferential etch methods. The data indicate that the higher the mechanical damage intensity, the lower the minority carrier lifetime, and the threshold full width at half maximum value which affect minority carrier lifetime measurement is about 13 secs.

  • PDF