• Journal of Information Technology Applications and Management
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• v.21 no.3
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• pp.53-64
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• 2014

It is important to keep learners' feeling positive during learning to enhance learning performance. According to flow theory,challenge-skill balance is a precondition for flow experience: Learners feel anxiety when the challenge of learning is higher than their ability, feel boredom when the challenge of learning is lower than learners' ability, and engage in flow status when the challenge of learning matches the learners' ability. However, the current empirical study reveals that emotions related to enjoyment may appear when the learners' skill is equal to or higher than the learning challenge. Nevertheless, boredom emotion may appear when learners perceive the courses are difficult but unimportant. These empirical survey results revealed the necessary of rethinking the appearance of boredom and enjoyment emotions in computer education.

• Journal of Advanced Information Technology and Convergence
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• v.8 no.2
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• pp.79-87
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• 2018

The current PC user authentication uses character password based on user's knowledge. However, this can easily be exploited by password cracking or key-logging programs. In addition, the use of a difficult password and the periodic change of the password make it easy for the user to mistake exposing the password around the PC because it is difficult for the user to remember the password. In order to overcome this, we propose user gesture recognition and challenge-response authentication. We apply user's hand gesture instead of character password. In the challenge-response method, authentication is performed in the form of responding to a quiz, rather than using the same password every time. To apply the hand gesture to challenge-response authentication, the gesture is recognized and symbolized to be used in the quiz response. So we show that this method can be applied to PC user authentication.

• Proceeding of EDISON Challenge
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• 2017.03a
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• pp.487-489
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• 2017

Source와 Drain 부분에 도핑의 농도를 변화시킴으로써 MOSFET의 내부의 Total current의 변화의 경향성을 분석하였다. 이를 위해 Simple한 MOSFET 구조를 설계를 한 뒤 gate 부분에 전압을 주어 측정을 하였으며, 그 결과 Source, Drain의 도핑농도가 증가 될 수록 Total current의 변화하는 정도가 커짐을 알 수 있다.

• The monthly packaging world
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• s.259
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• pp.61-69
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• 2014

• The monthly packaging world
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• s.149
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• pp.92-97
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• 2005

• 한국사회복지학회:학술대회논문집
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• 2007.04a
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• pp.33-57
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• 2007

• The monthly packaging world
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• s.360
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• pp.79-83
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• 2023

• Advances in Computational Design
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• v.4 no.1
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• pp.43-52
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• 2019

Variation Analysis (VA) is used to simulate final product variation, taking into consideration part manufacturing and assembly variations. In VA, all the manufacturing and assembly processes are defined at the product design stage. Process Capability Data Bases (PCDB) provide information about measured variation from previous products and processes and allow the designer to apply this to the new product. A new challenge to this traditional approach is posed by the Industry 4.0 (I4.0) revolution, where Smart Manufacturing (SM) is applied. The manufacturing intelligence and adaptability characteristics of SM make present PCDBs obsolete. Current tolerance analysis methods, which are made for discrete assembly products, are also challenged. This paper discusses the differences expected in future factories relevant to VA, and the approaches required to meet this challenge. Current processes are mapped using I4.0 philosophy and gaps are analysed for potential approaches for tolerance analysis tools. Matching points of simulation capability and I4.0 intents are identified as opportunities. Applying conditional variations, incorporating levels of adjustability, and the un-suitability of present Monte Carlo simulation due to changed mass production characteristics, are considered as major challenges. Opportunities including predicting residual stresses in the final product and linking them to product deterioration, calculating non-dimensional performances and extending simulations for process manufactured products, such as drugs, food products etc. are additional winning aspects for next generation VA tools.

• Proceeding of EDISON Challenge
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• 2014.03a
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• pp.415-419
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• 2014

나노스케일 MOSFET에서 leakage current는 중요한 이슈로서 $Si_{1-x}Ge_x$ alloy를 substrate로 사용할 경우 leakage current에 어떤 영향을 미칠 것인지 시뮬레이션을 통하여 알아보았다. $Si_{1-x}Ge_x$ alloy에서 Ge의 비율이 증가할수록 유효질량이 작아졌으나 conduction band minimum의 위치는 Si에 비해 상승하였다. 이로 인해 tunneling 확률이 증가하여 $Si_{1-x}Ge_x$ alloy를 substrate로 사용할 경우 leakage current를 더욱 증가시키게 되었다.

• Journal of Agricultural Extension & Community Development
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• v.17 no.3
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• pp.505-526
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• 2010

Because of the international marriage of bachelors in the rural areas, there have been grown many foreign residents, the Multi-cultural families. For the improvement of multi-cultural families, the first important thing is their early settlement in Korea. For those foreigners' settlement, systematic approach to Korean education program is necessary. Second, multi-cultural families need support to maintain their basic lives safely. Agricultural education for the next generation is, moreover, also important for them. Third, healthy growth and training for the formation of the Self-Identity of their children are needed for those multi-cultural families too. Education for bring up their children as the global talents, the cost of private education and the one of bringing up children also have to be supported. Fourth, the improvement of understanding multicultural families is significant. Development and education of various programs to participate multi-cultural families are also required.