• Title/Summary/Keyword: Conductive Resister

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Heating Properties and Pore structure of Cementitious Joint by Induction Heating (시멘트계 접합부의 유도가열에 의한 승온특성 및 공극구조)

  • Kang, Dong-Woo;Ahn, Jae-Cheol;Kim, Jung-Kil;Kang, Byeung-Hee
    • Proceedings of the Korean Institute of Building Construction Conference
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    • 2011.05a
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    • pp.3-4
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    • 2011
  • The purpose of this study is to suggest basic data for development optimal disassembly manufacturing system during analysis pore structure and heating properties of cementitious joint using conductive resister by induction heating. From the results, we knew cementitious joint is weak easily by heating of conductive resister, such as wire mesh, punching metal, and steel fiber, from induction heating.

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Improvement of COF Bending-induced Lead Broken Failure in LCD Module (LCD Module내 COF Bending에 따른 Lead Broken Failure의 개선)

  • Shim, Boum-Joo;Choi, Yeol;Yi, Jun-Sin
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.21 no.3
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    • pp.265-271
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    • 2008
  • TCP(Tape Carrier Package), COG (Chip On Glass), COF(Chip On Film) are three methods for connecting LDI(LCD Driver IC) with LCD panels. Especially COF is growing its portion of market place because of low cost and fine pitch correspondence. But COF has a problem of the lead broken failure in LCD module process and the usage of customer. During PCB (Printed Circuit Board) bonding process, the mismatch of the coefficient of thermal expansion between PCB and D-IC makes stress-concentration in COF lead, and also D-IC bending process during module assembly process makes the level of stress in COF lead higher. As an affecting factors of lead-broken failure, the effects of SR(Solder Resister) coating on the COF lead, surface roughness and grain size of COF lead, PI(Polyimide) film thickness, lead width and the ACF(Anisotropic Conductive Film) overlap were studied, The optimization of these affecting manufacturing processes and materials were suggested and verified to prevent the lead-broken failure.