• Title/Summary/Keyword: Coaxial Test Socket

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Improvement of Signal Transfer Characteristics of Fine Pitch Probe Pin Using Coaxial Test Socket with New Structure (새로운 구조의 동축 테스트 소켓을 이용한 미세 피치 프로브 핀의 신호 전달 특성 개선)

  • Jeong-Jun Seo;Moonjung Kim
    • Journal of the Semiconductor & Display Technology
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    • v.23 no.1
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    • pp.97-103
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    • 2024
  • In this paper, the difference between the S-parameter and the characteristic impedance according to the structural change of the fine pitch coaxial socket was analyzed. A pitch of the probe pin was applied to 0.20mm, and ground pins of different conditions were placed on each of the five signal pins. Insertion loss and reflection loss were analyzed for the coaxial socket of normal structure and the two sockets of the proposed structure. In addition, the difference in characteristic impedance was analyzed using time domain reflectometry. Through the analysis, it was confirmed that the characteristic impedance was improved applying the new structures of the socket at the same pitch

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