• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 하계학술대회 논문집
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• pp.208-211
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• 2000

We prepared Co-Cr-Ta and Co-Cr-Ta/Ti thin film for perpendicular magnetic recording media by facing targets sputtering system (FTS system). Ti underlayer effects on crystallographic and magnetic characteristics of Co-Cr-Ta perpendicular magnetic recording media have been investigated. Crystallgraphic and magnetic characteristic of prepared thin films were evaluated by x-ray diffractometry(XRD), vibrating sample magnetometer(VSM) and kerr hysteresis loop measurement. The coercivity and anisotropy field increase by introduced Ti underlayer when substrate temperature is higher than 150$^{\circ}C$. The c-axis dispersion angle and grain size of Co-Cr-Ta/Ti thin film is decrease than Co-Cr-Ta when substrate temperature is higher than 100$^{\circ}C$. Consequently, the use of a Ti underlayer highly orientated can be improved crystallographic and magnetic characteristics of Co-Cr -Ta perpendicular media layer.

• 한국결정성장학회지
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• 제10권1호
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• pp.17-22
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• 2000

수직보자력이 크고 CoCrPt에 비하여 noise 저감 효과가 큰 것으로 알려진 CoCrPtTa계 합금박막의 수직이방성을 더욱 개선하기 위해 Ti를 우선 증착하였다. 본 연구에서는 Ti 두께 변화에 따른 비교적 높은 수직보자력치를 보였던 $CoCr_{16.2}Pt_{10.8}Ta_4$Ti/glass 시편에서 자기적 특성과 자구형상의 변화를 살펴보았다. 또한 VSM(Vibrating Sample Magnetometer)을 이용하여 M-H loop를 측정하였으며 자구형상은 MFM(Magnetic Force Microscopy)로 관찰하였다. 육방정 Ti가 하지층으로서 우선증착되면 bare glass 직접 증착되는 경우보다 CoCrPtTa 자성층의 수직이방성에 현저한 향상을 가져왔으며 Ti의 두께가 두꺼울수록 c-축 배향성도 개선되었다. MFM 결과에 의하면 Ti두레가 20 nm에서 90 nm로 증가함에 따라 자구형상이 연속적인 stripe type에서 mass type으로 분절된 형태로 변하였다. 이는 Ti의 증착이 비자성 Cr 편석 거동에 영향을 미쳐 자화반전시 인접 columnar grain의 자화벡터들간의 상호교환작용을 억제하는 자기적 분리 효과에 기여했음을 의미한다. 아울러 이와 같은 거동은 Ti가 CoCr계 자성층의 수직이방성을 개선하는데 있어서 형상자기이방성적인 측면에서의 기여가 현저함을 의미하기도 한다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 추계학술대회 논문집
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• pp.492-495
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• 2000

In order to develop an ultra-thin CoCr perpendicular magnetic recording layer, we prepared CoCrTa/Ti double layer for perpendicular magnetic recording media by new facing targets sputtering system, Crystallgraphics and magnetic characteristics of CoCrTa on underlayer substrate temperature have been investigated. Crystallgraphic and magnetic characteristic of thin films were evaluated by X-ray diffractometry(XRD), vibrating sample magnetometer(VSM) and atomic force microscopy(AFM). The coercivity and anisotropy field was increased by increasing under layer substrate temperature, c-axis orientation of CoCrTa magnetic recording layer was improved 8$^{\circ}$ to 5.6$^{\circ}$when under layer substrate temperature was 250[$^{\circ}C$]. Also, through annealing effect for CoCrTa/Ti double layer, it was certain that crystallgraphics and magnetic characteristics was improved.

• 한국표면공학회지
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• 제29권6호
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• pp.847-850
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• 1996

The bi-layered films composed of Co-Cr-Ta layers and paramagnetic $Co_{67}Cr_{33}$ underlayer were deposited by suing Facing Targets Sputtering(FTS). The effects of $Co_{67}Cr_{33}$ underlayer on the crystallographic and magnetic characteristics of the Co-Cr-Ta layer deposited on the underlayer was investigated. The diffraction intensity $I_{p(002)}$ of Co-Cr-Ta layers on the $Co_{67}Cr_{33}$ layer was stronger than that of single layer and Co-Cr-Ta/Ti double layer. Therefore, the crystallinity of Co-Cr-Ta layer was imporved by the $Co_{67}Cr_{33}$ underlayer rather than Ti ones. However, te coercivity H$_{c\bot}$ of Co-Cr-Ta layers deposited on $Co_{67}Cr_{33}$ underlayer was as low as 250 Oe even at substrate temperature of $220^{\circ}C$. This H$_{c\bot}$ decrease seems to be attributed to the effect of the $Co_{67}Cr_{33}$ underlayer as well as interval time between deposition of the underlayer and the Co-Cr-Ta layer.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1996년도 추계학술대회 논문집
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• pp.242-244
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• 1996

The effects of $Co_{67}$C $r_{33}$ underlayer on the crystallographec and magnetic characteristics of the Co-Cr-Ta layer deposited on the underlayer was investigated. The diffraction intensity $I_{p(002)}$ of Co-Cr-Ta layers on the $Co_{67}$C $r_{33}$ layer was stronger than that of single layer and Co-Cr-Ta/Ti double layer. Therefore, the crystallinity of Co-Cr-Ta layer was improved by the $Co_{67}$C $r_{33}$ underlayers rather than Ti ones. However, the coercivity $H_{c}$ of Co-Cr-Ta layers deposited on $Co_{67}$C $r_{33}$ underlayer was as low as 250 Oe even at substrate temperature of 22$0^{\circ}C$. This $H_{c}$ decrease seems to be attributed to the effect of the $Co_{67}$C $r_{33}$ underlayer as well as interval time between deposition of the underlayer and the Co-Cr-Ta layer.yer.layer.yer.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1999년도 춘계학술대회 논문집
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• pp.578-581
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• 1999

The Co-Cr-Ta films are one of the most suitable candidates for perpendicular magnetic recording media. The facing targets sputtering(FTS) system has a advantage of preparing films over a wide range of working gas pressure on plasma-free substrates. In this study, we investigated the effect underlayers on the growths layers of Co-Cr-Ta recording layers. The Co-Cr-Ta/Ti(CoCr) double layers were deposited with sputter gas pressure$(P_N, 0.3-1mTorr)$ by using FTS apparatus at temperature of$40^{\circ}C~-300^{\circ}C$, respectively. Crystallographic and magnetic characteristics were evaluated by x-ray diffractometry(XRD) and vibrating sample magnetometer(VSM), respectively.

• 한국자기학회:학술대회 개요집
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• 한국자기학회 2000년도 International Symposium on Magnetics The 2000 Fall Conference
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• pp.350-351
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• 2000

• 대한전기학회:학술대회논문집
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• 대한전기학회 2001년도 하계학술대회 논문집 C
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• pp.1475-1477
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• 2001

In odor to set high saturation magnetization and coercivity, it had need to orient axis of easy magnetization of CoCr-based thin film perpendicular direction(c-axis) to the substrate plane. It was known that crystalline orientation of CoCr-based thin film was improved by introducing underlayer like Ti, Ge. We prepared singlelayer and double layer with Si underlayer by Facing Targets Sputtering System. As a result, intensity and c-axis dispersion angle ${\Delta}{\theta}_{50}$ of singlelayer were improved with increasing film thickness. Also, it was found that CoCr/Si and CoCrTa/Si double layer showed good c-axis dispersion angle due to introducing Si.

• 한국자기학회:학술대회 개요집
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• 한국자기학회 2000년도 춘계연구발표회 논문개요집
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• pp.50-51
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• 2000

• 한국재료학회지
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• 제4권2호
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• pp.166-176
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• 1994

Ni기 초합금은 Co, Cr, Mo, W등의 고용 강화 원소와 AI, Ti, Nb, Ta 등의 $\gamma '$ 석출 강화 원소로 구성되어 있다. 초합금의 기계적 성질과 내산화성을 개선하기 위하여 희토류 원소를 재료 내부에 첨가하거나, 코팅 재료로써 사용하고 있다. 이들 희토류 원소는 $Al_2O_3, Cr_2O_3$등의 산화물의 종류에 따라 산화물의 성장 속도와 밀착성에 영향을 미친다. Hf함유 Ni기 초합금 AF115와 $AI_2O_3$ 함유 MA6000초합금 2종을 이온 코터를 이용, Yttrium 표면개질후, 온도 1273K-1473K에서 고온 산화 수 산호 피막의 성장 속도, 결정립, 내부 구조 및 내박리성에 미치는 Yttrium 의 영향을 조사하였다. AF115와 MA6000 초합금에 Yttrium코팅을 한 결과 내부 산화물의 성장에 현저한 변화가 있었다. Yttrium의 표면 개질에 의하여, AF115의 경우는 $AI_2O_3$ 주성분의 입계 집중과 Hf의 우선 산확 억제되고, 삼각 형태의 내부 산화물이 plate형으로 변화되었다. MA6000의 경우 $AI_2O_3$ 주성분의 산화층이$Cr_2O_3$주성분의 외부 산화층과$AI_2O_3$ 주성분의 내부층으로 변화되었다.