• 제목/요약/키워드: Co/M bilayer

검색결과 16건 처리시간 0.026초

Co/내열금속/다결정 Si 구조의 실리사이드화와 열적안정성 (Silicidation and Thermal Stability of the So/refreactory Metal Bilayer on the Doped Polycrystalline Si Substrate)

  • 권영재;이종무
    • 한국세라믹학회지
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    • 제36권6호
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    • pp.604-610
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    • 1999
  • Silicide layer structures and morphology degradation of the surface and interface of the silicide layers for he Co/refractory metal bilayer sputter-deposited on the P-doped polycrystalline Si substrate and subjected to rapid thermal annealing were investigated and compared with those on the single Si substrate. The CoSi-CoSi2 phase transition temperature is lower an morphology degradation of the silcide layer occurs more severely for the Co/refractorymetal bilayer on the P-doped polycrystalline Si substrate than on the single Si substrate. Also the final layer structure and the morphology of the films after silicidation annealing was found to depend strongly upon the interlayer metal. The layer structure after silicidation annealing of Co/Hf/doped-poly Si is Co-Hf alloy/polycrystalline CoSi2/poly Si substrate while that of Co/Nb is polycrystalline CoSi2/NbSi2/polycrystalline CoSi2/poly Si.

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Co/내열금속/(100) Si 이중층 구조의 실리사이드화 (Silicidation of Co/M/(100) Si bilayer Structures)

  • 권영재;이종무;배대록;강호규
    • 한국세라믹학회지
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    • 제35권5호
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    • pp.505-511
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    • 1998
  • 단결정 Si 기판 위에 증착한 Co/Hf과 Co/Nb 이중층으로부터 형성된 Co 실리사이드의 성장기구에 대하여 조사하였다. 두 경우 모두 500$^{\circ}C$ 이상에서 CoSi2가 주로 형성되었으나 그 결정방위의 성장양상은 서로 달랐다. Co/Hf/(100)Si 구조에서는 Si 기판과 에피텍셜 관계를 갖는 결정립과 그렇지 않은 결정립이 서로 혼합되어 성장하였다. 그러나 Co/Nb/(100)Si에서는 처음부터 에피텍셜 관계를 갖지 않는 결정립들만이 형성되었다. 동일한 구조임에도 불구하고 이렇게 내열금속 중간층에 따라 성장된 실리사이드의 결정방위가 달라지는 것으 안정한 반응제어층의 형성 및 고온에서의 그 분해과정과 관련이 있었다. 여러 구성원소들로 이루어진 반응제어층이 고온까지 안정할 경우에는 Co의 확산이동을 균일하게 제어하여 실리사이드의 에피텍셜 성장이 가능하다.

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코발트/니켈 적층구조 박막으로부터 형성된 복합실리사이드 (Characterizatics of Composite Silicides from Co/Ni Structure)

  • 송오성;정성희;김득중;최용윤
    • 한국재료학회지
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    • 제14권11호
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    • pp.769-774
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    • 2004
  • 15 nm-Co/15 nm-Ni/P-Si(100)[Type I] and 15 nm-Ni/15 nm-Co/P-Si(100)(Type II) bilayer structures were annealed using a rapid thermal annealer for 40sec at $700/sim1100^{\circ}C$. The annealed bilayer structures developed into composite NiCo silicides and resulting changes in sheet resistance, composition and microstructure were investigated using Auger electron spectroscopy and transmission electron microscopy. Prepared NiCoSix films were further treated in a sequential annealing set up from $900\sim1100^{\circ}C$ with 30 minutes. The sheet resistances of NiCoSix from Type I maintained less than $7\;{\Omega}/sq$. even at the temperature of $1100{\circ}C$, while those of Type II showed about $5\;{\Omega}/sq$. with the thinner and more uniform thickness. With the additive post annealing, the sheet resistance for all the composite silicides remained small up to $900^{\circ}C$. The proposed NiCoSix films were superior over the conventional single-phased silicides and may be easily incorporated into the sub-0.1 ${\mu}m$ process.

다양한 하지층이 이중층의 응집현상에 미치는 영향에 관한 연구 (Study on Effect of Various Underlayer on Bilayer Agglomerlation)

  • 하재호;류동훈;임현우;정지민;최호준;홍인기;고중혁;구상모;가미코 마사오;하재근
    • 한국진공학회지
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    • 제21권5호
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    • pp.233-241
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    • 2012
  • 단결정 MgO (001) 기판에 DC 마그네트론 스퍼터로 하지층과 상지층으로 구성된 이중층을 증착, 열처리 온도와 시간을 고정시키고 이중층의 두께를 변화시켜 응집현상을 제어하여 자기구조화, 나노 구조화된 박막을 제작하였다. 진행한 실험에선 기존에 연구되었던 단층에서의 응집현상이 아닌 하지층과 상지층으로 구성된 이중층의 응집현상으로 나노 점을 형성하였다. 하지층은 Ti, Cr, Co 그리고 상지층은 Ag를 증착하였다. Atomic force microscopy를 통하여 하지층의 물질에 따라 나노 점의 형성 여부가 관찰되었고 형성된 나노 점의 형상이 다르게 나타난 것을 확인하였다. 결과적으로 이중층의 응집현상을 이용하여 나노 점을 제작할 때 가장 적합한 하지층의 물질은 Ti로 확인하였다. 또한 Ti/Ag 시료는 X-ray Diffraction 분광법을 통하여 Ag는 기판으로 사용된 MgO의 (001) 방향을 따라서 에피택셜하게 성장한 것을 확인하였다.

도데칸술폰이 삽입된 금속 화합물, [M($H_2O$)$_6$(C$_12$H$_25$SO$_3$)$_2$.x$H_2O$ (M=Co, Cu)의 층상 구조의 열적 성질 (Thermal Behavior of the Layered Structure in Metal-dodecanesulfonate intercalation compounds, [M($H_2O$)$_6$](C$_12$H$_25$SO$_3$)$_2$.x$H_2O$ (M=Co, Cu))

  • 허영덕;박성훈;전태현
    • 한국표면공학회지
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    • 제33권1호
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    • pp.25-33
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    • 2000
  • The synthesis and characterization of intercalated compound of dodecanesulfornate into hydrated metal, [M($H_2$O)\ulcorner](C\ulcornerH\ulcorner$SO_3$)$_2$.$xH_2$O (M=Co, Cu) was presented. The compounds shows a layered structure which was determined by powder X-ray diffraction. Thermal behavior of the layered structure was investigated using thermal analysis, and FT-IR spectroscopy by varying the temperature. The increase in layer spacing of the products by increasing the temperature is also checked by X-ray diffraction. We can suggest three kinds of layered structure by varying the temperature, which is accompanied by changing the intercalated dodecanesulfonate from the monolayer to the bilayer structure or changing the tilt angle.

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Co/Ti 이중막 실리사이드를 이용한 $p^{+}$-n극저접합 다이오드의 제작과 전기적 특성 (Fabrication and Electrical Characteristics of $p^{+}$-n Ultra Shallow Junction Diode with Co/Ti Bilayer Silicide)

  • 장지근;엄우용;장호정
    • 한국재료학회지
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    • 제8권4호
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    • pp.288-292
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    • 1998
  • n-well Si(100) 영역에 $BF_{2}$를 이온주입 [에너지: 30KeV, 주입량 : $5\times10^{15}cm^{-2}$] 하고 Co($120\AA$)/Ti($40\AA$)이중막을 진공증착하여 RTA-silicidation을 통해 Co/Ti 이중막 실리사이드층을 갖는 p+ -n극저접합 다이오드를 제작하였다. 제작된 소자의 이상계수와 비접촉저항 및 누설전류는 각각 1.06, $1.2\times10^{-6}\Omega\cdot\textrm{cm}^2$, $8.6\muA/\textrm{cm}^2$(-3V)로 나타났으며 실리사이드층을 갖는 이미터 영역의 면저항은 약 $8\Omega\Box$로, 실리상이드/실리콘 계면에서 보론 농도는 약 $6\times10^{19}cm^{-3}$으로, 실리사이드 두께(~$500\AA$)를 포함한 접합깊이는 약 $0.14\mu{m}$로 형성되었다. 다이오드 제작에서 Co/Ti 이중막 실리사이드 층의 형성은 소자의 누설전류를 다소 증가시켰으나 이상계수의 개선과 이미터 영역의 면저항 및 비접촉저항의 감소를 가져왔다.

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절전형 ZnO-Si계 CO 가스 센서 제작과 그 특성 (A properties and the fabrication of ZnO-Si system CO gas sensor with low power consumption)

  • 이승환;홍형기;김종관;장병호;성영권
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1997년도 추계학술대회 논문집 학회본부
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    • pp.324-326
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    • 1997
  • Low power ZnO-Si gas sensor below 500 mW at operating temperature has been fabricated by using micromachining technique. I-V measurement shows the power consumption of 260 mW at $400^{\circ}C$ The sensitivity of the sensor was 45 percent at operating temperature of $350^{\circ}C$(230 mW) with 1,000 ppm CO gas atmosphere. The response and the recovery time found out to be 94 sec and 180 sec, respectively, when CO gas was used. In order to measure the exact temperature of the gas sensing layer, Pt/Cr bilayer-RTD was used in this experiment.

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Co-sintering of M2/316L Layers for Fabrication of Graded Composite Structures

  • Firouzdor, V.;Simchi, A.;Kokabi, A.H.
    • 한국분말야금학회:학술대회논문집
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    • 한국분말야금학회 2006년도 Extended Abstracts of 2006 POWDER METALLURGY World Congress Part 1
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    • pp.696-697
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    • 2006
  • This paper presents the densification and microstructure evolution of bilayer components made from 316L stainless steel and M2 High speed steel during co-sintering process. The sintering was carried out at temperatures ranging from $1230-1320^{\circ}C$ in a reducing atmosphere. The addition of boron to 316L was examined in order to increase the densification rate and improve the sintering compatibility between the two layers. It was shown that the mismatch strain bettwen the two layers induces biaxial stresses during sintering, influencing the densification rate. The effect of boron addition was also found to be positive as it improves the bonding between the two layers.

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Temperature dependence of exchange bias in Co/Ni anti-dot arrays

  • Seo, M.S.;Deshpande, N.G.;Lee, S.J.;Lee, Y.P.;Rhee, J.Y.;Kim, K.W.
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2011년도 제40회 동계학술대회 초록집
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    • pp.436-436
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    • 2011
  • Recently, spintronic devices with submicron structures are widely investigated to take advantage of their unique micromagnetic properties. In this work, we study the temperature dependence of exchange bias in bilayer anti-dot arrays made by depositing Co (40 nm)/Ni (5 nm) ferromagnetic bilayer on Si substrate to form anti-dot arrays with a diameter $1{\mu}m$. The anti-dot patterning was done only for the upper Co layer, while the Ni underlayer was kept unperforated. The temperature dependences of magnetoresistance (MR) and exchange bias were studied along magnetic easy and hard axes. The in-plane MR measurements were performed using a physical-property measurement system (PPMS ; Quantum Design Inc.) at various temperatures. The standard in-line four-point probe configuration was used for the electrical contacts. As temperature was varied, the MR data were obtained in which in-plane field (H=3 kOe) was applied in the directions along the hard and the easy axes with respect to the lattice plane. The temperature dependences of magnetic anisotropy and exchange bias were also studied along the magnetic easy and hard axes. As temperature decreases, the single peak splits into two peaks. While no exchange bias was observed along the magnetic easy axis, the exchange bias field steadily increased with decreasing temperature along the magnetic hard axis. These results were interpreted in connection with the magnetic anisotropy and the effect of the anti-dots in pinning domain wall motion along the respective direction.

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Magnetic properties of micro-patterned array of anti-dots in Co/Ni bilayer

  • Deshpande, N.G.;Seo, M.S.;Zheng, H.Y.;Lee, S.J.;Rhee, J.Y.;Kim, K.W.;Lee, Y.P.
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2010년도 제39회 하계학술대회 초록집
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    • pp.276-276
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    • 2010
  • Large-area micropatterned array of Co/Ni bilayer anti-dots was fabricated using photolithography and wet etching process. The surface morphology as well as the surface topography was checked by scanning electron microscopy and atomic force microscopy, whereas the magnetic properties were studied by magneto-optical Kerr effect (MOKE) and magnetic force microscopy (MFM). Systematic studies of the magnetic-reversal mechanism, the in-plane anisotropy and the switching field properties were carried out. To get a comprehensive knowledge about the domain configuration, we also employed OOMMF simulations. It was found from the MOKE measurements that a combined effect of configurational and the magneto-crystalline anisotropy simultaneously works in such micropatterned bilayer structures. In addition, the inclusion of holes in the uniform magnetic film drastically affected the switching field. The MFM images show well-defined domain structures which are periodic in nature. The micromagnetic simulations indicate that the magnetization reversal of such a structure proceeds by formation and annihilation of domain walls, which were equally manifested by the field-dependent MFM images. The observed changes in the magnetic properties are strongly related to both the patterning that hinders the domain-wall motion and to the magneto-anisotropic bilayered structure.

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