• Title/Summary/Keyword: Chemical beam epitaxy

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A study on $CeO_2$ buffer layer on biaxially textured Ni-3%W substrate deposited by electron beam evaporation with high deposition rate (전자빔 증착법으로 이축배향된 Ni-3%W 기판 위에 높은 증착률로 제조된 $CeO_2$ 완충층에 대한 연구)

  • Kim, H.J.;Lee, J.B.;Kim, B.J.;Hong, S.K.;Lee, H.J.;Kwon, B.G.;Lee, H.G.;Hong, G.W.
    • Progress in Superconductivity and Cryogenics
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    • v.13 no.1
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    • pp.1-5
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    • 2011
  • [ $CeO_2$ ]has been widely used for single buffer layer of coated conductor because of superior chemical and structural compatibility with $ReBa_2Cu_3O_{7-{\delta}}$(Re=Y, Nd, Sm, Gd, Dy, Ho, etc.). But, the surface of $CeO_2$ layer showed cracks because of the large difference in thermal expansion coefficient between metal substrate and deposited $CeO_2$ layer, when thickness of $CeO_2$ layer exceeds 100 nm on the biaxially textured Ni-3%W substrate. The deposition rate has been limited to be less than 6 $\AA$/sec in order to get a good epitaxy. In this research, we deposited $CeO_2$ single buffer layers on biaxially textured Ni-3%W substrate with 2-step process such as thin nucleation layer(>10 nm) with low deposition rate(3 $\AA$/sec) and thick homo epitaxial layer(>240 nm) with high deposition rate(30 $\AA$/sec). Effect of deposition temperature on degree of texture development was tested. Thick homo epitaxial $CeO_2$ layer with good texture without crack was obtained at $600^{\circ}C$, which has ${\Delta}{\phi}$ value of $6.2^{\circ}$, ${\Delta}{\omega}$ value of $4.3^{\circ}$ and average surface roughness(Ra) of 7.2 nm within $10{\mu}m{\times}10{\mu}m$ area. This result shows the possibility of preparing advanced Ni substrate with simplified architecture of single $CeO_2$ layer for low cost coated conductor.

MBE Growth and Electrical and Magnetic Properties of CoxFe3-xO4 Thin Films on MgO Substrate

  • Nguyen, Van Quang;Meny, Christian;Tuan, Duong Ahn;Shin, Yooleemi;Cho, Sunglae
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.370.1-370.1
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    • 2014
  • Giant magnetoresistance (GMR), tunneling magnetoresistance (TMR), and magnetic random-access memory (MRAM) are currently active areas of research. Magnetite, Fe3O4, is predicted to possess as half-metallic nature, ~100% spin polarization (P), and has a high Curie temperature (TC~850 K). On the other hand, Spinel ferrite CoFe2O4 has been widely studies for various applications such as magnetorestrictive sensors, microwave devices, biomolecular drug delivery, and electronic devices, due to its large magnetocrystalline anisotropy, chemical stability, and unique nonlinear spin-wave properties. Here we have investigated the magneto-transport properties of epitaxial CoxFe3-xO4 thin films. The epitaxial CoxFe3-xO4 (x=0; 0.4; 0.6; 1) thin films were successfully grown on MgO (100) substrate by molecular beam epitaxy (MBE). The quality of the films during growth was monitored by reflection high electron energy diffraction (RHEED). From temperature dependent resistivity measurement, we observed that the Werwey transition (1st order metal-insulator transition) temperature increased with increasing x and the resistivity of film also increased with the increasing x up to $1.6{\Omega}-cm$ for x=1. The magnetoresistance (MR) was measured with magnetic field applied perpendicular to film. A negative transverse MR was disappeared with x=0.6 and 1. Anomalous Hall data will be discussed.

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화학적기상증착법에 의해 성장된 BixTey 계 박막의 미세구조 연구

  • Lee, Yu-Min;Kim, Yeong-Heon;Ryu, Hyeon;Jeon, Gi-Mun;Gang, Sang-U;Kim, Yong-Gyu
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.178-178
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    • 2011
  • 군사용 장비의 전원장치, 인공위성, 해양개발용 등의 특정분야에 한정되어 이루어지던 열전물질에 대한 연구가 최근에는 에너지원의 다양화와 에너지 절약에 대한 필요성이 크게 대두됨에 따라 산업 폐열과 각종 열기관의 폐열 및 해수 온도차나 태양열과 같은 자연에너지를 이용하는 열전발전에 대한 연구로 영역이 확장되어 꾸준히 이루어지고 있다. 다양한 열전 재료 중에서 BixTey 계, BixSey 계, SbxTey 계, 혹은 이들의 합금계가 많이 연구되고 있다. 이 중에서 BixTey 계의 박막 성장 방법으로는 sputtering deposition, electrodeposition, flash evaporation, molecular beam epitaxy, chemical vapor deposition (화학적기상증착) 등이 있다. 이러한 다양한 방법들 중에서 화학적기상증착법은 양질의 두꺼운 막을 성장시킬 수 있음과 동시에 산업적인 생산에 적용될 수 있기 때문에 열전박막 증착을 위한 중요한 수단이 될 수 있을 것으로 생각되고 있다. 하지만 적절한 전구체(precursor)의 부족, tellurium (Te)의 재증발과 같은 문제점 때문에 화학적기상증착법을 이용한 BixTey 계 박막에 대한 전반적인 연구가 부족한 실정이다. 본 연구에서는 다양한 기판, 예를 들면, 실리콘(Si), 실리콘 산화물(SiO2), 백금(Pt) 등, 에 화학적기상증착법을 이용하여 BixTey 계 박막을 성장시키고, 온도와 압력 등의 조건 변화에 따른 박막의 형상과조성, 구조적 특성에 관한 연구를 진행하였다. 특히, 성장 조건에 따른 박막의 형상 연구를 통하여 성장 기구에 관한 고찰을 진행할 수 있었다. 나아가 투과전자현미경 연구를 통하여 기판과 박막의 계면 특성과 개별 결정립이 가지는 미세구조적 특성에 관한 연구를 진행하였다.

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Epitaxial growth of high-temperature ZnO thin films on sapphire substrate by sputtering (마그네트론 스퍼터링에 의한 사파이어 기판위에 고온에서의 ZnO박막의 에피성장)

  • Kim, Young-Yi;Ahn, Cheol-Hyoun;Kang, Si-Woo;Kong, Bo-Hyun;Cho, Hyung-Koun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2007.06a
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    • pp.151-151
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    • 2007
  • 최근에 에피 성장된 ZnO는 UV-LED, 화학적-바이오센서와 투명전도 전극에 많은 관심을 받고 있다. 고 품질의 ZnO는 Metal-organic chemical vapor deposition(MOCVD), Pulsed laser deposition(PLD), molecular beam epitaxy(MBE), 그리고 마그네트론 스퍼터링법에 의해 성장이 이루어지고 있다. 대부분의 ZnO는 사파이어, 싫리콘과 같은 이종 기판 위에 성장되고 있으며, Heteroepitaxy로 성장된 ZnO 박막은 기판과 박막사이의 격자상수, 열팽창계수 차이로 인해 높은 결함 밀도를 보이고 있다. 이러한 문제점은 광전자 소자 응용에 있어 여러 가지 문제점을 야기 시킨다. 이와 같은 문제점을 해결하기 위해 박막과 기판사이에 저온 버퍼층을 사용하거나 같은 물질의 버퍼층을 사용하여 결할 밀도를 감소시키고, 높은 결정성을 가진 ZnO 박막을 성장시킨 결과들이 많이 보고되어지고 있다. 본 연구에서는 마그네트론 스퍼터링 법으로 저온 버퍼층 성장 없이 성장온도 만을 달리 하여 고품질의 ZnO 박막을 성장시켰다. ZnO 박막은 c-sapphire 기판위에 ZnO(99.9999%)의 타겟을 사용하여 $600{\sim}800^{\circ}C$ 온도에서 성장시켰고, 스퍼터링 가스로는 아르곤과 산소를 2:1 비율로 혼합하여 15mtorr의 압력에서 성장하였다. 이렇게 성장시킨 ZnO 박막은 Transmission Electron Microscopy (TEM), High-Resolution X-ray Diffraction (HRXRD), Low-temperature PL, 그리고 Atomic Force Microscopy (AFM)로 특성을 분석 하였다. ZnO 박막은 HRXRD (002) 면의 $\omega$-rocking curve운석 결과, $0.083^{\circ}$의 작은 FEHM을 얻었고, (102) 면의 $\varphi$-sacn을 통해 온도가 증가함에 따라 향상된 6-fold을 확인함으로새 에피성장됨을 알 수 있었다. 또한 TEM분석을 통해 $800^{\circ}C$에서 성장된 박막은 $6.7{\times}10^9/cm^2$의 전위밀도를 얻을 수 있었다.

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Preparation and characterization of Zinc Oxide films deposition by (PVD) (PVD 코팅법에 의한 ZnO제조 및 특성)

  • Kim, Sung Jin;Pak, Hunkyun
    • 한국신재생에너지학회:학술대회논문집
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    • 2010.06a
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    • pp.95.1-95.1
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    • 2010
  • Transparent conducting ZnO films were deposited to apply DSSC Substrate on glass substrates at $500^{\circ}C$ by ionbeam-assisted deposition. Crystallinity, microstructure, surface roughness, chemical composition, electrical and optical properties of the films were investigated as a function of deposition parameters such as ion energy, and substrate temperature. The microstructure of the polycrystalline ZnO films on the glass substrate were closely related to the oxygen ion energy, arrival ratio of oxygen to Zinc Ion bombarded on the growing surface. The main effect of energetic ion bombardment on the growing surface of the film may be divided into two categories; 1) the enhancement of adatom mobility at low energetic ion bombardment and 2) the surface damage by radiation damage at high energetic ion bombardment. The domain structure was obtained in the films deposited at 300 eV. With increasing the ion energy to 600 eV, the domain structure was changed into the grain structure. In case of the low energy ion bombardment of 300 eV, the microstructure of the film was changed from the grain structure to the domain structure with increasing arrival ratio. At the high energy ion bombardment of 600 eV, however, the only grain structure was observed. The electrical properties of the deposited films were significantly related to the change of microstructure. The films with the domain structure had larger carrier concentration and mobility than those with the grain structure, because the grain boundary scattering was reduced in the large size domains compared with the small size grains. The optical transmittance of ZnO films was dependent on a surface roughness. The ZnO films with small surface roughness, represented high transmittance in the visible range because of a decreased light surface scattering. By varying the ion energy and arrival ratio, the resistivity and optical transmittance of the films were varied from $1.1{\times}10^{-4}$ to $2.3{\times}10^{-2}{\Omega}cm$ and from 80 to 87%, respectively. The ZnO film deposited at 300 eV, and substrate temperature of $500^{\circ}C$ had the resistivity of $1.1{\times}10^{-4}{\Omega}cm$ and optical transmittance of 85% in visible range. As a result of experiments, we provides a suggestition that ZnO thin Films can be effectively used as the DSSC substrate Materials.

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