• Title/Summary/Keyword: Capacitor DAC

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A 1.8V 50-MS/s 10-bit 0.18-um CMOS Pipelined ADC without SHA

  • Uh, Ji-Hun;Kim, Won-Myung;Kim, Sang-Hun;Jang, Young-Chan
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2011.05a
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    • pp.143-146
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    • 2011
  • A 50-MS/s 10-bit pipelined ADC with 1.2Vpp differential input range is proposed in this paper. The designed pipelined ADC consists of eight stage of 1.5bit/stage, one stage of 2bit/stage, digital error correction block, bias & reference driver, and clock generator. 1.5bit/stage is consists of sub-ADC, DAC and gain stage, Specially, a sample-and hold amplifier (SHA) is removed in the designed pipelined ADC to reduce the hardware and power consumption. Also, the proposed bootstrapped switch improves the Linearity of the input analog switch and the dynamic performance of the total ADC. The reference voltage was driven by using the on-chip reference driver without external reference. The proposed pipelined ADC was designed by using a 0.18um 1-poly 5-metal CMOS process with 1.8V supply. The total area including the power decoupling capacitor and power consumption are $0.95mm^2$ and 60mW, respectively. Also, the simulation result shows the ENOB of 9.3-bit at the Nyquist sampling rate.

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The Analysis of Total Ionizing Dose Effects on Analog-to-Digital Converter for Space Application (우주용 ADC의 누적방사선량 영향 분석)

  • Kim, Tae-Hyo;Lee, Hee-Chul
    • Journal of the Institute of Electronics and Information Engineers
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    • v.50 no.6
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    • pp.85-90
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    • 2013
  • In this paper, 6bit SAR ADC tolerant to ionizing radiation is presented. Radiation tolerance is achieved by using the Dummy Gate Assisted (DGA) MOSFET which was proposed to suppress the leakage current induced by ionizing radiation and its comparing sample is designed with the conventional MOSFET. The designed ADC consists of binary capacitor DAC, dynamic latch comparator, and digital logic and was fabricated using a standard 0.35um CMOS process. Irradiation was performed by Co-60 gamma ray. After the irradiation, ADC designed with the conventional MOSFET did not operate properly. On the contrary, ADC designed with the DGA MOSFET showed a little parametric degradation of which DNL was increased from 0.7LSB to 2.0LSB and INL was increased from 1.8LSB to 3.2LSB. In spite of its parametric degradation, analog to digital conversion in the ADC with DGA MOSFET was found to be possible.

A 10-bit 10MS/s differential straightforward SAR ADC

  • Rikan, Behnam Samadpoor;Abbasizadeh, Hamed;Lee, Dong-Soo;Lee, Kang-Yoon
    • IEIE Transactions on Smart Processing and Computing
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    • v.4 no.3
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    • pp.183-188
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    • 2015
  • A 10-bit 10MS/s low power consumption successive approximation register (SAR) analog-to-digital converter (ADC) using a straightforward capacitive digital-to-analog converter (DAC) is presented in this paper. In the proposed capacitive DAC, switching is always straightforward, and its value is half of the peak-to-peak voltage in each step. Also the most significant bit (MSB) is decided without any switching power consumption. The application of the straightforward switching causes lower power consumption in the structure. The input is sampled at the bottom plate of the capacitor digital-to-analog converter (CDAC) as it provides better linearity and a higher effective number of bits. The comparator applies adaptive power control, which reduces the overall power consumption. The differential prototype SAR ADC was implemented with $0.18{\mu}m$ complementary metal-oxide semiconductor (CMOS) technology and achieves an effective number of bits (ENOB) of 9.49 at a sampling frequency of 10MS/s. The structure consumes 0.522mW from a 1.8V supply. Signal to noise-plus-distortion ratio (SNDR) and spurious free dynamic range (SFDR) are 59.5 dB and 67.1 dB and the figure of merit (FOM) is 95 fJ/conversion-step.

A 10-bit 20-MS/s Asynchronous SAR ADC using Self-calibrating CDAC (자체 보정 CDAC를 이용한 10비트 20MS/s 비동기 축차근사형 ADC)

  • Youn, Eun-ji;Jang, Young-Chan
    • Journal of IKEEE
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    • v.23 no.1
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    • pp.35-43
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    • 2019
  • A capacitor self-calibration is proposed to improve the linearity of the capacitor digital-to-analog converter (CDAC) for an asynchronous successive approximation register (SAR) analog-to-digital converter (ADC) with 10-bit resolution. The proposed capacitor self-calibration is performed so that the value of each capacitor of the upper 5 bits of the 10-bit CDAC is equal to the sum of the values of the lower capacitors. According to the behavioral simulation results, the proposed capacitor self-calibration improves the performances of differential nonlinearity (DNL) and integral nonlinearity (INL) from -0.810/+0.194 LSBs and -0.832/+0.832 LSBs to -0.235/+0.178 LSBs and -0.227/+0.227 LSBs, respectively, when the maximum capacitor mismatch of the CDAC is 4%. The proposed 10-bit 20-MS/s asynchronous SAR ADC is implemented using a 110-nm CMOS process with supply of 1.2 V. The area and power consumption of the proposed asynchronous SAR ADC are $0.205mm^2$ and 1.25 mW, respectively. The proposed asynchronous SAR ADC with the capacitor calibration has a effective number of bits (ENOBs) of 9.194 bits at a sampling rate of 20 MS/s about a $2.4-V_{PP}$ differential analog input with a frequency of 96.13 kHz.

A Low-Power 2-Step 8-bit 10-MHz CMOS A/D Converter (저전력 2-Step 8-bit 10-MHz CMOS A/D 변환기)

  • 박창선;손주호;김영랄;김동용
    • Proceedings of the IEEK Conference
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    • 2000.06b
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    • pp.201-204
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    • 2000
  • In this paper, an A/D converter is implemented to obtain 8bit resolution at a conversion rate of 10Msample/s. This architecture is proposed using the 2-step architecture for high speed conversion rate. It is consisted of sample/hold circuit, low power comparator, voltage reference circuit and DAC of binary weighted capacitor array. Proposed A/D converter is designed using 0.2$\mu\textrm{m}$ CMOS technology. The SNR is 45.3dB at a sampling rate of 10MHz with 1.95MHz sine input signal. When an 8bit 10Msample/s A/D converter is simulated, the Differential Nonlinearity / Integral Nonlinearity (DNL/ INL) error are ${\pm}$1 / ${\pm}$2 LSB, respectively. The power consumption is 13㎽ at single +2.5V supply voltage.

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A 2.5 V 109 dB DR ΔΣ ADC for Audio Application

  • Noh, Gwang-Yol;Ahn, Gil-Cho
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.10 no.4
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    • pp.276-281
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    • 2010
  • A 2.5 V feed-forward second-order deltasigma modulator for audio application is presented. A 9-level quantizer with a tree-structured dynamic element matching (DEM) was employed to improve the linearity by shaping the distortion resulted from the capacitor mismatch of the feedback digital-toanalog converter (DAC). A chopper stabilization technique (CHS) is used to reduce the flicker noise in the first integrator. The prototype delta-sigma analogto-digital converter (ADC) implemented in a 65 nm 1P8M CMOS process occupies 0.747 $mm^2$ and achieves 109.1 dB dynamic range (DR), 85.4 dB signal-to-noise ratio (SNR) in a 24 kHz audio signal bandwidth, while consuming 14.75 mW from a 2.5 V supply.

Design of a high speed 3rd order sigma-delta modulator (3.3V 고속 CMOS 3차 시그마 델타 변조기 설계)

  • 박준한;윤광섭
    • Proceedings of the IEEK Conference
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    • 1999.06a
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    • pp.982-985
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    • 1999
  • An efficient technique to trade off speed for resolution is the sigma-delta modulation (SDM). This paper proposes a new SDM architecture to improve conversion rates and SNR(Signal-to Noise Ratio) by using master clock and four divided clock. The charateristics of the proposed SDM are simulated in MATLAB environment. and optimizing the capacitor sizes is done by iterative processing. other analog characteristics are simulated using 0.65${\mu}{\textrm}{m}$ n-well CMOS process, double poly and single metal. The result of simulation shows that more increasing the effective bits of internal ADC/DAC, bigger the improvement of SNR.

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2.5V $0.25{\mu}m$ CMOS Temperature Sensor with 4-Bit SA ADC

  • Kim, Moon-Gyu;Jang, Young-Chan
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2011.10a
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    • pp.448-451
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    • 2011
  • SoC에서 칩 내부의 온도를 측정하기 위한 proportional-to-absolute-temperature (PTAT) 회로와 sensing 된 아날로그 신호를 디지털로 변환하기 위해 4-bit analog-to-digital converter (ADC)로 구성된 temperature sensor를 제안한다. CMOS 공정에서 vertical PNP 구조를 이용하여 PTAT 회로가 설계되었다. 온도변화에 둔감한 ADC를 구현하기 위해 아날로그 회로를 최소로 사용하는 successive approximation (SA) ADC가 이용되었다. 4-bit SA ADC는 capacitor DAC와 time-domain 비교기를 이용함으로 전력소모를 최소화하였다. 제안된 temperature sensor는 2.5V $0.25{\mu}m$ 1-poly 9-metal CMOS 공정을 이용하여 설계되었고, $50{\sim}150^{\circ}C$ 온도 범위에서 동작한다. Temperature sensor의 면적과 전력 소모는 각각 $130{\times}390\;um^2$과 868 uW이다.

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The DWA Design with Improved Structure by Clock Timing Control (클록 타이밍 조정에 의한 개선된 구조를 가지는 DWA 설계)

  • Kim, Dong-Gyun;Shin, Hong-Gyu;Cho, Seong-Ik
    • The Transactions of the Korean Institute of Electrical Engineers P
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    • v.59 no.4
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    • pp.401-404
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    • 2010
  • In multibit Sigma-Delta Modulator, DWA(Data Weighted Averaging) among the DEM(Dynamic Element Matching) techniques was widely used to get rid of non-linearity that caused by mismatching of unit capacitor in feedback DAC path. this paper proposed the improved DWA architecture by adjusting clock timing of the existing DWA architecture. 2n Register block used for output was replaced with 2n S-R latch block. As a result of this, MOS Tr. can be reduced and extra clock can also be removed. Moreover, two n-bit Register block used to delay n-bit data code is decreased to one n-bit Register. In order to confirm characteristics, DWA for the 3-bit output with the proposed DWA architecture was designed on 0.18um process under 1.8V supply. Compared with the existing architecture. It was able to reduce the number of 222 MOS Tr.

CMOS Programmable Interface Circuit for Capacitive MEMS Gyroscope (MEMS 용량형 각속도 센서용 CMOS 프로그래머블 인터페이스 회로)

  • Ko, Hyoung-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.48 no.9
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    • pp.13-21
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    • 2011
  • In this paper, the CMOS programmable interface circuit for MEMS gyroscope is presented, and evaluated with the MEMS sensing element. The circuit includes the front-end charge amplifier with 10 bit programmable capacitor arrays, 9 bit DAC for accurate offset calibration, and 10 bit PGA for accurate gain calibration. The self oscillation loop with automatic gain control operates properly. The offset error and gain error after calibration are measured to be 0.36 %FSO and 0.19 %FSO, respectively. The noise equivalent resolution and bias instability are measured to be 0.016 deg/sec and 0.012 deg/sec, respectively. The calibration capability of this circuit can reduce the variations of the output offset and gain, and this can enhance the manufacturability and can improve the yield.