• 제목/요약/키워드: CVT(Chemical Vapor Transport)

검색결과 7건 처리시간 0.022초

Fabrication of epitaxial ZnO layers on MOCVD-ZnO/(01-12) sapphire by chemical vapor transport

  • Hong, Sang-Hwui;Kato, Kenichi;Mimura, Kouji;Uchikoshi, Masahito;Abe, Seishi;Isshiki, Minoru
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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    • pp.700-702
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    • 2009
  • We present the epitaxial growth of high-quality ZnO layers by chemical vapor transport (CVT) technique on (01-12) sapphire with a ZnO buffer layer growth by metal-organic chemical vapor deposition (MOCVD). The surface of the grown ZnO epitaxial layers has atomically flats and the RMS is 0.11 nm. PL spectrum of as-grown samples exhibits two emissions originated by interactions between photon and free excitons.

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MoO3 분말의 수소환원을 통한 CIGS계 후면 전극용 Mo 박막제조 (Fabrication of Mo Thin Film by Hydrogen Reduction of MoO3 Powder for Back Contact Electrode of CIGS)

  • 조태선;김세훈;김영도
    • 대한금속재료학회지
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    • 제49권2호
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    • pp.187-191
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    • 2011
  • In order to obtain a suitable back contacting electrode for $Cu(InGa)Se_2$-based photovoltaic devices, a molybdenum thin film was deposited using a chemical vapor transport (CVT) during the hydrogen reduction of $MoO_3$ powder. A $MoO_2$ thin film was successfully deposited on substrates by using the CVT of volatile $MoO_3(OH)_2$ at $550^{\circ}C$ for 60 min in a $H_2$ atmosphere. The Mo thin film was obtained by reduction of $MoO_2$ at $650^{\circ}C$ in a $H_2$ atmosphere. The Mo thin film on the substrate presented a low sheet resistance of approximately $1{\Omega}/sq$.

$FeSi_2$ 박막 홀 효과의 온도의존성 (Hall Effect of $FeSi_2$ Thin Film by Temperture)

  • 이우선;김형곤;김남오;정헌상
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 추계학술대회 논문집 Vol.14 No.1
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    • pp.230-233
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    • 2001
  • FeSi2/Si Layer were grown using FeSi2, Si wafer by the chemical transport reactio nmethod. The directoptical energy gap was found to be 0.871eV at 300 K. The Hall effect is a physical effect arising in matter carrying electric current inthe presence of a magnetic field. The effect is named after the American physicist E. H. Hall, who discovered it in 1879. IN this paper, we study electrical properties of FeSi2/Si layer. And then we measured Hall coefficient Hall mobility, carrier density and Hall voltage according to variation magnetic field and temperature, Because of important part for it applicationVarious phase of silicide is formed at the metal-Si interface when transition metal contacts to Si. Silicides belong to metallic or semiconducting according to their electrical and optical properties. Metallic silicides are used as gate electrodes or interconnections in VLSI devices. Semiconducting silicides can be used as a new material for IR detectors because of their narrow energy band gap.

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$FeSi_2$ 박막 홀 효과의 자계의존성 (Hall Effect of $FeSi_2$ Thin Film by Magnetic Field)

  • 이우선;김형곤;김남오;서용진
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 추계학술대회 논문집 Vol.14 No.1
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    • pp.234-237
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    • 2001
  • FeSi2/Si Layer were grown using FeSi2, Si wafer by the chemical transport reactio nmethod. The directoptical energy gap was found to be 0.871eV at 300 K. The Hall effect is a physical effect arising in matter carrying electric current inthe presence of a magnetic field. The effect is named after the American physicist E. H. Hall, who discovered it in 1879. IN this paper, we study electrical properties of FeSi2/Si layer. And then we measured Hall coefficient Hall mobility,carrier density and Hall voltage according to variation magnetic field and temperature, Because of important part for it applicationVarious phase of silicide is formed at the metal-Si interface when transition metal contacts to Si. Silicides belong to metallic or semiconducting according to their electrical and optical properties. Metallic silicides are used as gate electrodes or interconnections in VLSI devices. Semiconducting silicides can be used as a new material for IR detectors because of their narrow energy band gap.

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FeSi$_2$박막 흘 효과의 자계의존성 (Hall Effect of FeSi$_2$ Thin Film by Magnetic Field)

  • 이우선;김형곤;김남오;서용진
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 추계학술대회 논문집
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    • pp.234-237
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    • 2001
  • FeSi$_2$/Si Layer were grown using FeSi$_2$, Si wafer by the chemical transport reaction method. The directoptical energy gap was found to be 0.871ev at 300 K. The Hall effect is a physical effect arising in matter carrying electric current in the presence of a magnetic field. The effect is named after the American physicist E. H. Hall, who discovered it in 1879. In this paper, we study electrical properties of FeSi$_2$/Si layer And then we measured Hall coefficient Hall mobility, carrier density and Hall voltage according to variation magnetic field and temperature, Because of important Part for it application Various phase of silicide is formed at the metal-Si interface when transition metal contacts to Si. Silicides belong to metallic or semiconducting according to their electrical and optical properties. Metallic silicides are used as gate electrodes or interconnections in VLSI devices. Semiconducting silicides can be used as a new material for IR detectors because of their narrow energy band gap.

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$FeSi_2$박막 홀 효과의 온도의존성 (Hall Effect of $FeSi_2$ Thin Film by Temperature)

  • 이우선;김형곤;김남오;정헌상
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 추계학술대회 논문집
    • /
    • pp.230-233
    • /
    • 2001
  • FeSi$_2$ Layer were grown using FeSi$_2$, Si wafer by the chemical transport reaction method. The directoptical energy gap was found to be 0.87leV at 300 K. The Hall effect is a Physical effect arising in matter carrying electric current in the presence of a magnetic field. The effect is named after the American physicist E.H. Hall, who discovered it in 1879. In this paper, we study electrical properties of FeSi$_2$/Si layer. And then we measured Hall coefficient Hall mobility, carrier density and Hall voltage according to variation magnetic field and temperature, Because of important part for it application various phase of silicide is formed at the metal-Si interface when transition metal contacts to Si. Silicides belong to metallic or semiconducting according to their electrical and optical properties. Metallic silicides are used as gate electrodes or interconnections in VLSI devices. Semiconducting silicides can be used as a new material for IR detectors because of their narrow energy band gap.

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화학증기수송법을 이용한 금속 몰리브덴 박막 증착

  • 박창원;이영중;김대건;김영도
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 2009년도 춘계학술발표대회
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    • pp.53.2-53.2
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    • 2009
  • 몰리브덴(Mo)은 우수한 전기전도도와 고온 안정성으로 인해 전자부품의 전극으로 널리 사용되고, 미래 에너지인 태양전지 분야에서 CIS계 화합물박막태양전지의 후면전극으로 이용되고 있는 재료로서 현재 증착 방법으로는 D.C. sputtering이 가장 널리 이용되고 있다. 또한 $MoO_3$ 분말이 Mo 분말로 수소 환원되는 과정은 $MoO_3+H_2{\rightarrow}MoO_2+H_2O$$MoO_2+2H_2{\rightarrow}Mo+2H_2O$의 2단계를 통해서 수행되며 이중 첫 번째 단계에서 $MoO_3(OH)_2$라는 기상을 통해 지배적으로 일어난다고 알려져 있고 이를 화학증기수송(Chemical vapor transport : CVT)이라고 한다. 본 연구에서는 $MoO_3$분말의 수소 환원 과정 중에 발생하는 기상인 $MoO_3(OH)_2$을 이용하여 몰리브덴 옥사이드 박막을 증착하고 이를 다시 수소분위기에서 수소 환원하는 증착 방법을 통해 균일하고 부착성이 우수한 Mo 박막을 제조하고자 하였다. 기판으로 사용된 Glass를 $MoO_3$ 분말 위에 홀더를 이용하여 $MoO_2$ 박막을 증착하고 이를 다시 수소분위기에서의 수소 환원을 통해 Mo 박막을 성공적으로 제조하였다. 제조된 Mo박막의 결정구조 및 미세조직을 XRD 와 SEM을 통해 분석하였다.

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