• KIPS Transactions on Computer and Communication Systems
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• v.3 no.5
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• pp.129-140
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• 2014

BIST(Built-in self test) is to detect various faults of the existing memory and BIRA(Built-in redundancy analysis) is to repair detected faults by allotting spare. Also, BISR(Built-in self repair) which integrates BIST with BIRA, can enhance the whole memory's yield. However, the previous methods were suggested for RAM and are difficult to diagnose disturbance that is NAND-type flash memory's intrinsic fault when used for the NAND-type flash memory with different characteristics from RAM's memory structure. Therefore, this paper suggests a BISD(Built-in self diagnosis) to detect disturbance occurring in the NAND-type flash memory and to diagnose the location of fault, and BISR to repair faulty blocks.

• ETRI Journal
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• v.31 no.3
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• pp.339-341
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• 2009

Built-in redundancy analysis (BIRA) is widely used to enhance the yield of embedded memories. In this letter, a new BIRA method for both high repair efficiency and small hardware overhead is presented. The proposed method performs redundancy analysis operations using the spare mapping registers with a covered fault list. Experimental results demonstrate the superiority of the proposed method compared to previous works.

• ETRI Journal
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• v.32 no.4
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• pp.638-641
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• 2010

With the growth of memory capacity and density, memory testing and repair with the goal of yield improvement have become more important. Therefore, the development of high efficiency redundancy analysis algorithms is essential to improve yield rate. In this letter, we propose an improved built-in redundancy analysis (BIRA) algorithm with a minimized binary search tree made by simple calculations. The tree is constructed until finding a solution from the most probable branch. This greatly reduces the search spaces for a solution. The proposed BIRA algorithm results in 100% repair efficiency and fast redundancy analysis.

• JSTS:Journal of Semiconductor Technology and Science
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• v.12 no.3
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• pp.266-269
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• 2012

High-efficiency built-in redundancy analysis (BIRA) is presented. The proposed BIRA uses three techniques to achieve a high repair rate using spare mapping registers with adjustable fault tags to reduce area overhead. Simulation results show that the proposed BIRA is a reasonable solution for embedded memories.

• Journal of the Institute of Electronics and Information Engineers
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• v.49 no.9
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• pp.237-243
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• 2012

In recent system-on-chip (SoC) designs, several hundred embedded memory cores have occupied the largest portion of the chip area. Therefore, the yield of SoCs is strongly dependent on the yield of the embedded memory cores. If all memories had built-in self repair (BISR) with optimal repair rates, the area overhead would be very large. A bit-map sharing method using a memory grouping is proposed to reduce the area overhead. Since the bit-map memory occupies the largest portion of the area of the built-in redundancy analysis (BIRA), the proposed bit-map sharing method can greatly reduce the area overhead of the BIRA. Based on the experimental results, the proposed method can reduce the area overhead by about 80%.

• ETRI Journal
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• v.32 no.4
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• pp.642-644
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• 2010

With the rapid increase occurring in both the capacity and density of memory products, test and repair issues have become highly challenging. Memory repair is an effective and essential methodology for improving memory yield. An SoC utilizes built-in redundancy analysis (BIRA) with built-in self-test for improving memory yield and reliability. This letter proposes a new heuristic algorithm and new hardware architecture for the BIRA scheme. Experimental results indicate that the proposed algorithm shows near-optimal repair efficiency in combination with low area and time overheads.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.47 no.12
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• pp.24-30
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• 2010

In recent memories, repair is an unavoidable method to maintain its yield and quality. The probability of defect occurence on spare lines has been increased through the growth of the density of recent memories with 2 dimensional spare architecture. In this paper, a new analysis region virtualization scheme is proposed. the analysis region virtualization scheme can be applied with any BIRA (built-in redundancy analysis) algorithms without the loss of their repair rates. The analysis region virtualization scheme can be a viable solution for BIRA considering the faulty spare lines of the future high density memories.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.2
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• pp.113-120
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• 2007

With the advance of VLSI technology, the capacity and density of memories is rapidly growing. In this paper we proposed reallocation algorithm. All faulty cell of embedded memory is reallocated into the row and column spare memory. This work implements reallocation algorithm and BISR to verify its design.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.63 no.8
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• pp.1046-1054
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• 2014

In this paper, a hardware prototype for the 10kVA 11-level MMC was built and various experimental works were conducted to verify the operation algorithms of MMC. The hardware prototype was designed using computer simulation with PSCAD/EMTDC software. After manufactured in the lab, the hardware prototype was tested to verify the modulation algorithms to form the output voltage, the balancing algorithm to equalize the sub-module capacitor voltage, and the redundancy operation algorithm to improve the system reliability. The developed hardware prototype can be utilized for analyzing the basic operation and performance improvement of MMC according to the modulation and redundancy operation scheme. It also can be utilize to analyze the basic operational characteristics of HVDC system based on MMC.

• Proceedings of the KIPE Conference
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• 2014.07a
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• pp.209-210
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• 2014

In this paper, a hardware prototype for the 10kVA 11-level MMC was built and various experimental works were conducted to verify the operation algorithms of MMC. The hardware prototype was designed using computer simulation with PSCAD/EMTDC software. After manufactured in the lab, the hardware prototype was tested to verify the modulation algorithms to form the output voltage, the balancing algorithm to equalize the sub-module capacitor voltage, and the redundancy operation algorithm to improve the system reliability.