• Title/Summary/Keyword: Binary nitrides

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Eutectic Ceramic Composites by Melt-Solidification

  • Goto, Takashi;Tu, Rong
    • Journal of the Korean Ceramic Society
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    • v.56 no.4
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    • pp.331-339
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    • 2019
  • While high-temperature ceramic composites consisting of carbides, borides, and nitrides, the so-called ultra-high-temperature ceramics (UHTCs), have been commonly produced through solid-state sintering, melt-solidification is an alternative method for their manufacture. As many UHTCs are binary or ternary eutectic systems, they can be melted and solidified at a relatively low temperature via a eutectic reaction. The microstructure of the eutectic composites is typically rod-like or lamellar, as determined by the volume fraction of the second phase. Directional solidification can help fabricate more sophisticated UHTCs with highly aligned textures. This review describes the fabrication of UHTCs through the eutectic reaction and explains their mechanical properties. The use of melt-solidification has been limited to small specimens; however, the recently developed laser technology can melt large-sized UHTCs, suggesting their potential for practical applications. An example of laser melt-solidification of a eutectic ceramic composite is demonstrated.

Growth and Properties of CrNx/TiNy/Al Based on N2 Gas Flow Rate for Solar Thermal Applications

  • Ju, Sang-Jun;Jang, Gun-Eik;Jang, Yeo-Won;Kim, Hyun-Hoo;Lee, Cheon
    • Transactions on Electrical and Electronic Materials
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    • v.17 no.3
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    • pp.146-149
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    • 2016
  • The CrN/TiN/Al thin films for solar selective absorber were prepared by dc reactive magnetron sputtering with multi targets. The binary nitride CrN layer deposited with change in N2 gas flow rates. The gas mixture of Ar and N2 was an important parameter during sputtering deposition because the metal volume fraction (MVF) was controlled by the N2 gas flow rate. In this study, the crystallinity and surface properties of the CrN/TiN/Al thin films were estimated by X-ray diffraction (XRD), atomic force microscopy (AFM) and field emission scanning electron microscopy (FESEM). The composition and depth profile of thin films were investigated using Auger electron spectroscopy (AES). The absorptance and reflectance with wavelength spectrum were recorded by UV-Vis-NIR spectrophotometry at a range of 300~1,100 nm.