• Title/Summary/Keyword: Baggage Inspection System

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Development of Dual Energy Radiation Detector (이중 에너지 방사선 검출기 개발)

  • Yeo, Hwa-Yeon
    • Journal of the Korean Society of Radiology
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    • v.4 no.3
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    • pp.5-11
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    • 2010
  • In this paper, we are suggested development of dual-mode detector for dual-energy digital radiography. Design of dual-energy radiography module for commercial BIS (Baggage Inspection System) is used in the spectrum of the X-ray generator and detector for dual-mode features and radiological characteristics were analyzed. BIS suggestl on the image detector module being used to target X-ray tube to simulate X-ray spectrum and simulated spectrum to offer through the new radiographic characteristics of the detector modules were investigated. Using X-ray experiments with an increase in the thickness of the copper filter low energy detector (LED) and high-energy detector (HED) as the difference between the output signal increases. HED, especially in the size of the output signal decreases with increasing thickness of the copper filter was found.

Image System Using Dual Energy Detector (이중 에너지 검출기를 이용한 영상 시스템)

  • Yeo, Hwa-Yeon
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.11 no.9
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    • pp.3517-3523
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    • 2010
  • Single exposure dual X-ray imaging can be used to separate soft and dense-material images for medical and industrial applications. This study keep focusing baggage inspection system(BIS) specifically. New detector modules for single exposure dual X-ray imaging are consisted of low energy detector (LED) and high energy detector (HED). First, the optimized thickness of copper filter coupled HED to separate low energy and high energy was simulated by the given X-ray energy (140 kVp, 1 mA) using Monte Carlo simulation codes, MCNPX. So as a result of simulation, the copper filter thickness is 0.7 mm. For the design of PIN photodiode, ATLAS device simulation tool was used. 16 channels PIN photodiode of 1.5 mm ${\times}$ 3.2 mm for Dual X-ray imaging detector was fabricated in the process of ETRI. And its dark current and quantum efficiency, terminal capacitance were measured. It was proven that the Lanex Fast B coupled HED were a sufficient candidate to replace the CsI(Tl) commerced in dual X-ray system, since these give a strong signal, overcoming system noise. Finally dual X-ray image was acquired through correction of the LED X-ray Image and the HED X-ray Image.