• 한국전기전자재료학회논문지
• /
• 제18권10호
• /
• pp.902-908
• /
• 2005

Various stresses (such as electrical stress, mechanical stress, environmental and electrochemical stress, and defects of structure) result in insulation degradation of epoxy mold type insulators. Since the insulation degradation of BCT(Bushing Current Transformer) and bushing proceeds during fabrication process or operation time due to these causes, various methods to reduce the degradation in their insulation ability have been suggested. In this paper, we investigated surface temperature increment of these insulators due to PD(partial discharge). After the voltage applied into the insulator to generate the artificial PD, the surface temperature of the insulator was measured with non-contact thermometer using infrared rays. It was confirmed through the analysis based on PD experiments that the procession in the insulation degradation of the insulator could be estimated through the measurement of the surface temperature in the insulator.