• Title/Summary/Keyword: Apparent charge mobility

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Space Charge Behavior of Oil-Impregnated Paper Insulation Aging at AC-DC Combined Voltages

  • Li, Jian;Wang, Yan;Bao, Lianwei
    • Journal of Electrical Engineering and Technology
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    • v.9 no.2
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    • pp.635-642
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    • 2014
  • The space charge behaviors of oil-paper insulation affect the stability and security of oil-filled converter transformers of traditional and new energies. This paper presents the results of the electrical aging of oil-impregnated paper under AC-DC combined voltages by the pulsed electro-acoustic technique. Data mining and feature extractions were performed on the influence of electrical aging on charge dynamics based on the experiment results in the first stage. Characteristic parameters such as total charge injection and apparent charge mobility were calculated. The influences of electrical aging on the trap energy distribution of an oil-paper insulation system were analyzed and discussed. Longer electrical aging time would increase the depth and energy density of charge trap, which decelerates the apparent charge mobility and increases the probability of hot electron formation. This mechanism would accelerate damage to the cellulose and the formation of discharge channels, enhance the acceleration of the electric field distortion, and shorten insulation lifetime under AC-DC combined voltages.

Transport Properties of Conversion Materials for Digital Radiography

  • Kim, Jae-Hyung;Park, Chang-Hee;Nam, Sang-Hee
    • Transactions on Electrical and Electronic Materials
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    • v.8 no.6
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    • pp.250-254
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    • 2007
  • Applying the moving photo-carrier grating(MPG) technique and time-of-flight(TOF) measurements, we studied the transport properties of stabilized amorphous selenium typical of the material used in direct conversion X-ray imaging devices. For MPG measurement, we obtained electron and hole mobility and the recombination lifetime of $\alpha-Se$ films with arsenic(As) additions. We found an apparent increase in hole drift mobility and recombination lifetime, especially when 0.3 % As was added into $\alpha-Se$ film, whereas electron mobility decreased with the addition of As due to the defect density. For TOF measurement, a laser beam with pulse duration of 5 ns and wavelength of 350 nm was illuminated on the surface of $\alpha-Se$ with a thickness of 400 ${\mu}m$. The measured hole and electron transit times were about 8.73 ${\mu}s$ and 229.17 ${\mu}s$, respectively.