• 제목/요약/키워드: Analysis of electronic circuits

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Deceleration Method of Munition to used Soft Recovery System for Smart Munition (지능형 포탄의 저 감속 회수장치를 이용한 포탄의 감속방법)

  • Kim, Myoung-Gu;Cho, Chong-Du;Lee, Seung-Su;Yu, Il-Young;Chang, Kwe-Hyun
    • Transactions of the Korean Society for Noise and Vibration Engineering
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    • v.17 no.9
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    • pp.777-784
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    • 2007
  • With the development of micro electronic circuits and optical equipment, the demand for developing smart munitions with the ability to autonomously search for and attack targets has increased. Since the electronic components within smart munitions are affected by high temperatures, pressure, and impulsive forces upon the combustion of gunpowder, stability and reliability need to be secured for them. Securing those stability and reliability requires soft recovery system which can decelerate smart munitions. A theoretical analysis of flow is performed for the secure recovery of bullets on the basis of Euler equation for compressible fluids. The inner pressure on a pressure tube, the speeds of bullets, and the deceleration of munitions are calculated theoretically. Theoretical results are compared with the data from the experiment with soft recovery system set up at the laboratory.

Analog Performance Analysis of Self-cascode Structure with Native-Vth MOSFETs (Native-Vth MOSFET을 이용한 셀프-캐스코드 구조의 아날로그 성능 분석)

  • Lee, Dae-Hwan;Baek, Ki-Ju;Ha, Ji-Hoon;Na, Kee-Yeol;Kim, Yeong-Seuk
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.26 no.8
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    • pp.575-581
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    • 2013
  • The self-cascode (SC) structure has low output voltage swing and high output resistance. In order to implement a simple and better SC structure, the native-$V_{th}$ MOSFETs which has low threshold voltage($V_{th}$) is applied. The proposed SC structure is designed using a qualified industry standard $0.18-{\mu}m$ CMOS technology. Measurement results show that the proposed SC structure has higher transconductance as well as output resistance than single MOSFET. In addition, analog building blocks (e.g. current mirror, basic amplifier circuits) with the proposed SC structure are investigated using by Cadence Spectre simulator. Simulation results show improved electrical performances.

An Analysis of the Ground Surface Potential Rise and Hazardous Voltages Caused by Impulse Currents (임펄스전류에 의한 대지표면전위상승 및 위험전압의 분석)

  • Lee, Bok-Hee;Lee, Kyu-Sun;Choi, Jong-Hyuk;Seong, Chang-Hoon
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.25 no.4
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    • pp.117-123
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    • 2011
  • Lightning and switching surges propagating through the grounding conductors lead to transient overvoltages, and electronic circuits in information technology systems are very susceptible to damage or malfunction from the electrical surges. Surge damages or malfunctions of electrical and electronic equipment may be caused by potential rises. To solve these problems, it is very important to evaluate the ground surface potential rises and hazardous voltages such as touch and step voltages at or near the grounding systems energized by electrical surges. In this paper, the performance of grounding systems against the surge current containing high frequency components on the basis of the actual-sized tests is presented. The ground surface potential rises and hazardous voltages depending on impulse currents for vertical or horizontal grounding electrodes are measured and analyzed. Also the touch and step voltages caused by the impulse currents are investigated. As a result, the ground surface potential rises, the touch and step voltages near the grounding electrodes are raised and the conventional grounding impedances are increased as the front time of the injected impulse currents is getting faster.

Analysis of Resonant MTM-TL Using Transmission Line Theory and Its Applications (전송 이론을 이용한 공진 MTM-TL 특성 분석 및 응용)

  • Jang, Seong-Nam;Lee, Bom-Son
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.20 no.10
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    • pp.1091-1096
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    • 2009
  • Some closed-form expressions for circuit parameters are derived based on the equivalent circuits for the resonant MTM-TL(open and short). The lumped series resistance and shunt conductance, which explain radiation effects of a unit cell may be found by |$S_{11}$|(simulated or measured) with open and short terminations, respectively. The EM-simulated results, circuit-simulated results(obtained using extracted circuit parameters) and measurement results are shown to be in good agreement.

Leakage Current Energy Harvesting Application in a Photovoltaic (PV) Panel Transformerless Inverter System

  • Khan, Md. Noman Habib;Khan, Sheroz
    • Transactions on Electrical and Electronic Materials
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    • v.18 no.4
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    • pp.190-194
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    • 2017
  • Present-day solar panels incorporate inverters as their core components. Switching devices driven by specialized power controllers are operated in a transformerless inverter topology. However, some challenges associated with this configuration include the absence of isolation, causing leakage currents to flow through various components toward ground. This inevitably causes power losses, often being also the primary reason for the power inverters' analog equipment failure. In this paper, various aspects of the leakage currents are studied using different circuit analysis methods. The primary objective is to convert the leakage current energy into a usable DC voltage source. The research is focused on harvesting the leakage currents for producing circa 1.1 V, derived from recently developed rectifier circuits, and driving a $200{\Omega}$ load with a power in the milliwatt range. Even though the output voltage level is low, the harvested power could be used for charging small batteries or capacitors, even driving light loads.

Fabrication and Characteristic Analysis of Single Poly-Si flash EEPROM (단일층 다결정 실리콘 Flash EEPROM 소자의 제작과 특성 분석)

  • Kwon Young-Jun;Jung Jung-Min;Park Keun-Hyung
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.19 no.7
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    • pp.601-604
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    • 2006
  • In this paper, we propose the single poly-Si Flash EEPROM device with a new structure which does not need the high voltage switching circuits. The device was designed, fabricated and characterized. From the measurement results, it was found that the program, the erase and the read operations worked properly. The threshold voltage was 3.1 V after the program in which the control gate and the drain were biased with 12 V and 7 V for $100{\mu}S$, respectively. And it was 0.4 V after the erase in which the control gate was grounded and the drain were biased with 11 V for $200{\mu}S$. On the other hand, it was found that the program and the erase speeds were significantly dependent on the capacitive coupling ratio between the control gate and the floating gate. The larger the capacitive coupling ratio, the higher the speeds, but the target the area per cell. The optimum structure of the cell should be chosen with the consideration of the trade-offs.

Sliding Mode Controller Applied to Coupled Inductor Dual Boost Inverters

  • Fang, Yu;Cao, Songyin;Wheeler, Pat
    • Journal of Power Electronics
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    • v.19 no.6
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    • pp.1403-1412
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    • 2019
  • A coupled inductor-dual boost-inverter (CIDBI) with a differential structure has been presented for application to a micro-inverter photovoltaic module system due to its turn ratio of a high-voltage level. However, it is difficult to design a CIDBI converter with a conventional PI regulator to be stable and achieve good dynamic performance, given the fact that it is a high order system. In view of this situation, a sliding mode control (SMC) strategy is introduced in this paper, and two different sliding mode controllers (SMCs) are proposed and adopted in the left and right side of two Boost sub-circuits to implement the corresponding regulation of the voltage and current. The schemes of the SMCs have been elaborated in this paper including the establishment of a system variable structure model, selection of the sliding surface, determination of the control law, and presentation of the reaching conditions and sliding domain. Finally, the mathematic analysis and the proposed SMC are verified by experimental results.

Steady-State Performance Analysis of an Integrated Wind Turbine Generating System in a DC Transmission System with Power Compensation System

  • Yamashita, Ken-Ichiro;Nishikata, Shoji
    • Journal of international Conference on Electrical Machines and Systems
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    • v.1 no.1
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    • pp.121-127
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    • 2012
  • An electric power compensation system for a DC transmission system with an integrated wind turbine generator is proposed. The proposed compensation system consists of a synchronous generator and a duplex reactor. This apparatus is connected to the sending-end circuit of the DC transmission system. A set of steady-state equations of the system is first derived. Then, the effect of the duplex reactor, which can eliminate the sending-end grid current distortion due to commutation of the converter, is explored. The relationships among power at the sending-end circuit are also revealed. It is shown that fluctuations in the sending-end grid power due to changes in wind velocities are compensated with the proposed system. Finally, the effects of the sending-end grid conditions on the steady-state characteristics of the system are studied.

A Study on a PSPICE Model for the SCR and TRIAC (SCR 및 TRIAC PSPICE 모델에 관한 연구)

  • Won, Chung-Yuen;Yang, Seung-Ho;Kim, Sei-Chan;Kim, Duk-Heon
    • Proceedings of the KIEE Conference
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    • 1990.11a
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    • pp.357-361
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    • 1990
  • PSPICE is a general purpose circuit program that can be applied to simulate and calculate the performance of electronic circuits. More recently, an ideal voltage controlled switch provided in it is proposed to develop simple computer models for SCR's and TRIAC's. These models enable designer to simulate the steady state and transient analysis of power electronics circuit.

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Design and Analysis of an Accelerated Life Test for Magnetic Contactors

  • Ryu, Haeng-Soo;Park, Sang-Yong;Han, Gyu-Hwan;Kwon, Young-Il;Yoon, Nam-Sik
    • Journal of Electrical Engineering and Technology
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    • v.2 no.2
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    • pp.188-193
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    • 2007
  • Magnetic contactors (MCs) are widely used in industrial equipment such as elevators, cranes and factory control rooms in order to close and open the control circuits. The reliability of MCs mainly depend on mechanical durability and international standards such as IEC 60947-4-1, which stipulates the testing method for MCs. Testing time, however, is so long in usual cases that a method of reducing testing time is required. Therefore, a temperature and voltage-accelerated life testing (ALT) method has been developed to reduce the testing time in this work. The accelerated life test data are analyzed and acceleration factors (AFs) are provided.