• Journal of Electrical Engineering and Technology
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• 제13권6호
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• pp.2485-2492
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• 2018

The rapid development of large-scale integrated circuits has brought great challenges to the circuit testing and diagnosis, and due to the lack of exact fault models, inaccurate analog components tolerance, and some nonlinear factors, the analog circuit fault diagnosis is still regarded as an extremely difficult problem. To cope with the problem that it's difficult to extract fault features effectively from masses of original data of the nonlinear continuous analog circuit output signal, a novel approach of feature extraction and dimension reduction for analog circuit fault diagnosis based on wavelet packet decomposition, local linear embedding algorithm, and clone selection algorithm (WPD-LLE-CSA) is proposed. The proposed method can identify faulty components in complicated analog circuits with a high accuracy above 99%. Compared with the existing feature extraction methods, the proposed method can significantly reduce the quantity of features with less time spent under the premise of maintaining a high level of diagnosing rate, and also the ratio of dimensionality reduction was discussed. Several groups of experiments are conducted to demonstrate the efficiency of the proposed method.

• 전기학회논문지
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• 제63권3호
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• pp.418-424
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• 2014

A large number of wire rope has been used in various industries such as cranes and elevators. When wire used for a long time, wire defects occur such as disconnection and wear. It leads to an accident and damage to life and property. To prevent this accident, we proposed a wire rope fault detection system in this paper. We constructed the whole system choosing the leakage fault detection method using hall sensors and the method is simple and easy maintenance characteristics. Fault diagnosis and analysis were available through analog filter and amplification process. The amplified signal is transmitted to the computer through the data acquisition system. This signal could be obtained improved results through the digital filter process.

• 한국정보통신학회논문지
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• 제20권1호
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• pp.175-184
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• 2016

본 논문에서는 기존의 LCR 미터에 의한 측정방식이 아니라 C/V(capacitance to voltage) 변환 방식을 이용하여 커패시턴스를 측정하는 방법을 제안하였다. 그리고 다중채널용 초음파 프로브 진단장치를 구현하기 위해 192채널들을 6개의 MUX(multiplexer) 채널로 변환하는 아날로그 MUX 회로를 설계하였다. 각각의 MUX 채널 회로별 전압을 다시 커패시턴스로 변환하는 회로특성이 다르기 때문에 각각의 MUX 채널별 디지털전압을 커패시턴스로 변환하는 변환함수를 최소 자승법을 이용하여 유도하였다. 개발된 시제품의 성능시험결과로 1회 측정시간이 4초 이내로 측정되었고, 192개 채널들의 반복적인 측정에서 최대값, 최소값, 평균값에 대한 측정 오차값이 5% 이내의 시험결과가 제시되었다.