• 제목/요약/키워드: Ag alloy

검색결과 362건 처리시간 0.028초

치과용(齒科用) 은(銀)-파라디움합금(合金)의 합금원소(合金元素)가 제성질(諸性質)에 미치는 영향(影響)에 관(關)한 연구(硏究) (EFFECTS OF ALLOYING ELEMENTS ON VARIOUS PROPERTIES OF DENTAL SILVER-PALLADIUM ALLOYS)

  • 김춘진;박남수
    • 대한치과보철학회지
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    • 제22권1호
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    • pp.95-108
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    • 1984
  • Even though the tarnishing and corrosion problems characteristic with dental silver-palladium alloy are not yet fully solved, it is recently widely used because of its low cost. However the effects of major alloying elements on the various properties of this system are not fully understood. The object of this research is to clarify the effects of In and Zn additives on the corrosion and tarnishing resistances and precipitation hardening behavior of this sytem, using electrodynamic polarization, immersion, and Vicker's microhardness test and X-ray diffraction and electron probe micro analysis methods. The obtained results were as follows: I. As indium content is increased, both the corrosion resistance in Cl-solution and microhardness are also increased while the tarnishing resistance is decreased. 2. As Zinc content is increased, the corrosion resistance is decreased, but tarnishing resistance is increased 3. At 70Ag-25Pd-2.5Zn-2.5In composition, the precipitation harding behavior was mot significant. The optimum aging temperature was $450^{\circ}C$ and the time was 2 hrs. The resulting specimen of this work carried 180VHN. 4. Under the heat treatment, the changes in the mechanical property are due to the changes in the shape and composition of dendrite matrix, namely, it is because of the precipitation hardening behavior which has been proved by electron probe micro analysis and optical microscopic finding.

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리플로우 시간에 따른 Pb-free 솔더/Ni 및 Cu 기판 접합부의 전단강도 평가 (Evaluation of Shear Strength for Pb-free Solder/Ni and Cu Plate Joints due to Reflow Time)

  • 하벼리;유효선;양성모;노윤식
    • 한국자동차공학회논문집
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    • 제21권3호
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    • pp.134-141
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    • 2013
  • Reflow soldering process is essential in electronic package. Reflow process for a long time results from the decrease of reliability because IMC is formed excessively. Solder alloys of Sn-37Pb and Sn-Ag with different kinds of Cu contents (0, 0.5 and 1 wt.%) as compared with Ni and Cu plate joints are investigated according to varying reflow time. The interfaces of solder joints are observed to analyze IMC (intermetallic compound) growth rate by scanning electron microscope (SEM). Shear test is also performed by using SP (Share-Punch) tester. The test results are compared with the solder joints of two different plates (Ni and Cu plate). $Cu_6Sn_5$ IMCs are formed on Cu plate interfaces after reflows in all samples. Ni3Sn4 and $(Cu,Ni)_6Sn_5$ IMCs are also formed on Ni plate interfaces. The IMC layer forms are affected by reflow time and contents of solder alloy. These results show that mechanical strength of solder joints strongly depends on thickness and shape of IMC.

Effect of Applied Voltage Bias on Electrochemical Migration in Eutectic SnPb Solder Alloy

  • Lee, Shin-Bok;Jung, Ja-Young;Yoo, Young-Ran;Park, Young-Bae;Kim, Young-Sik;Joo, Young-Chang
    • Corrosion Science and Technology
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    • 제6권6호
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    • pp.282-285
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    • 2007
  • Smaller size and higher integration of electronic systems make narrower interconnect pitch not only in chip-level but also in package-level. Moreover electronic systems are required to operate in harsher conditions, that is, higher current / voltage, elevated temperature / humidity, and complex chemical contaminants. Under these severe circumstances, electronic components respond to applied voltages by electrochemically ionization of metals and conducting filament forms between anode and cathode across a nonmetallic medium. This phenomenon is called as the electrochemical migration. Many kinds of metal (Cu, Ag, SnPb, Sn etc) using in electronic packages are failed by ECM. Eutectic SnPb which is used in various electronic packaging structures, that is, printed circuit boards, plastic-encapsulated packages, organic display panels, and tape chip carriers, chip-on-films etc. And the material for soldering (eutectic SnPb) using in electronic package easily makes insulation failure by ECM. In real PCB system, not only metals but also many chemical species are included. And these chemical species act as resources of contamination. Model test systems were developed to characterize the migration phenomena without contamination effect. The serpentine-shape pattern was developed for analyzing relationship of applied voltage bias and failure lifetime by the temperature / humidity biased(THB) test.

A Study on the Electrical Characteristics of Different Wire Materials

  • Jeong, Chi-Hyeon;Ahn, Billy;Ray, Coronado;Kai, Liu;Hlaing, Ma Phoo Pwint;Park, Susan;Kim, Gwang
    • 마이크로전자및패키징학회지
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    • 제20권4호
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    • pp.47-52
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    • 2013
  • Gold wire has long been used as a proven method of connecting a silicon die to a substrate in wide variety of package types, delivering high yield and productivity. However, with the high price of gold, the semiconductor packaging industry has been implementing an alternate wire material. These materials may include silver (Ag) or copper (Cu) alloys as an alternative to save material cost and maintain electrical performance. This paper will analyze and compare the electrical characteristics of several wire types. For the study, typical 0.6 mil, 0.8 mil and 1.0 mil diameter wires were selected from various alloy types (2N gold, Palladium (Pd) coated/doped copper, 88% and 96% silver) as well as respective pure metallic wires for comparison. Each wire model was validated by comparing it to electromagnetic simulation results and measurement data. Measurements from the implemented test boards were done using a vector network analyzer (VNA) and probe station setup. The test board layout consisted of three parts: 1. Analysis of the diameter, length and material characteristic of each wire; 2. Comparison between a microstrip line and the wire to microstrip line transition; and 3. Analysis of the wire's cross-talk. These areas will be discussed in detail along with all the extracted results from each type the wire.

초전도회전기용 래이스트랙형 고온초전도 마그네트 설계 및 제작 (Design and Fabrication of Racetrack type High Tc Superconducting Magnet for the Superconducting Rotating Machine)

  • 손명환;백승규;조영식;이언용;권영길;류강식
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2001년도 춘계학술대회 논문집 전기기기 및 에너지변환시스템부문
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    • pp.3-5
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    • 2001
  • Racetrack coils are used in many areas of superconductivity applications such as generators, motors, maglev, wiggler magnets and so on. The fabrication and characteristics of race-track type High Tc Superconducting (HTS) magnets were carried out. The Magnet is composed of 3 pancake coils wound by 37-filamental Bi-2223/ Ag-alloy tapes. Quench current ($I_q$) of both whole magnet and 3 pancake coils were measured. At 77K under the self-field, $I_q$ of magnet was 12A, while in the case of middle pancake coil, $I_q$ was 15A. The upper pancake coils of racetrack magnet with iron plates, magnet having optimized current distribution and initial magnet are compared with each other through 3D FEA, manufacturing and testing these magnets. The measured performance of the upper pancake coil #3 with iron plates improved by 50% on the basis of initial pancake coil #3. Quench current ($I_q$) of field winding was 12A. In addition, the fabrication processes and the characteristics of HTS magnet are described.

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팔라듐 표면처리를 통한 Massive Spalling 현상의 억제 (Retardation of Massive Spalling by Palladium Layer Addition to Surface Finish)

  • 이대현;정보묵;허주열
    • 대한금속재료학회지
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    • 제48권11호
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    • pp.1041-1046
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    • 2010
  • The reactions between a Sn-3.0Ag-0.5Cu solder alloy and electroless Ni/electroless Pd/immersion Au (ENEPIG) surface finishes with various Pd layer thicknesses (0, 0.05, 0.1, 0.2, $0.4{\mu}m$) were examined for the effect of the Pd layer on the massive spalling of the $(Cu,Ni)_6Sn_5$ layer during reflow at $235^{\circ}C$. The thin layer deposition of an electroless Pd (EP) between the electroless Ni ($7{\mu}m$) and immersion Au ($0.06{\mu}m$) plating on the Cu substrate significantly retarded the massive spalling of the $(Cu,Ni)_6Sn_5$ layer during reflow. Its retarding effect increased with an increasing EP layer thickness. When the EP layer was thin (${\leq}0.1{\mu}m$), the retardation of the massive spalling was attributed to a reduced growth rate of the $(Cu,Ni)_6Sn_5$ layer and thus to a lowered consumption rate of Cu in the bulk solder during reflow. However, when the EP layer was thick (${\geq}0.2{\mu}m$), the initially dissolved Pd atoms in the molten solder resettled as $(Pd,Ni)Sn_4$ precipitates near the solder/$(Cu,Ni)_6Sn_5$ interface with an increasing reflow time. Since the Pd resettlement requires a continuous Ni supply across the $(Cu,Ni)_6Sn_5$ layer from the Ni(P) substrate, it suppressed the formation of $(Ni,Cu)_3Sn_4$ at the $(Cu,Ni)_6Sn_5/Ni(P)$ interface and retarded the massive spalling of the $(Cu,Ni)_6Sn_5$ layer.

아말감의 구강내 부식 및 인공 부식에 관한 연구 (A STUDY ON IN VIVO AND IN VITRO AMALGAM CORROSION)

  • 임병목;권혁춘;엄정문
    • Restorative Dentistry and Endodontics
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    • 제22권1호
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    • pp.1-33
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    • 1997
  • The objective of this study was to analyze the in vitro and in vivo corrosion products of low and high copper amalgams. The four different types of amalgam alloy used in this study were Fine cut, Caulk spherical, Dispersalloy, and Tytin. After each amalgam alloy and Hg were triturated according to the directions of the manufacturer by means of the mechanical amalgamator(Amalgam mixer. Shinhung Co. Korea), the triturated mass was inserted into a cylindrical metal mold which was 12mm in diameter and 10mm in height. The mass was condensed by 150Kg/cm compressive force. The specimen was removed from the mold and aged at room temperature for about seven days. The standard surface preparation was routinely carried out by emery paper polishing under running water. In vitro amalgam specimens were potentiostatically polarized ten times in a normal saline solution at $37^{\circ}C$(potentiostat : HA-301. Hukuto Denko Corp. Japan). Each specimen was subjected to anodic polarization scan within the potential range -1700mV to+400mV(SCE). After corrosion tests, anodic polarization curves and corrosion potentials were obtained. The amount of component elements dissolved from amalgams into solution was measured three times by ICP AES(Inductive Coupled Plasma Atomic Emission Spectrometry: Plasma 40. Perkim Elmer Co. U.S.A.). The four different types of amalgam were filled in occlusal and buccal class I cavities of four human 3rd molars. After about five years the restorations were carefully removed after tooth extraction to preserve the structural details including the deteriorated margins. The occlusal surface, amalgam-tooth interface and the fractured surface of in vivo amalgam corrosion products were analyzed. In vivo and in vitro amalgam specimens were examined and analyzed metallographically by SEM(Scanning Electron Microscope: JSM 840. Jeol Co. Japan) and EDAX(Energy Dispersive Micro X-ray Analyser: JSM 840. Jeol Co. Japan). 1. The following results are obtained from in vitro corrosion tests. 1) Corrosion potentials of all amalgams became more noble after ten times passing through the in vitro corrosion test compared to first time. 2) After times through the test, released Cu concentration in saline solution was almost equal but highest in Fine cut. Ag and Hg ion concentration was highest in Caulk spherical and Sn was highest in Dispersalloy. 3) Analyses of surface corrosion products in vitro reveal the following results. a)The corroded surface of Caulk spherical has Na-Sn-Cl containing clusters of $5{\mu}m$ needle-like crystals and oval shapes of Sn-Cl phase, polyhedral Sn oxide phase. b)In Fine cut, there appeared to be a large Sn containing phase, surrounded by many Cu-Sn phases of $1{\mu}m$ granular shapes. c)Dispersalloy was covered by a thick reticular layer which contained Zn-Cl phase. d)In Tytin, a very thin, corroded layer had formed with irregularly growing Sn-Cl phases that looked like a stack of plates. 2. The following results are obtained by an analysis of in vivo amalgam corrosion products. 1) Occlusal surfaces of all amalgams were covered by thick amorphous layers containing Ca-P elements which were abraded by occlusal force. 2) In tooth-amalgam interface, Ca-P containing products were examined in all amalgams but were most clearly seen in low copper amalgams. 3) Sn oxide appeared as a polyhedral shape in internal space in Caulk spherical and Fine cut. 4) Apical pyramidal shaped Sn oxide and curved plate-like Sn-Cl phases resulted in Dispersalloy. 5) In Tytin, Sn oxide and Sn hydroxide were not seen but polyhedral Ag-Hg phase crystal appeared in internal space which assumed a ${\beta}_l$ phase.

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영남지역 출토 금제 귀걸이의 성분 조성에 따른 유형 분류와 금속 재료 특성 (Type Classification and Material Properties by the Composition of Components in Gold Earrings Excavated from the Yeongnam Region)

  • 전익환;강정무;이재성
    • 헤리티지:역사와 과학
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    • 제52권1호
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    • pp.4-21
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    • 2019
  • 영남지역에서 출토된 6~7세기 신라 금제 귀걸이 23점에 대한 성분 분석을 실시하고, 금판에 포함된 은(Ag) 함량을 기준으로 세 가지 유형으로 분류하였다. I 유형(20~50wt%), II 유형(10~20wt%), III 유형(10wt% 이하)으로 구분하였는데, I II 유형의 귀걸이 금판은 금(Au) 함량이 상대적으로 높은 부분에서 미세한 기공이 집중적으로 분포되는 현상이 관찰되었다. 금판 표면의 성분 차이 발생 원인을 네 가지로 구분하여 1) 표면 처리, 2) 제작 과정에서 열 확산, 3) 사금의 성분 차이, 4) 금의 정련 방법 측면에서 검토하였다. 금판 표면의 금 함량이 상대적으로 높은 부분에서는 미세한 기공이 집중적으로 관찰되며, 이와 관련하여 금 합금 표면에 의도적으로 금을 제외한 금속 성분을 제거하면서 금 함량을 높이는 고갈 도금(depletion gilding) 가능성을 제시하였다. 의도적인 표면 처리와 더불어 제작 과정에서 금판과 금속 봉 사이에 열 확산이 일어나 금판의 구리 함량이 높아진 사례를 세환이식의 분석 결과로 확인되었다. 금판의 재료적인 측면에서 살펴보면 금판에 포함된 은(Ag)이 자연금에 포함된 것인지, 합금에 의해 추가된 것인지를 국내에서 채취된 사금 분석을 통해 살펴보았다. 분석 결과 평균적으로 13wt% 정도의 은이 포함된 것으로 미루어 보아 II 유형은 자연금의 범주에 포함되고, III 유형은 정련 과정을 거친 금, I 유형은 자연금에 은이 합금된 것으로 보인다. 여기에서 III 유형의 경우 정련 과정을 거쳐 순수한 금을 만든 뒤 은을 합금했을 가능성에 대해 국내외 고대 문헌에 소개된 금 정련 방법을 조사하였다. 고대 정련 방법은 자연금에 포함된 은이 염화물 또는 황화물과 반응하여 결합됨으로써 제거되는 방법이었는데, 이러한 방법을 통해 순수한 금을 얻기 위해서는 장시간의 노력과 기술이 요구된다는 것이 밝혀졌다. 따라서 정련 과정을 통해 순금을 만든 후에 강도를 높이기 위해 소량의 은을 첨가했을 가능성은 낮아 보인다.

브레이징 온도 변화에 따른 $ZrO_2$와 Ti-6Al-4V의 접합 특성 (Brazing characteristics of $ZrO_2$ and Ti-6Al-4V brazed joints with increasing temperature)

  • 기세호;박상윤;허영구;정재필;김원중
    • 대한치과보철학회지
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    • 제50권3호
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    • pp.169-175
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    • 2012
  • 연구 목적: 온도 변화에 따른 $ZrO_2$와 Ti-6Al-4V의 접합 특성에 대해 알아보기 위하여 새로운 브레이징 합금을 제조하고, 브레이징 온도가 접합 특성에 미치는 영향에 대하여 조사하고자 하였다. 연구 재료 및 방법: 본 연구에서 사용된 시편으로는 실험용 $ZrO_2$ 모재(ZirBlank-PS, Acucera, Inc., Gyeonggi-do, Korea)는 소결 전의 블록형태($65mm{\times}36mm{\times}12mm(t)$)이며, 이를 잘라 사포(#2400)로 표면연마 후 소결하였다. 소결된 $ZrO_2$ 시편의 크기는 $3mm{\times}3mm{\times}3mm(t)$이다. Ti-6Al-4V 모재(Ti 6Al 4V ELI CG Bar, TMS, Washington, USA)는 직경 $10mm{\times}5mm(t)$를 사용하였다. 소결된 $ZrO_2$와 Ti-6Al-4V의 접합을 위하여 브레이징 합금을 제조하였다. 시편을 3군으로 나누어 A군은 $700^{\circ}C$에서, B군은 $750^{\circ}C$에서, C군은 $800^{\circ}C$에서 각각 브레이징 하였다. 브레이징 부의 두께와 결함율의 측정은 각 군당 하나의 시편으로 각 시편 당 5회씩 반복 측정하여 평균값을 취하였다. 결과: 브레이징 합금을 사용하여 진공 브레이징을 수행한 결과 $ZrO_2$ 와 Ti-6Al-4V 는 $700^{\circ}C-800^{\circ}C$에서 양호한 접합을 보였다. 브레이징 후 브레이징 온도 변화에 따른 브레이징 부의 두께 및 결함율의 변화는 SEM을 사용하여 측정하였다. 브레이징 온도가 $700^{\circ}C$에서 $800^{\circ}C$로 증가함에 따라 CuTi 금속간 화합물 층 및 Ti-Sn-Cu-Ag계 화합물 층의 두께는 각각 $4.5{\mu}m$에서 $10.3{\mu}m$로, $3.1{\mu}m$에서 $5.0{\mu}m$로 증가되었다. 또한 브레이징 온도가 $700^{\circ}C$에서 $800^{\circ}C$로 증가함에 따라 브레이징 접합계면의 결함율은 $ZrO_2$ 및 Ti-6Al-4V 계면에서 각각 25%에서 16.3%, 5%에서 1.5%로 감소되었다. 결론: 브레이징 온도가 $700^{\circ}C$에서 $800^{\circ}C$로 증가됨에 따라, 브레이징 접합계면의 결함율은 $ZrO_2$ 및 Ti-6Al-4V 계면에서 모두 감소되었다. 이는 결함부에서 $ZrO_2$와 활성원소인 Ti과의 반응이 충분히 일어나지 않아서 브레이징 합금이 $ZrO_2$에 웨팅되지 않은 것이 원인이라고 사료된다.

저온소결용 (Ba, Sr)$TiO_3$-Glass계 세라믹스의 유전특성 (Dielectric properties of low temperature firing glass reacted (Ba, Sr)$TiO_3$$ ceramic capacitors)

  • 구자원;설용건;최승철
    • 한국재료학회지
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    • 제5권2호
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    • pp.151-156
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    • 1995
  • $(Ba, Sr)TiO_{3}$계에 저융점의 Glass물질을 첨가하여 저온소결이 가능하며, 고유전율을 갖는 유전체 재료를 제조하여, 그 특성을 조사하였다. 본 연구에서는 고유전율의 $(Ba, Sr)TiO_{3}$계에 PbO함량이 서로 다른 Glass물질을 첨가하여 조성변화에 따른 저온소결거동 및 유전특성을 조사하였으며, 적층형 세라믹 Capacitor(MLCC)에 응용하기 위하여 다양한 조성으로 제조하였다. $PbO-ZnO-B_{2}O_{2}$계 Glass 성분을 첨가하여 소결온도를 $1350^{\circ}C$에서 $1050^{\circ}C$까지 낮출수 있었으며, 4wt% glass 첨가로 $1150^{\circ}C$ 이하에서 2시간 소결한 저온소결용 재료는 실온에서 8000정도의 높은 비유전율과 0.005의 낮은 유전손실 그리고 광역온도범위에서 유전상수의 안정성을 가진 우수한 특성을 나타내며, 입자크기가 1~3 $\mu$m 정도로 치밀한 미세구조를 가지고 있다. 본 연구의 저온소결용 유전체 재료는 Z5U 규격을 만족시키고 기존의 $BaTiO_{3}$계 재료에 비해 낮은 소결온도를 가지므로 MLCC에 응용시 내부전극으로 Ag-Pd alloy 사용이 가능한 것으로 밝혀졌다.

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