• 제목/요약/키워드: Accelerated lifetime

검색결과 201건 처리시간 0.024초

내부고장요인과 외부고장요인이 있는 제품에 대한 가속수명 시험의 분석 (Analysis of Accelerated Life Tests with Intrinsic and Extrinsic Failure Modes)

  • Kim, C. M.;D. S, Bai
    • 한국경영과학회:학술대회논문집
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    • 대한산업공학회/한국경영과학회 2000년도 춘계공동학술대회 논문집
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    • pp.381-384
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    • 2000
  • This paper proposes a method of estimating the lifetime distribution at use condition for constant stress accelerated lift tests when extrinsic failure mode as well as intrinsic one exists. A mixture of two log-normal distributions is introduced to describe these failure modes and it is assumed that a linear relation exists between the location parameter and stress. An estimation procedure using the expectation and maximization algorithm is proposed and a numerical example is given.

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Point and interval estimation for a simple step-stress model with Type-I censored data from geometric distribution

  • Arefi, Ahmad;Razmkhah, Mostafa
    • Communications for Statistical Applications and Methods
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    • 제24권1호
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    • pp.29-41
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    • 2017
  • The estimation problem of expected time to failure of units is studied in a discrete set up. A simple step-stress accelerated life testing is considered with a Type-I censored sample from geometric distribution that is a commonly used distribution to model the lifetime of a device in discrete case. Maximum likelihood estimators as well as the associated distributions are derived. Exact, approximate and bootstrap approaches construct confidence intervals that are compared via a simulation study. Optimal confidence intervals are suggested in view of the expected width and coverage probability criteria. An illustrative example is also presented to explain the results of the paper. Finally, some conclusions are stated.

고출력 조명용 White LED의 수명예측 (Lifetime Estimation of High Power White LED for Lighting Use)

  • 이명훈;신승중;곽계달
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2008년도 추계학술대회A
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    • pp.1343-1348
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    • 2008
  • LEDs which have many merits are widely used in the field of light devices, and have rapidly replaced old light devices such as incandescent or fluorescent lamps. Long life, on the order of 50,000 to 100,000 hours, is one of the key features of light emitting diodes(LEDs) that has attracted the lighting community to this technology. High Power white LEDs have yet to demonstrate this capability. This paper planed accelerated life test that has two factor(temperature, current) and two levels. Finally, using ALTA programs, we estimated the common shape parameter of Weibull distribution, life-stress relationship, B10 life and accelerating factors.

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자동차용 Halogen Lamp 의 수명 예측 (Lifetime Estimation of an Automotive Halogen Lamp)

  • 김충식;신승중;곽계달
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2008년도 추계학술대회A
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    • pp.1259-1264
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    • 2008
  • This paper presents an accelerated life test for burn out of tungsten filament of automotive halogen lamp. There are many failure modes and failure factors that associated with tungsten filament. But in this explain the dominant failure mode of tungsten filament is the bumout of the filament failure. At first, over voltage, high temperature, inrush current and vibration are selected as stress factors by using of two stage Quality Function Deploymeng(QFD). And we planed accelerated life test that has one factor(voltage) and three levels. By experiment it has absorbed that over voltage has an effect on the life of halogen lamp. Using ALTA programs, we estimated the common shpae parament of Weibull distribution, life-stress relationship and $B_{100p}$ life.

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환경 온도변화에 대한 자동차용 엔진마운트의 수명 예측 (Lifetime prediction of the engine mount about the environment temperature variation)

  • 김형민;위신환;윤신일;신익재;김규로
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제13권1호
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    • pp.65-76
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    • 2013
  • In order to assess the reliability of engine mount for a vehicles, life test model and procedure are developed. By using this method, failure mechanism and life distribution are analyzed. The main results are as follows; i) the main failure mechanism is degradation failure of engine mount rubber by fatigue failure at dynamic load. ii) temperature is a second factor to affect a failure. iii) the life distribution of engine mount module is fitted well to Weibull life distribution and the shape parameter is 18.4 and the accelerated life model of that is fitted well to Arrhenius model.

미세변동공정관리를 위한 가속수명시험관리도 설계 (Design of ALT Control Chart for Small Process Variation)

  • 김종걸;엄상준
    • 대한안전경영과학회지
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    • 제14권3호
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    • pp.167-174
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    • 2012
  • In the manufacturing process the most widely used $\bar{X}$ chart has been applied to control the process mean. Also, Accelerated Life Test(ALT) is commonly used for efficient assurance of product life in development phases, which can be applied in production reliability acceptance test. When life data has lognormal distribution, through censored ALT design so that censored ALT data has asymptotic normal distribution, $ALT\bar{X}$ control chart integrating $\bar{X}$ chart and ALT procedure could be applied to control the mean of process in the manufacturing process. In the situation that process variation is controlled, $Z_p$ control chart is an effective method for the very small fraction nonconforming of quality characteristic. A simultaneous control scheme with $ALT\bar{X}$ control chart and $Z_p$ control chart is designed for the very small fraction nonconforming of product lifetime.

국산 고체 알루미늄 전해 커패시터의 가속수명시험 개발 및 국외 선진업체 제품과의 특성 비교 (Development of Accelerated Life Tests for Solid Aluminum Electrolyte Capacitor Made by Domestic Manufacturing Company and Comparison of Characteristics between Domestic Products and Foreign Advanced Products)

  • 박정원;이중휘
    • 한국신뢰성학회지:신뢰성응용연구
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    • 제2권1호
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    • pp.1-14
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    • 2002
  • High temperature operating test, temperature humidity test and temperature cycling were performed at various test levels for solid aluminum electrolyte capacitors made by domestic manufacturing company and foreign advanced manufacturing company. It was found that main failure mode of solid aluminum electrolyte capacitors was the decrease of their capacitances. The decrease of their capacitances has the same pattern in these tests. Test result for comparison of characteristics between domestic products and foreign advanced products shows that domestic products have the shorter lifetime and their capacitances decrease more rapidly in high temperature operating test and temperature humidity test. Also in these tests, accelerated tests for high temperature operating test and temperature humidity test were developed.

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대수정규분포와 간헐적 검사하에서 가속수명시험방식의 설계 (Design of Accelerated Life Test Plans for the Lognormal Failure Distribution under Intermittent Inspection)

  • 서순근;조호성
    • 품질경영학회지
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    • 제24권2호
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    • pp.25-43
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    • 1996
  • This paper presents the optimal and practical constant-stress accelerated life test plans for the lognormal lifetime distribution tinder assumptions of intermittent inspection and Type-I censoring. In an optimal plan, the low stress level and the proportions of test units allocated at each stress are determined under given inspection scheme and number of inspections such that the asymptotic variance of the maximum likelihood estimator of a certain quantile at use condition is minimized. Although the practical plan adopts the same design criterion, it involves three rather than two overstress levels in order to compromise the practical deficiencies of the optimal plan. Computational experiments are conducted to choose an allocation plan and a inspection scheme of the practical plan and to compare with test plans over a range of parameter values.

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Tan Delta 측정을 이용한 유침 절연지의 열화특성 분석 (Analysis of Degradation Characteristics for Oil-Paper Insulation using Tan Delta Measurement)

  • 김정태;김우빈
    • 전기학회논문지
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    • 제65권9호
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    • pp.1518-1523
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    • 2016
  • In this study, in order to understand the degradation characteristics of oil-paper insulation for power transformers and OF cables, tan delta was measured using cable model specimens with long-term accelerated thermal and electrical aging. In addition, to find out the degradation level due to the accelerated aging, tensile strengths of aged papers were measured. As a result, tan ${\delta}$ showed the characteristics of slight decrease at the first stage and then increase with the aging time, which could be analyzed due to the evaporation of remaining moisture and the change of aging rate with time. Also, the trend of tensile strengths with aging temperature and time was appeared to be exponentially decreased and by use of these data equivalent calculated lifetimes and accelerated aging factors were derived for each aging temperatures. After then, tan ${\delta}$ was analyzed with the equivalent operating years. For all different aging temperatures, the aged data were very well fit to the equivalent operating years and it is shown that tan ${\delta}$ was increased with the decrease of tensile strength.

Necessity of step-stress accelerated life testing experiment at higher steps

  • Chandra, N.;Khan, Mashroor Ahmad;Pandey, M.
    • International Journal of Reliability and Applications
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    • 제15권2호
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    • pp.85-98
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    • 2014
  • Accelerated life testing (ALT) is a well famous technique in life testing and reliability studies, this is particularly used to induce so high stress leading to failure of the highly reliable units quickly under stipulated duration of time. The step-stress ALT is one of the systematic experimental strategy of ALT applied to fail the units in steps. In this article we focus on two important issues (i) necessity of life tests at higher steps with relevant causes (ii) to develop a new optimum test plan for 3-step SSALT under the modified cumulative exposure model proposed by Khamis and Higgins (1998). It is assumed that the lifetime of test units follows Rayleigh distribution and its scale parameter at constant stress level is assumed to be a log-linear function of the stress. The maximum likelihood estimates of the parameters involved in the step-stress ALT model are obtained. A simulation study is performed for numerical investigation of the proposed new optimum plan 3-step, step-stress ALT. The necessity of the life test units at 3-step step-stress is also numerically examined in comparison to simple step-stress setup.

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