• Title/Summary/Keyword: Accelerated Testing

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Predicting Shelf-life of Ice Cream by Accelerated Conditions

  • Park, Jung-Min;Koh, Jong-Ho;Kim, Jin-Man
    • Food Science of Animal Resources
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    • v.38 no.6
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    • pp.1216-1225
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    • 2018
  • Shelf-life is defined as the amount of time during which a food product retains its desired sensory, chemical, and physical characteristics while remaining safe for consumption. The food industry needs to rapidly obtain the necessary information for determining the shelf life of its products. Here we studied the approaches available for conducting accelerated shelf-life tests. Accelerated shelf-life testing is applied to a variety of products to rapidly estimate change in characteristics with time. The aim of this work was to use accelerated shelf-life testing to study the changes in pH, microbiology, and sensory characteristics of ice cream by the application of a kinetic approach and, based on the observations, to estimate its shelf life. As per the current law, there is no shelf life on ice cream. Our results suggest that the shelf life of an ice cream sample was 24.27 months at $-18^{\circ}C$, 2.29 months at $-6^{\circ}C$, 0.39 months at $-1^{\circ}C$, and 0.15 months at $4^{\circ}C$. Results of this study suggest that a set expiration date on ice cream might also contribute to effective management of ice cream characteristics in the retail chilled chain.

Applying a Forced Censoring Technique with Accelerated Modeling for Improving Estimation of Extremely Small Percentiles of Strengths

  • Chen Weiwei;Leon Ramon V.;Young Timothy M.;Guess Frank M.
    • International Journal of Reliability and Applications
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    • v.7 no.1
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    • pp.27-39
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    • 2006
  • Many real world cases in material failure analysis do not follow perfectly the normal distribution. Forcing of the normality assumption may lead to inaccurate predictions and poor product quality. We examine the failure process of the internal bond (IB or tensile strength) of medium density fiberboard (MDF). We propose a forced censoring technique that closer fits the lower tails of strength distributions and better estimates extremely smaller percentiles, which may be valuable to continuous quality improvement initiatives. Further analyses are performed to build an accelerated common-shaped Weibull model for different product types using the $JMP^{(R)}$ Survival and Reliability platform. In this paper, a forced censoring technique is implemented for the first time as a software module, using $JMP^{(R)}$ Scripting Language (JSL) to expedite data processing, which is crucial for real-time manufacturing settings. Also, we use JSL to automate the task of fitting an accelerated Weibull model and testing model homogeneity in the shape parameter. Finally, a package script is written to readily provide field engineers customized reporting for model visualization, parameter estimation, and percentile forecasting. Our approach may be more accurate for product conformance evaluation, plus help reduce the cost of destructive testing and data management due to reduced frequency of testing. It may also be valuable for preventing field failure and improved product safety even when destructive testing is not reduced by yielding higher precision intervals at the same confidence level.

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Fatigue Life Estimation of Shot Peened Metal Using Accelerated Life Testing (가속수명시험법을 이용한 쇼트피닝가공 금속의 피로수명예측)

  • Kang, Jin-Shik;Nam, Ji-Hun;Lee, Jae-Heon;Cheong, Seong-Kyun
    • Proceedings of the KSME Conference
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    • 2004.11a
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    • pp.184-189
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    • 2004
  • Shot peening process is used as one of the various kinds of techniques to improve the fatigue properties. However, to obtain fatigue properties of metal materials, many efforts and time are needed. Because the fatigue life of shot peened metals increases highly. In this paper, fatigue properties of shot peened Al 7075-T6 are estimated using the fundamental of accelerated life test to reduce the experimental. Experimental results show that the estimated life data almost agree with actual rotary bending fatigue test data within 7% error.

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The Study based on Accelerated Life Testing of 4W LED Lamp using internal converter (4W 컨버터 내장형 Lamp의 가속시험평가)

  • Park, Chang-Kyu;Cho, Sang-Muk;Kim, Jin-Sheon
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 2009.10a
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    • pp.77-79
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    • 2009
  • The paper is to evaluate for reliability of 4W LED Lamp using internal converter by ALTs(Accelerated Life Tests). The recently, some of KS were established by law of LED Modules for Lighting(KS C 7651, 7652, 7653, 7655, 7656, 7657, 7658 and 7659), but reliability assessment methods of LED Lamps had not been established. Therefore, the paper aided companies to perform accelerated life testing(temperature 60 $^{\circ}C$, humidity 90 %) for themselves.

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S-N Curve Estimation of a KTX Structure for an Accelerated Life Testing (가속수명시험을 위한 KTX 구조물의 S-N 선도 추정)

  • Jung, Dal-Woo;Choi, Nak-Sam;Park, Su-Han
    • Proceedings of the KSME Conference
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    • 2008.11a
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    • pp.384-389
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    • 2008
  • An accelerated fatigue test is essentially required to maintain the reliability of the actual structure of KTX under operation conditions. However, actual fatigue life cannot be obtained if specimens are not adequate to the conventional fatigue test. Moreover component maker did not provide data of loading stress (S) - cycles at the failure (N). In this study, we suggest a prediction method of the S-N curve for establishing an accelerating test under various load levels. Load history was acquired from the field tests. A Rainflow method was used on the cycle counting of the field load data, and then, an S-N curve was obtained through the iteration process under the condition that the damage index satisfies to 1 in the Miner's rule.

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The best accelerated method and lifetime prediction of electrolytic capacitors (전해 캐패시터의 최적 가속시험방법과 수명예측)

  • Kim, Ha-Na;Sim, Chan-Ho;Kim, Sung-Jun;Yoon, Jung-Rag;Lee, Hun-Yong
    • Proceedings of the KIEE Conference
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    • 2005.07c
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    • pp.1945-1947
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    • 2005
  • This study considers find out best accelerated life testing and lifetime prediction of electrolytic capacitors. We proved about relation between failure and deterioration mechanism from last thesis. Beside we performed test that temperature and voltage press higher than allowance specification. Failure distribution acquired from those test. And wiebull function and Minitab program applied to accelerated constant and lifetime by means of calculation. At the result, goodness of fit affect to weibull function and acceleration factor therefore fitting is important factor in reliability testing.

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Accelerated Life Test and Data Analysis of the Silver Through Hole Printed Wiring Board (가속수명시험을 이용한 은도통홀 인쇄회로기판의 신뢰성연구)

  • 전영호;권이장
    • Journal of Korean Society for Quality Management
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    • v.25 no.2
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    • pp.15-27
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    • 1997
  • This paper describes a highly accelerated life test (HALT, USPCBT) method for rapid qualification testing of STH PWB(Silver Through Hole Printed Wiring Boards). This method was carried out to be an alternative to the present time-consuming standard 1344 hours life testing(THB). The accelerated life test conditions were $121^{\circ}C$/95%R.H. at 50V bias and without bias. Their results are compared with those observed in the standard 1344 hours life test at $40^{\circ}C$/95%R.H. at 50V bias and without bias. The studies were focused on the samples time-to-failure as well as the associated conduction and failure mechanisms. The abrupt drop of insulation resistance is due to the absorption of water vapour. And the continuous drop of insulation resistance is due to the Ag migration. The ratios of time-to-failure of HALT(USPCBT) to THB were 25 and 11 at 50V bias and without bias respectively.

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Mechanical Life Prediction of a Relay by Accelerated Life Tests (가속시험에 의한 릴레이의 기계적 수명평가에 관한 연구)

  • Kwon Young-Il;Han In-Su
    • Proceedings of the Korean Reliability Society Conference
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    • 2005.06a
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    • pp.75-82
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    • 2005
  • In this paper, accelerated life testing(ALT) method and procedures for a are developed and applied to assess the reliability of the product. Relay is a device that can open and close the electric circuit electrically and is used for protecting and controlling the load. In this study, an accelerated life test method for predicting the mechanical life of a relay is developed using the relationship between stresses, failure mechanism and life characteristics of products. Using the ALT method, we performed life tests and analyzed the tests results. The proposed method and procedures may de extended and applied to testing similar kinds of products to reduce test times and costs of the tests remarkably.

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Accelerated life testing of concrete based on stochastic approach and assessment

  • Zhu, Binrong;Qiao, Hongxia;Feng, Qiong;Lu, Chenggong
    • Computers and Concrete
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    • v.19 no.1
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    • pp.111-120
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    • 2017
  • This study aimed to design the accelerated life testing (ALT) of concrete, which stimulating the special natural environment maximumly. Its evaluation indexes, such as dynamic elastic modulus, mass and ultrasonic velocity were measured, and the variation of relative mass and relative dynamic elastic modulus of concrete were studied. Meanwhile, the microanalysis method was used. Moreover, an exploratory application of the stochastic approach, the Weibull distribution and the lognormal distribution, were made to assess the durability of concrete structures. The results show that the ALT for simulating natural environment is more close to the service process of concrete structure under actual conditions; The relative dynamic elastic modulus can be used as the dominant durability evaluation parameters, because it is more sensitive to the environmental factors compared with the relative quality evaluation parameters; In the course of the concrete deterioration, the destruction of the salt freezing cycle is the dominant factor, supplemented by other factors; Both of those two stochastic approaches can be used to evaluate the reliability of concrete specimens under the condition of ALT; By comparison, The lognormal distribution method is better to describe the reliability process.