• 한국신뢰성학회지:신뢰성응용연구
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• 제9권1호
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• pp.37-45
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• 2009

Recently mechanical watt-hour meters are being replaced by electronic watt-hour meters. The replacement period of mechanical watt-hour meters is 7 years. This period is based on long term historical data. The replacement period of electronic watt-meters is also 7 years. This period is determined using the replacement period of mechanical watt-hour meters. However lifetime of mechanical watt-hour meters is different from the lifetime of electronic meters. In order to determine desirable replacement period of electronic watt-hour meters, accelerated life tests of major components in electronic watt-hour meters were performed. The test results showed that LCD was the component which had the shortest lifetime. In this paper, lifetime of electronic watt-hour meters manufactured by 3 company was estimated and life test standard for LCD was developed.

• 연구논문집
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• 통권34호
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• pp.79-85
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• 2004

There are several types of life test method for hose assemblies. The two major tests used for hose assemblies are impulse test and burst test. And magnification adjustment of impulse pressure, heating of testing oil and repetitive motions of bending and straightening of testing hose are also performed for accelerating the life. According to the manufacture process of hose and swaging process of fitting, there is a difference in the life of hose assemblies from minimum 7 times to maximum 40 times during the life test in the same functioning condition. Like this, the life test of hose which has a wide scope of life distribution gives a problem that observation should take a long time to find out the existence of the bursting from the beginning of the test to the completion of bursting of hose assemblies. Therefore, this research proposes a process of concentrating on the defective section of hose assemblies and maximizing the life acceleration by giving 'Knockdown stress' to hose assemblies just until before the hose assemblies get out of order.

• 한국전기전자재료학회논문지
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• 제16권9호
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• pp.783-789
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• 2003

The winding problems of traction motor are the major determinant of motor's life. The root cause of winding failure is gradual deterioration of the insulation due to thermal, electrical, mechanical and environmental stresses. The aging of the insulation reduces the electrical and mechanical strength of the insulation. At same point, a voltage surge or mechanical shock from a traction motor start will fracture or break down the insulation. To achieve the expected life usually requires extensive laboratory evaluation of the insulation systems and the use of accelerated aging tests. There are several nondestructive test available for checking, the condition of motor insulation, the probable extent of aging, and the rate of which aging is taking place. So the insulation characteristics of stator coil were each analyzed by measurement of dielectric loss(tan$\sigma$), capacitance and partial discharge. The method of diagnosis is able to analyze the insulation condition and evaluate the life of the traction motor.

• 한국경영과학회:학술대회논문집
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• 대한산업공학회/한국경영과학회 2000년도 춘계공동학술대회 논문집
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• pp.381-384
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• 2000

This paper proposes a method of estimating the lifetime distribution at use condition for constant stress accelerated lift tests when extrinsic failure mode as well as intrinsic one exists. A mixture of two log-normal distributions is introduced to describe these failure modes and it is assumed that a linear relation exists between the location parameter and stress. An estimation procedure using the expectation and maximization algorithm is proposed and a numerical example is given.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2005년도 제36회 하계학술대회 논문집 A
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• pp.377-380
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• 2005

In this paper, accelerated stress test(AST) for Magnetic Switch (MS) are applied to assure specified reliability of the products. Magnetic contactor that functions with over-current relay is called MS. Magnetic contactor closes and opens the motor load with ON/OFF switch of electronic contactor. It is also used for protecting and controlling the load. Magnetic contactor detects the over-current flow in the load with a over-current relay and disconnects the load by opening its control power. In this study, AST for product assembly are developed in order to improve the weak point so that increase the product reliability. Also we will show the basic information for the accelerated life test(ALT). The proposed AST results and procedures may be extended and applied to testing similar kinds of products to reduce test times and costs of the tests remarkably. Finally the results of this study will contribute to improving reliability of products and strengthening competitiveness of our products in the world markets.

• 대한기계학회논문집A
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• 제34권4호
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• pp.467-474
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• 2010

용접이음부의 신뢰성 확보는 구조물의 건전성과 내구성에 직접적인 영향을 미치기 때문에 가스용접 이음재의 피로설계기준(fatigue design criterion)을 정하기 위해서는 피로시험을 수행하여 ${\Delta}P$-Nf 관계를 이용하는 것이 일반적이다. 그러나 피로데이터를 장시간 획득하는 과정에서 여러 가지 변동인자에 의해서 피로데이터가 영향을 받기 때문에 피로데이터의 신뢰도가 떨어진다. 또한, 이음재의 재질 및 접합형태가 달라질 때마다, 각각의 경우에 대해서 새로운 피로시험이 요구됨으로 많은 시간과 비용이 소모된다. 따라서 이러한 문제점들을 개선하고 신뢰성 있는 설계를 하기 위해서 필렛 가스용접 이음재를 적용, 반복피로시험을 통한 데이터를 통계적으로 분석하여, 다양한 가스용접 이음재의 피로수명을 예측함과 동시에 실제 피로시험데이터와 비교 분석하여 예측된 수명의 신뢰도(reliability)와 신뢰구간(confidence interval)을 추정함으로서 새로운 피로설계기준 방법을 제시하고자 하였다.

• 한국군사과학기술학회지
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• 제13권2호
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• pp.336-341
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• 2010

The burning interruption between the initiator and the delay column in a Zr-Ni K1 delay system used for a K510 fuze occurs with long-time storage. About 10 % failure probability of 15-years stored delay systems shows the failure mode in open literature. This paper shows storage lifetime improvement results for the delay system through changing the single-base delay column into double-base ones and controlling the manufacturing processes especially the initial inclusion of humidity. The double-base delay columns was implemented by inserting one delay column of fast burning rates between the initiator and the previous delay column of slow burning rates. Accelerated aging tests of the delay systems with double-base columns, and then the firing tests were performed to evaluate the improved lifetime. The double-base delay columns shows improved storage lifetime of the delay system through preventing the failure mode.

• 한국지진공학회논문집
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• 제17권3호
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• pp.117-125
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• 2013

Seismic isolation has been considered and utilized in various industries as a way to prevent huge damage on to structures by large earthquakes in various industries. The laminated Laminated rubber bearings is are most frequently used in seismic isolation systems. The structural Structural safety could not be assured unless the performance of the rubber bearing is not guaranteed for the life time of the structure under the consideration that the bearing is a critical structural member to sustain vertical loads in the seismically isolated structure. However, there are few studies on the deterioration problems of rubber bearings during their service life. The long term performance of the rubber bearings was not considered in past designs of seismically isolated structures. This study evaluates the long term performance and creep characteristics of laminated natural rubber bearings that are used in seismically isolated buildings. For the this study, a set of accelerated thermal aging tests and creep tests are were performed on real specimens. The experimental results show that the natural rubber bearings would have a stable change rate of change for durability under severe environmental conditions for a long time.

• 한국신뢰성학회:학술대회논문집
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• 한국신뢰성학회 2004년도 정기학술대회
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• pp.239-246
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• 2004

가속열화시험은 가속수명시험시에 고장 개수가 적거나 심지어 고장이 발생하지 않는 경우에도 부품의 신뢰성을 평가할 수 있는 유용한 수단이 되고 있다. 본 연구에서는, 능동소자로 높은 유전용량을 갖는 적층 세라믹 콘덴서(X7R -55$^{\circ}C$~1$25^{\circ}C$)에 대한 가속열화시험을 실시하고, 정격온도의 최대치에서 다른 배율의 전압을 인가하여 단순선형회귀에 의한 특성치의 경시변화를 설명한다고 가정하였다. 최소제곱법을 적용하여 시료가 대수정규분포를 따를 때의 열화량을 설명한 후, 특성치-시간간의 선형관계 및 대수정규분포의 독립성을 검정하여 가정의 적절성을 검정하였다. 마지막으로 아이링모델에 의한 평균수명을 평가하였다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.1
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• pp.13-16
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• 2004

The reliability of 1.550m-wavelength InGaAs mesa waveguide photodiodes(WGPDs), which developed for 40-Gbps optical receiver applications, fabricated by metal organic chemical vapor deposition is investigated. Reliability is examined by both high-temperature storage tests and the accelerated life tests by monitoring dark current and breakdown voltage. The median device lifetime and the activation energy of the degradation mechanism are computed for WGPD test structures. From the accelerated life test results, the activation energy of the degradation mechanism and median lifetime of these devices in room temperature are extracted from the log-normal failure model by using average lifetime and the standard deviation of that lifetime in each test temperature. It is found that the WGPD structure yields devices with the median lifetime of much longer than $10^6$ h at practical use conditions. Consequently, this WGPD structure has sufficient characteristics for practical 40-Gbps optical receiver modules.