• Journal of the Korean Society for Precision Engineering
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• v.33 no.10
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• pp.829-835
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• 2016

Electro-Mechanical Actuator installed on the aircraft plays a key role in an aircraft's flight control through flight control computer. Reliable prediction of the actuator is important for the aircraft. To estimate the lifetime of a product, it is necessary to test full target life. However, it is very difficult to perform it due to the long life time of actuator but short period of development time with increasing cost. Therefore, accelerated life test has been used to reduce the test time for various reasons such as reducing product's development cycle and cost. In this paper, to predict the lifetime of the actuator, we analyzed the flight profile of aircraft and adapted the method of accelerated life test in order to accelerate failure modes that might occur under user conditions. We also set up an endurance test equipment for validating the demanded lifetime of an actuator and performed accelerated life test.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.19 no.8
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• pp.239-245
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• 2018

The importance of reliability in the development of weapons systems and reliability tests has been emphasized recently. Therefore, this study evaluated a reliability test design method of a bladder type accumulator and proposed a process for reliability test design. To design the reliability test of the accumulator, the main failure modes and failure mechanisms were investigated, and the main stress factors were analyzed to select the appropriate acceleration model. A steady - state reliability test was designed according to the number of samples, and the reliability level and accelerated life test time were calculated according to the acceleration factor computed using the selected acceleration model.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.28 no.8
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• pp.501-507
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• 2015

In this paper, EPR (ethylene propylene rubber) insulation material was accelerated degradation test at $121^{\circ}C$, $136^{\circ}C$, $151^{\circ}C$, and experiment the typical EAB (elongation at break) at mechanical characteristics analysis. It is shown that the failure-time at the point of 50% of the initial value of Elongation rate to obtain the activation energy. The failure-time was shown each 5,219 hr, 3,165 hr, and 668 hr at three temperatures. In order to derive the activation energy, Arrhenius methodology was applied. Also, we got the Arrhenius plot from three accelerated temperatures. The activation energy values got 0.98 eV from EAB test. The experimental data were evaluated for estimating the probability density, and the suitable distribution by using statistical program MINITAB. It is shown that EAB data by the acceleration thermal degradation is most suitable for the Weibull distribution.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.29 no.6
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• pp.270-275
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• 2019

Mica capacitor is being adopted for high voltage firing unit of guided weapon system because of its superior impact enduring property relative to ceramic capacitor. Reliability of localized mica high voltage capacitors was verified through environmental test like terminal strength test, humidity test, thermal shock test and accelerated life test for application to high voltage firing unit. Failure mode of mica capacitor is a decrease of insulation resistance and its final dielectric breakdown. Main constants of accelerated life model were derived experimentally and voltage constant and activation energy were 5.28 and 0.805 eV respectively. Lifetime of mica capacitor at normal use condition was calculated to be 38.5 years by acceleration factor, 496, and lifetime at accelerated condition and this long lifetime confirmed that mica high voltage capacitor could be applied for firing unit.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.17 no.8
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• pp.62-68
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• 2016

The feeder cable assembly is an automotive part used for telecommunication. If it malfunctions, the control and safety of the automobile can be put at risk. ALT (Accelerated Life Testing) is a testing process for products in which they are subjected to conditions (stress, strain, temperatures, etc.) in excess of their normal service parameters in an attempt to uncover faults and potential modes of failure in a short amount of time. Failure is caused by defects in the design, process, quality, or application of the part, and these defects are the underlying causes of failure or which initiate a process leading to failure. Thermal shock occurs when a thermal gradient causes different parts of an object to expand by different amounts. Thermal shock testing is performed to determine the ability of parts and components to withstand sudden changes in temperature. In this research, the main causes of failure of the feeder cable assembly were snapping, shorting and electro-pressure resistance failure. Using the Coffin-Manson model for ALT, the normal conditions were from Tmax = $80^{\circ}C$ to Tmin = $-40^{\circ}C$, the accelerated testing conditions were from Tmax = $120^{\circ}C$ to Tmin = $-60^{\circ}C$, the AF (Acceleration Factor) was 2.25 and the testing time was reduced from 1,000 cycles to 444 cycles. Using the Bxlife test, the number of samples was 5, the required life was B0.04%.10years, in the acceleration condition, 747 cycles were obtained. After the thermal shock test under different conditions, the feeder cable assembly was examined by a network analyzer and compared with the Weibull distribution modulus parameter. The results obtained showed good results in acceleration life test mode. For the same reliability rate, the testing time was decreased by a quarter using ALT.

• Proceedings of the Korean Reliability Society Conference
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• 2001.06a
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• pp.337-337
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• 2001

High voltage ceramic capacitors are widely applied in power electronic circuits, such as filters, snubbers, and resonant circuits, due to their excellent features of high voltage endurance and low aging. This paper presents a result of failure analysis and reliability evaluation for high voltage ceramic capacitors. The failure nodes and failure mechanisms were identified in order to understand the failure physics in a component. The causes of failure mechanisms for zero resistance phenomena under withstanding voltage test in high voltage ceramic capacitors molded by epoxy resin were studied by establishing an effective closed-loop failure analysis. Also, the condition for dielectric breakdown was investigated. Particular emphasis was placed on breakdown phenomena at the ceramic-epoxy interface. The validity of the results in this study was confirmed by the results of accelerated testing. Thermal shock test as well as pressure cooker test for high voltage ceramic capacitor mounted on a magnetron were implemented. Delamination between ceramic and epoxy, which, might cause electrical short in underlying circuitry, can occur during curing or thermal cycling. The results can be conveniently used to quickly identify defective lots, determine mean time to failure (MTTF) of each lot at the level of Inspection, and detect major changes in the vendors processes.

• The Korean Journal of Applied Statistics
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• v.32 no.4
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• pp.503-515
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• 2019

In this study we estimate the survival function of duration of the legislative processes in the 17th, 18th, and 19th National Assembly of Korea, and further analyze effects of the political situation variables on the legislative process. We define the termination of legislative process from a novel perspective to alleviate issues of dependency between censoring and failure in the data. We also show that the proportional hazards assumption does not hold for the data, and analyze data employing a log-normal accelerated failure time model. The policy areas of law agendas are shown to affect the speed of legislative process in different ways and legislative process tends to be prompt in times of divided governments.

• Journal of Applied Reliability
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• v.4 no.2
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• pp.73-90
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• 2004

We performed the heat aging test to predict the useful lifetime of Elastomeric Bearing Chloroprene Rubber (CR) used for supporting bridge. During the test, we measured elongation that are influenced by temperature and aging time. The failure of a test piece is defined as the point at which the elongation reaches to 75% of the initial value. This failure criterion is based on KS F 4420: 1998 (Elastomeric Bearing for bridge). Through the accelerated heat aging test, we found that the Arrhenius relationship and the Weibull lifetime distribution are appropriate as the life-temperature relationship and lifetime distribution of the CR, respectively. Using the Arrhenius -Weibull model, the parameters of the model are estimated and the lifetime of the CR at use condition is predicted.

• Journal of the Korean Society for Railway
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• v.9 no.6 s.37
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• pp.732-738
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• 2006

This research provides a scheme for Highly Accelerated Stress Test that is necessary to demonstrate reliability prediction of Korean Rapid Transit Railway Train Control System sub-equipment, which is calculated by a relevant standard for failure rate prediction of electronic products. Although determining failure information generated in the process of trial running by statistic analysis is widely accepted as a measure of confirmation for reliability prediction, this research suggests the modeling for System Life Test determined by accelerating stress factors as a measure of confirmation for reliability prediction of sub-equipment unit that is generated ahead of a trial running in System Life Cycle. Consequently, the research demonstrates sub-equipment unit reliability test, which is based on the model derived from Accelerated Stress Test, according to accuracy level and the number of samples, and conducts an official experiment by making out a reliability test procedure sheet based on test time as well.

• Journal of the Korean Society of Safety
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• v.29 no.1
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• pp.7-14
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• 2014

Inverter module, which feeds the converted power to the traction motor for EMU. Consists of the power semiconductors with their gate drive unit(GDU)s and the control computer for driving, voltage, current and speed controls. Electrolytic condenser, connected to the gate drive unit and a core component to drive the power semiconductor, has problems such as reduction in lifetime and malfunction caused by electrical and mechanical characteristic changes from heat generation during high speed switching for generation of stable power. In this study, To check the service life of electrolytic condenser, the test was carried out in two ways. First, In the case of accelerated life testing of condenser, the Arrhenius model is a way of life testing. Another way is to analyze the reliability of the failure data by the method of parametric data analysis. Eventually, life time by accelerated life test than a method of failure data analysis(Weibull distribution) was found to be slightly larger output.