• Korean Journal of Optics and Photonics
• /
• v.5 no.1
• /
• pp.9-17
• /
• 1994

Optical properties of $TiO_2$ thin films prepared by ion-beam assisted deposition(1BAD) were investigated. The result shows that the refractive index of IBAD TiOL thin films measured by an envelope method is closer to that of the corresponding bulk than that of conventionally deposited $TiO_2$ thin films and the packing density of IBAD $TiO_2$ thin films measured by a vacuum-to-air spectral shift of films increases drastically. The vacuum-to-air spectral shift of an IBAD $(TiO_2/SiO_2)$ multilayer interference filter was negligible as compared to that of a conventional interference filter and so the IBAD filter is denser and more stable optically than the conventional filter. Also it is observed that the IBAD and conventional $TiO_2$ thin films are stoichiometric and amorphous.

• Journal of the Korean institute of surface engineering
• /
• v.29 no.2
• /
• pp.93-99
• /
• 1996

In this work BN thin films were deposited on Si substrate by R. F. sputtering method at $200^{\circ}C$ and in Ar + $N_2$ mixed gas atmosphere. In order to investigate the effect of ion bombardment on substrate for c-BN bonding, substrate bias voltage was applied. The optimum substrate bias voltage for c-BN bonding was determined by FTIR analysis on specimens which were deposited with various bias voltages. Then BN thin film was deposited with this optimum condition and its phase, morphology, chemical composition, and refractive index were compared with those of BN film which was deposited without bias voltage. FTIR results showed that BN films deposited with substrate bias voltage were composed of mixed phases of c-BN and h-BN, while those deposited without bias voltage were h-BN only. When pure Ar gas was used for sputtering gas, BN films were delaminated easily from substrate in air, while when 10% $N_2$ gas was added to the sputtering gas, although c-BN specific infrared peak was reduced, delamination did not occur. GXRD and TEM results showed that BN films were amorphous phases regardless of substrate bias voltage, and AES results showed that the chemical compositions of B/N were about 1.7~1.8. The refractive index of BN film deposited with bias voltage was higher than that without bias voltage. The reason is believed to be the existence of c-BN bonding in BN film and the higher density of film that deposited with the substrate bias voltage.

• Journal of Korean Society of Forest Science
• /
• v.86 no.1
• /
• pp.98-104
• /
• 1997

Soil pollution intensity at Mt. Namsan in Seoul city which was expected to show significant soil contamination due to long-term air pollution was evaluated by comparing soil chemical properties at Mt. Kyebangsan in Hongcheon area as a control, and the bacteria participating in nitrogen or sulfur mineralization were assayed simultaneously in order to evaluate the validity of N and/or S mineralization bacteria as an index of soil contamination. The soil of Mt. Namsan showed 10 times higher concentration of hydrogen ion compared to that of Mt. Kyebangsan, which indicated that the soil had relatively been acidified seriously. Especially, large amount of canons were thought to be leached out from the soil, while the amount of extractable Al was getting larger and larger, which result in serious problems in soil ecosystem of the mountain. I could infer from soil chemical properties of the four study sites that the major reason of soil acidification was SOx deposition. However, the sulfur-reducing bacteria were not significantly different between the two regions, which indicated that the microbial dynamics of the soil ecosystem was not controlled by simple factor, but by multiple factors. By the way, the dynamics of bacteria participating in denitrification process was different between the two regions, which was more active at Mt. Kyebangsan than at Mt. Namsan. Thus, the microbial assay for nitrogen mineralization is desirable to be examined as a tool for evaluating soil health or microbial activity in soil ecosystem.

• Journal of Environmental Health Sciences
• /
• v.36 no.4
• /
• pp.294-305
• /
• 2010

This study estimated the health risk of heavy metals in particulate matter $(PM)_{2.5}$ in a Gwangyang industrial complex. The $PM_{2.5}$ containing heavy metal was collected from January to November, 2008 using a denuder air sampler and by IC (Ion Chromatograph). The risk assessment was performed in a four-step process; hazard identification, exposure assessment, dose-response assessment and risk characterization. In the hazard identification process, $Cr^{6+}$, Ni, As, and Pb were categorized as human carcinogens and probable human carcinogens, while Ti, Mn, Se, P, $Cr^{3+}$, Cu, and Zn were not classified as human carcinogens. It was found that the excess cancer risk by Central Tendency Exposure (CTE) of $Cr^{6+}$ and As in $PM_{2.5}$ was > $10^{-6}$, and the total excess cancer risk posed by carcinogen heavy metals in $PM_{2.5}$ was > $10^{-6}$. It was also determined that the total hazard index by CTE of non-carcinogen heavy metals in $PM_{2.5}$ was <1. Taken together, these results indicate a high cancer risk associated whit inhalation of heavy metal-containing$PM_{2.5}$ in industrial areas.

• Korean Journal of Optics and Photonics
• /
• v.11 no.5
• /
• pp.323-329
• /
• 2000

In this study we have calculated an ideal complex refractive index of a TiN trim used in a layer of anl1reilecnon (I\R) coatmg, [air$ISiO_2ITiNIglass$] in the visible. Also we simulated the rellectance of lwo-layer AR coating by varying the thicknesses of TiN and $SiO_2$ layers, respecl1vely. The simolation results show that we can controllhe lowest reflectance and AR band of tile AR coating. The TIN fihns were fabricated by a RF magnetron sputtering apparalus. The chemical, structural and electrical properties of TiN fih11S were inveshgated by the Rutherford backscattering spech'oscopy (RBS), atomic force microscope (AFM) and 4-point probe. The optical properlies were inve,tigated by the spectrophotometer and vanable angle spectroscopic ellipsometer (VASE). The smface roughness of TiN flhns \vas $9~10\AA$. TIle resistivity of TiN films was TEX>$360~730\mu$\Omega $ cm. The ,toichlOllletry of TiN film was 1'1: O:N = I: 0.65 :0.95 and ilic oxygen wa~ found on ilie smface. With these experimental and simu]al1on resulLs, we deposited duo: two-layer AR coating, [air$ISiO_2ITiNIglass$] and the refleClance was under 0.5% ill the regIOn of 440-650 run. 0 run.

• The Korean Journal of Mycology
• /
• v.29 no.2
• /
• pp.91-98
• /
• 2001

The mycelial morphology during submerged cultivation of Ganoderma ludium using by air-lift fermenter system were analyzed by image processing system and the characterization of mycelial morphology were investigated. In submerged culture using medium with different ammonium phosphate concentrations, the various morphological forms of G. lucidum mycelium were observed. The filamentous forms such as non-branched long filamentous mycelium, non-branched short mycelium, branched long filamentous mycelium, branched short mycelium, entangled mycelium and clump were observed, and also, and also, the pelleted forms such as smooth pellet, rough pellet and hollow rough pellet were observed. The mycelial morphology was changed from the filamentous to the pelleted forms by addition of ammonium phosphate. The fractal dimensions of pelleted and filamentous forms were 1.05 and 1.3, respectively, while the fractal dimension of mixtures of pelleted and filamentous forms was 1.16. Therefore, the fractal dimension was found to be more effective index for the detection of the mycelial morphology and morphological change during batch cultivation. The circularity was also found to be useful for evaluating the surface growth of pelleted mycelium.