• Applied Microscopy
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• v.29 no.1
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• pp.75-81
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• 1999

Optimum conditions for making the Au and Al internal standards for TEM have been determined experimentally. The Au internal standard was produced by sputter coating at 9mA for 100 seconds in low vacuum $(\leq1\times10^{-3})$. The Al internal standard was produced by evaporation coating at 7kV for 10 minutes in high vacuum $(\leq1\times10^{-5})$. Measurements of the lattice parameters of andalusite and albite feldspars with this Au internal standard resulted in errors of (a) $ \leq1.2%$ in precion and $\leq0.3%$ in accuracy for andalusite: (b) $\leq0.5%$ in precision and $\leq1.1%$ in accuracy for albite feldspars. The most significant error occurred from the measuring processes of distances and angles of electron diffraction patterns. By employing systematic procedures of measurement with high precision devices, this lattice parameter determination method utilizing the internal standard should be a good alternative to the conventional powder XRD method or the sophisticated CBED method for special samples.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2009.05a
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• pp.121-121
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• 2009

구리 전해정련 과정에서 전해액 중의 Arsenic과 같은 불순물 성분이 전기동의 전착에 미치는 영향을 확인하고, 전해액 중의 최대 허용 농도를 도출하고자 하였다. 전해정련 과정에서 분순물 성분이 전기동 전착에 미치는 영향을 주사전자현미경(SEM), X-선 회절(X-ray diffraction) 및 전기화학적 분석을 통해 수행하였다.

• Applied Microscopy
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• v.21 no.1
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• pp.108-120
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• 1991

Principles of electron diffraction patterns in transmission electron microscope are described for beginners in terms of reciprocal lattices and Ewald sphere. Analysis of both ring patterns and spot patterns are illustrated with practical examples as well as basic calibrations of TEM. Especially convergent beam electron diffraction method is emphasized for the determination of lattice parameters, microstrains, and thickness of thin foil followed by a review of microcomputer programs for the electron diffraction analyses explained in this paper.

• Applied Microscopy
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• v.33 no.3
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• pp.187-193
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• 2003

When electron microscope images and selected area diffraction patterns of crystalline materials are being compared, it is important to know for the rotation of the diffraction pattern with respect to the image caused by the magnetic lens in the Electron Microscope. A well-known method to determine this rotation is to use a test crystal of $MoO_3$. But this method of determination of the rotation angle contains an uncertainty of $180^{\circ}$. Thus one has to devise another way to eliminate this uncertainty. In this paper we present a new and simple method of determining this rotation without any complexity. The method involves a process of obtaining LACBED patterns of crystalline materials. For the J2010 electron microscope, the rotation is determined to be $180^{\circ}$ and this angle remains unchanged for changing of the magnification and the camera length.

• Journal of the Mineralogical Society of Korea
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• v.7 no.1
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• pp.62-79
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• 1994

The quanttative and structural analysis of the binary standard mixtures of albite and quartz, and microcline and albite were carried out using the Rietveld refinement method in order to investigate the accuracy and precision of the method. The quantitative analysis using the Rietveld method results in a standard deviation of 4 wt % for the albite-quartz standard mixtures and 1 wt % for the microcline-albite standard mixtures, suggesting that its accuracy is far better than that of the conventional XRD method in which only a few selected peaks are utilized. Furthermore, the unit-cell parameters of component minerals in mixtures were also estimated accurately during the analysis. It was observed that the refined weight fractions deviate systematically from their measured values when the method is applied to the mixtures that contain minerals with different degrees of preferred orientation, such as albite-quartz mixtures. The preferred orientation parameters and R-values suggest that the systematic deviation is caused as a result of the preferred orientation effect of feldspar crystallites. It is evident that the preferred orientation corrections are of help for the accurate determination of unit-cell parameters, although they may not improve the result of quantitative analysis significantly. The refined weight fraction of the mineral with higher degree of preferred orientation in mixture is greater than the measured one. This is apparently caused by the effect of geometry of feldspar crystallites in the surface of the mounted sample. The Rietveld refinement method minimizes the problems inherent in the traditional XRD methods, such as the line overlap, primary extinction, and preferred orientation effect, by fitting every data point in a whole pattern explicitly. Furthermore, accurate unit-cell parameters as well as scale factors that can be obtained from the Rietveld refinement are used for the quqantification. The present stdudy demonstrates that the Rietveld method yields far more accurate analytical result than the conventional XRD quantitative analysis method does.

• Korean Journal of Food Science and Technology
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• v.26 no.4
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• pp.428-435
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• 1994

Properties of modified rice starches prepared in drum drying and extrusion were evaluated to use for effective utilization. Blue value was the lowest (p<0.05) for waxy rice starch and L value was decreased after modification of starches. Water solubility index was the highest for modified starches prepared in extrusion, while water absorption index was the highest for modified starches prepared in drum drying. Cold-Water-Solubility was the highest (p<0.05) for modified rice starch prepared in drum drying (RD). Consistency index of RD was drastically increased as shear rate increased and yield stress was the highest for RD. Results of Gel Permeation Chromatography showed that starch components were broken down into lower molecular weight materials and amylose are degraded by modification. Changes in the X-ray diffrectometry pattern indicated the transformation of granule into an amorphous state during modification and illustrated V-type.

• Journal of the Mineralogical Society of Korea
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• v.15 no.1
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• pp.44-58
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• 2002

A new polymorph of tridymite, an incommensurately modulated phase (IC phase), has been identified. While the symmetry of the IC lattice is same as that of the Ll phase, the geometry of the IC lattice structure is same as the basis of the L3 structure with a different modulation (modulation vector q=0.22 $c*_{H}$;$\lambda$ 37 ). On the other hand, the characteristic curved diffuse diffration observed from the Ll atoms could occur even at room phase suggests that the dynamic disordering of atoms, especially oxygen atoms could occur even at room temperature. The phase transition of Ll to L3 by grinding is gradual but very conspicuous: LllongrightarrowL1+IClongrightarrowIC+L3longrightarrowL3. However, it is revealed that real transition processes of individual grains are directly related to the local stress fields and preexisting microstructures.

• Electronics and Telecommunications Trends
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• v.31 no.4
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• pp.1-12
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• 2016

깊이감, 시점 등의 3차원 영상정보 제공 방법에는 양안 시차에 의한 스테레오 방식, 다시점 기반의 스테레오 방식, 라이트필드 기반의 스테레오 방식, 체적 내에 실제 발광점들을 물리적으로 형성하는 체적형 방식, 빛의 간섭과 회절현상을 이용하여 실제 물체의 파면을 재현하는 홀로그래피 방식 등이 존재한다. 본고에서는, 3차원 영상기술로써 최근 이슈화되고 있는 플렌옵틱 영상기술의 개념을 다시점 영상생성 및 재초점 기능의 관점에서 소개하고, 동시에 관련 국내외 기술개발 동향을 파악하고자 한다. 또한, 플렌옵틱 영상기술의 고도화를 위한 최신 연구개발 이슈 및 응용 가능한 서비스 시나리오에 대해 탐구해 봄으로써, 향후 플렌옵틱 영상처리 기술의 발전 및 활용도를 전망해 보고자 한다.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.08a
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• pp.82-82
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• 2010

metal/metal계에서는 표면 원자의 재결합이 이루어 져서 표면의 특성이 bulk와는 전혀 다른 물리 화학적 특성을 보인다. 본 연구에서는 텅스텐 (110)면에 알루미늄 원자를 흡착시켜 저에너지 전자회절(LEED)과 이온산란분광법(ISS-TOF)을 이용하여 표면구조를 연구하였다. 텅스텐 (110)면 표면을 1000 K로 가열하는 동안 알루미늄을 1.0 ML 흡착시켰다. 이 때 p($1{\times}1$) LEED 이미지가 관측되었다. Al/W(110)계면에서 알루미늄 원자가 텅스텐 표면원자와의 결합거리와 방향 등 흡착위치를 알아보기 위해 이온산란분광법을 이용하였다. 그 결과 알루미늄 원자는 double domain으로 W(110) 표면의 hollow site에서 $0.55\;{\AA}$ 벗어나 위치하였으며, 텅스텐의 첫 번째 원자 층으로부터의 높이는 $2.13{\pm}0.1\;{\AA}$이다. 알루미늄 원자와 가장 가까운 텅스텐 원자까지의 거리는 $2.71{\pm}0.15\;{\AA}$이다.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.02a
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• pp.344-344
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• 2011

W(110)면에 흡착원자인 Al원자의 coverage와 annealing과정에서의 온도를 변화시켜, 여러 조건에서의 Al/W(110)계의 흡착구조를 저에너지 전자회절(LEED)과 이온산란분광법(ISS-TOF)을 이용하여 연구하였다. 여러 결과 중, annealing 온도가 900K인 1.0ML Al/W(110)면은 double domain의 p($1{\times}1$)의 흡착구조로 W(110)면의 center of hollow site에서 $0.55{\AA}$ 벗어난 위치에 흡착되었으며, W(110) 표면원자로부터 Al 원자까지의 높이는 $2.13{\pm}0.15{\AA}$이다. 또한 annealing 온도가 1100K인 0.5ML Al/W(110)면은 double domain의 p($2{\times}1$)의 흡착구조로 W(110)면의 center of bridge site에 흡착되었으며, W(110) 표면원자로부터 Al 원자까지의 높이는 $2.18{\pm}0.15{\AA}$이다.