• KEPCO Journal on Electric Power and Energy
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• v.6 no.2
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• pp.145-150
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• 2020

Water wall tube is one of the major factors consisting of a fluidized bed boiler and it plays very important role for the generation of electricity within the boiler. But these water wall tubes within the fluidized bed boiler are subject to the ware and corrosion caused by the high temperature gas and the flowing medium. If water leak is occurred, the secondary damage by the water leak will occur. As a result of that, the power generation efficiency decreases noticeably. Therefore, the maintenance of the water wall tube is very important. In this study, we designed a exciter sensor based on simulation and composed a remote field eddy current system for the defect evaluation of the outer water wall tube. Starting from the shape design of exciter, we conducted simulations for various design factors such as the water wall tube size, material, frequency, lift-off and so on. Based on the results, we designed the optimum exciter sensor for the water wall tube test within the fluidized bed boiler.

• Journal of the Korean Society for Precision Engineering
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• v.15 no.3
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• pp.99-106
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• 1998

Recently, scientists introduced a new type of microscope capable of investigating nonconducting surfaces in an atomic scale, which is called AFM (Atomic Force Microscope). It was an innovative attempt to overcome the limitation of STM (Scanning Tunnelling Microscope) which has been able to obtain the image of conducting surfaces. Surfaces of samples are imaged with atomic resolution. The AFM is an imaging tool or a profiler with unprecedented 3-D resolution for various surface types. The AFM technology, however, leaves a lot of room for improvement due to its delicate and fragile probing mechanism. One of the room for improvements is gap control between probe tip and sample surface. Distance between probe tip and sample surface must be kept in below one Angtrom in order to measure the sample surface in Angstrom resolution. In this paper, AFM system modeling, experimental system identification and control scheme based on system identification are performed and finally sample surface is measured by home-built AFM with such a control scheme.