• Journal of the Korean Society for Nondestructive Testing
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• v.24 no.5
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• pp.532-537
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• 2004

FEF(Focused Electromagnetic Field) technique was newly developed that is based on the induction principle exciting electromagnetic field. The technique consists of an induction wire and a sensor for detecting electromagnetic field, and is applied in a non-contact mode. In this study, the technique was applied to the evaluation of EDM slits in some conductive materials - aluminum alloy, stainless steel and Inconel alloy. The voltage in the non-defect region is depended upon the measurement lift-off. The voltage signals on defects are measured with peak values, and the peak values changed with the depth of defects. The voltage distributions for all conductive materials are the same trend.