• Proceedings of the KAIS Fall Conference
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• 2002.11a
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• pp.258-259
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• 2002

본 연구는 304 STS을 전해연마하여 표면의 조도를 나노 단위까지 제어하기 위한 leveller의 개발이 목적이다. 이를 위해서 AFM을 이용하여 조도를 측정하였고 분극실험을 통해 표면특성을 연구하였다. 전해연마는 인산:황산:증류수를 8:1:1 비율로 전해액을 만들었고 부가적으로 첨가제를 넣어 전해연마를 실행했다. 분극실험은 일정한 전극간격을 유지하여 정전압 조건에서 1mV/s의 속도로 주사하여 실험하였다. 전해연마 시간이 증가함에 따라, 첨가제의 양이 적게 들어갈수록 평활도가 향상됨을 볼 수 있었다.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2010.11a
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• pp.139-140
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• 2010

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2012.05a
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• pp.303-304
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• 2012

공업적으로 널리 사용되는 내식강의 전해연마는 주로 고농도의 인산염 전해액 기반에 황산과 질산 첨가된 용액에서 $70^{\circ}C$ 이상의 고온에서 행해지다 보니 폐액 처리와 작업 환경이 좋지 않아 기피 기술로 인식 되어 있다. 본 연구에서는 환경 친화적인 상온 공정을 개발 하고자 에틸렌 글리콜 용액에 여러 가지 첨가제를 첨가하여 그 효과를 살펴보고 최적 조성과 공정 조건을 확립 하고자 하였다. 틸렌 글리콜에 물과 질산 암모니움을 첨가하여 점도와 pH, 전류 전압 특성을 구하고 여기에 첨가제인 설파메이트와 암모니움 클로라이드 첨가량을 정하고 각각의 효과를 확인 하였다. 이러한 결과를 바탕으로 SUS 316 재질에 대한 최적 연마조건을 설정하기 위해 조도 변화, 광택도 및 표면 조직 변화와 전해연마기구를 비교 검토하였다.

• Journal of the Microelectronics and Packaging Society
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• v.15 no.1
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• pp.45-50
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• 2008

The effects of electrolytes and additives on the electropolishing of 50 and $20{\mu}m$ diameter copper via were investigated to flatten 3D SiP through via. The termination time was determined with analysis of applied potential on anode and cathode to avoid excess electropolishing. Acetic acid played a role of accelerator and glycerol played a role of inhibitor in phosphoric acid electrolytes. The overplated copper on the through via was effectively electropolished in the phosphoric electrolytes with acetic acid and glycerol addition. The electropolishing was terminated at the point of abrupt change of applied potential to remove only overplated copper on the through via.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.17 no.8
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• pp.722-727
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• 2016

In this study, we attempted to reduce the generation of waste acids in the electropolishing process by improving the current efficiency. The optimum conditions of the electropolishing process when using the round bus bar were determined by the Taguchi method. The current density, polishing time, electrolyte temperature and flow rate were selected as the control factors for the current efficiency in the electropolishing process. An orthogonal array was created by considering three levels for each factor and experiments were carried out. The larger-the-better SN ratios were calculated by the Taguchi method. The current density was the most important factor affecting the current efficiency and the polishing time was the least important one. The optimum conditions to minimize the generation of waste acids were a current density of $45A/dm^2$, polishing time of 4 min, electrolyte temperature of $65^{\circ}C$ and flow rate of 7 L/min. The results of the ANOVA confirmed that the effects of the current density, electrolyte temperature and flow rate are significant at the 95% confidence level. The increase in the contact area and contact force afforded by using the round bus bar improved the current efficiency which, in turn, reduced the amount of waste acids generated. Further research is planned to investigate the effect of the type of bus bar on the current efficiency.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.4 no.1
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• pp.47-49
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• 2003

The cost of material and slicing of silicon wafer occupied more than 30% of solar cell manufacturing cost. The substitution of silicon wafer into STS 304 stainless steel could be the promising solution to decrease the material cost. Moreover the stainless steel solar cell could have the advantage of low weight and durability. However, the highly polished surface is required to meet the characteristic of solar cell. The electropolishing process in phosphoric acid based solution was used to get the surface quality. The obtained result was 28 nm obtained in current density of 2Amfi/$cm^2$ at $80^{\circ}C$. The leveller effect of glycerine, ethylene glycol and propylen glycol was studied. When the 0.4 g/l of ethylene glycol was added to the electrolyte, the surface roughness was best, 15 nm.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2008.11a
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• pp.129-131
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• 2008

태양전지에서 발생되는 전력을 이용하여 중금속 성분이 함유된 공장 폐수에서 중금속 성분을 전착 회수하는 내용의 연구 및 장치를 개발하였다. 공장 폐수는 316L강을 전해연마한 후 배출되는 용액을 사용하였으며, 양극은 백금도금된 티타늄망을, 음극은 순수 동판을 사용하여 전해에 의해 중금속 성분을 전착시켰다. 전해액 및 전착 금속에 대한 분석도 이루어졌다.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2004.10a
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• pp.609-613
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• 2004

On this study, electrochemical polishing is adapted to ultra-fine surface for semiconductor large radius gas-tube. The system which buffing and electrochemical polishing can be performed simultaneously was constructed in connection with developing exclusive system. Based on existing papers and the research of background, electrode gap and electrolyte flow were fixed. Current density and electrochemical precision time were chosen as variables. On this study, it is objected to find optimal precision condition and precision variables on the in-process electrochemical polishing.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.37 no.3
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• pp.313-318
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• 2013

Magnetic abrasive polishing is an advanced deburring process for nonmagnetic materials and micropattern products that have non-machinability characteristics. Despite these advantages, there are some problems with using MAP for deburring. MAP has introduced geometric errors into microgrooves because of an over-cutting force caused by uncontrolled magnetic abrasives in the MAP tool. Thus, in this study, to solve this problem, an EP (electrolyte polishing)-MAP hybrid polishing process was developed for deburring microgrooves in an STS316 material. In addition, an evaluation of EP-MAP for the deburring of microgrooves was carried out by profiling the burrs. The results of the experiment showed geometric errors after the deburring process using MAP. However, in the case of EP-MAP, no geometric error was observed after the process because of the lower material removal rate in EP-MAP.

• Journal of the Microelectronics and Packaging Society
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• v.7 no.3
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• pp.45-54
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• 2000

The effect of electropolishing far stamped leadframe on the removal of the edge burr and residual stress relief was examined. The present study showed that the electropolishing could be used for enhanced surface quality of stamped leadframes. The electropolishing was performed at the condition of 60% phosphoric acid electrolyte, 5 ampere of current and 3 cm electrode gap at $70^{\circ}C$ for 2 minutes for Alloy42 type leadframe, and $50^{\circ}C$ for 1.5 minutes for C-194 type leadframe. The FWHM values from X-ray diffraction showed that residual stress of electropolished leadframe recovered to the level of as-received raw materials and surface roughness measured by using AFM tuned out to be improved by 0.079 $\mu\textrm{m}$ and 0.014 $\mu\textrm{m}$ ($R_{rms}$) far alloy 42 and C-194 type leadframes, respectively. The plated thickness using XRF showed the improved uniformity in thickness variation by 0.4~0.5 $\mu\textrm{m}$ and grain growth, which is favorable for interface adhesion, was also observed from the bake test samples. We could certify dimensional stability of leadframe with inspection by means of 3D-topography and hardness measurements.