• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.4
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• pp.63-71
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• 2002

In this paper, we present microwave characteristics of traveling-wave photodetectors (TWPD) using the finite-difference time-domain method (FDTD). Current and voltage in the time domain are calculated by the FDTD. Also, characteristic impedance and propagation constant in frequency domain are obtained from the time-domain data. As the thickness of i-layer gets thicker and the waveguide width gets narrower, TWPD's show less microwave loss and higher velocity. The 50Ω impedance matching design is achieved for 2.4${\mu}{\textrm}{m}$ waveguide width and 1.2${\mu}{\textrm}{m}$ thickness of i-layer at 100 GHz.

• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.134.1-134.1
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• 2014

콜로이달 리소그래피는 나노미터 크기의 나노구를 자가조립에 의해 정렬시킴으로써, 파장이하 크기의 주기 구조를 저비용으로 쉽게 구현할 수 있는 패터닝 기법이다. 콜로이달 리소그래피나 소프트 리소그래피와 같이 대면적 패터닝이 가능한 공정을 태양전지를 위한 반사방지 및 광 포획 증대 구조에 적용함으로써, 기존 성능을 크게 향상시켰다. 본 연구에서는, 유한차분 시간영역 수치해석법을 이용하여 반사 방지 및 광 포획 증대 구조에 대한 이론적 검증 및 설계를 진행하였고, 콜로이달 리소그래피 및 반도체 공정을 통해 샘플을 제작하였으며, 제작된 샘플의 성능을 적분구를 겸비한 자외선 가시광 근적외선 영역 분광기를 통해 평가하였다. 반사방지 나노섬을 겸비한 나노 원뿔대 언덕형 굴절률 소자를 구현함으로써, 300나노미터 이하의 구조체를 사용하지 않고도 근자외선 영역을 포함하는 태양광 에너지의 손실을 최소화할 수 있는 광대역 방사방지 구조체를 제시하였다. 나노 원뿔대가 격자상수 이상의 파장에 대한 언덕형 굴절률을 제공하고, 4분의 1파장 나노섬 반사방지막이 격자 상수 이하의 근자외선 태양광을 추가적으로 흡수하여, 근자외선 영역에서의 평균 반사율을 3.8% 수준으로 달성 할 수 있었다. 또한, 낮은 양호계수를 갖는 속삭임 회랑 공진기 어레이를 이용하여, 박막 태양전지에 적합한 유전체 기반 광포획 증대 나노구조를 제시하였다. 나노반구, 나노고깔, 나노구, 함몰형 나노구 어레이 형태를 가지며, 500nm의 주기를 갖는 유전체 표면 텍스쳐드 구조를 초박형 비정질 실리콘 필름(100nm) 위에 제작하여 광대역 광 포획 증대 효과를 실험적으로 평가하였다. 구조들 중 함몰형 나노구 어레이가 결합된 비정질 실리콘 박막이 가장 높은 성능을 보였으며, 구조가 없는 경우 대비 약 67.6%의 가중 흡수율 증가를 나타내었다. 특히, 함몰형 나노구 어레이 구조 중 폴리메틸메타아크릴레이트로 제작된 평판형 함몰층은 나노구 비정질 박막 실리콘 사이의 접착력 및 기계적 강성을 향상시켰을 뿐 아니라, 함몰층 내부로 회절되고 산란된 빛들이 도파모드 효과에 의해 부가적인 광 포획 증대를 가져옴으로써, 가장 높은 광 포획 효과를 얻을 수 있었다. 유전체 기반 나노 구조들은 간단하고 저비용이며, 대면적으로 쉽게 제작할 수 있는 자가 조립 기반 콜로이달 리소그래피 및 소프트 리소그래피 기술을 이용하여 제작되었다.

• Journal of the Korean earth science society
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• v.30 no.7
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• pp.834-844
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• 2009

Two-dimensional magnetotelluric (MT) inversion algorithm using minimum support (MS) stabilizer functional was implemented in this study to enhance the contrast of inverted images. For this implementation, this study derived a formula in discrete form for creeping model updates in the least-squares linearized inversion. A spatially varying regularization parameter determination algorithm, which is known as ACB (Active Constraint Balancing), was also adopted to stabilize the inversion process when using MS stabilizer as a model constraint. Inversion experiments for a simple isolated body model show well the feature of MS stabilizer in concentrating the anomalous body compared with the second-order derivative model constraint. This study also compared MS stabilizer and the second-order derivative model constraints for a model having multiple anomalous bodies to show the applicability of the algorithm into field data.

• Journal of the Korean Magnetics Society
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• v.9 no.1
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• pp.7-16
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• 1999

Stoichiometric and nonstoichiometric $Y_{3-x}Fe_{5+x}O_{12})$ polycrystalline samples (x=0.00, 0.05, 0.10, 0.30, -0.05, -0.10, -0.30) were prepared by solid state reaction method. The magnetic properties of the sample were investigated by FMR (ferromagnetic resonance) technique at microwave frequency 5.11 GHz (G-band) and 23.39 GHz (K-band) respectively. The spectroscopic splitting factor g were estimated to be 2.04~2.35 from the derivative absorption lines. As the samples became yttrium $(Y^{3+})$ excess and iron $(Fe^{3+})$ excess, Magnetizations were decreased. But resonance linewidth were increased. To investigate the anisotropy, the angular dependence of resonance magnetic fields were measured. Angular dependence of effective magnetizations were measured by FMR from 77 K to 300 K at K-band microwave frequency (23.39 GHz) and the saturation magnetizations were measured by VSM. The Bloch coefficients B and C were determined by fitting. $M_{eff}(0)$ was obtained by the extrapolation from 80 K. From this result, the spin wave stiffness constant D $(about\; 162~206 \;eV{\AA}^2)$and average square range of exchange interaction $$$(about \;5.84~12.13\;{\AA}^2)$ were determined.

• Korean Journal of Optics and Photonics
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• v.8 no.4
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• pp.277-282
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• 1997

The complex refractive index of Diamond-like Carbon (DLC) thin films, which can be applied to optical devices or electrical devices, have been determined using optical methods. DLC thin films are grown on Si(100) substrates and vitreous silica substrates respectively, using the technique of plasma enhanced chemical vapor deposition (PECVD). The spectroscopic ellipsometry data($\psi$, $\Delta$) and the transmission spectra of these DLC films are obtained. These optical spectra are analyzed with the help of the Sellmeier dipersion relation and a quantum mechanically derived dispersion relation. Using spectroscopic ellipsometry data at their transparent region, the refractive index and the effective thickness of DLC films on vitreous silica are model calculated, Then the transmission spectra are inverted to yield the extinction coefficient spectra k(λ) at absorbing region. These spectra are fit to the quantum mechanical dispersion relation and the best fit dispersion constants are determined. The complex refractive indices are easily calculated with these constants. The spectroscopic ellipsometry data at the absorbing region in model calculated to give the packing densities and the degrees of surface microroughness of DLC films. Discussions are made in correlation with the growth condition of DLC films.

• Korean Journal of Optics and Photonics
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• v.21 no.1
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• pp.33-37
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• 2010

We performed time-domain terahertz (THz) spectroscopy to determine optical constants of highly conductive carbon nanotube (CNT) films. The CNT films have been fabricated on a flexible plastic substrate by using spin-coating or vacuum filtration. We found that the transmission of THz waves can be controlled by manipulating the thickness of the films and by post-treatments. From amplitude and phase information of the transmitted THz waves, we obtain optical constants such as refractive indices and dielectric constants of the CNT films. The frequency dependent dielectric constants show good metallic behaviors, relevant to the Drude free electron models with high plasma frequencies. It is also found that the dielectric constants are higher for the acid-treated films. Finally, the frequency dependent dielectric constants which are free from substrate effects have been demonstrated by using CNT films deposited on cellulose membranes.

• Journal of the Institute of Electronics and Information Engineers
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• v.50 no.3
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• pp.16-22
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• 2013

A general characterization procedure based on the extraction of a 2n-port admittance matrix corresponding to n uniform coupled lines on the multi-layered substrate using the Finite-Difference Time-Domain (FDTD) technique is presented. In this paper, the frequency-dependent normal mode parameters are obtained from the 2n-port admittance matrix to analyze multi-layered asymmetric coupled line structure, which in turn provides the frequency-dependent propagation constant, effective dielectric constant, and line-mode characteristic impedances. To illustrate the technique, several practical coupled line structures on multi-layered substrate have been simulated. Especially, embedded conductor structures have been simulated. Comparisons with Spectral Domain Method are given, and their results agree well. It is shown that the FDTD based time domain characterization procedure is an excellent broadband simulation tool for the design of multiconductor coupled lines on multilayered PCBs as well as thick or thin hybrid structures.

• Journal of the Korean Vacuum Society
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• v.18 no.2
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• pp.133-140
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• 2009

$Ta_{2}O_{5}$ thin films were deposited by RF magnetron sputtering method under various RF power, substrates and oxygen partial pressure. Elliptic constants were measured by using a phase modulated spectroscopic ellipsometer and analyzed with the Tauc-Lorentz dispersion formula and best fit method in the range of 310$\sim$1239 nm. Also, transmittance spectra of the films were measured by UV -Vis spectrophotometer in the range of 300$\sim$1000 nm. From these data, thickness of $Ta_{2}O_{5}$ and surface layer were analyzed and changes of magnitude and shape of dispersion of optical constants according to fabricated conditions were measured. Also, to evaluate thickness and optical constants data analyzed by Tauc-Lorentz dispersion formula, the measured and analyzed transmittance spectra were compared. In result of the comparison, two spectra were in good agreement each other. Accordingly, it indicates that our ellipsometric analysis is valid.

• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.10 no.4
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• pp.498-505
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• 1999

The ferrite device that has nonreciprocal characteristics has been used as various microwave components. In this paper, the spectral-domain method was used to analyze the characteristics of structure(strip line on multilayer structure with ferrite material) for which no paper has been published yet. It is assumed that an external dc magnetic field is applied perpendicular to the ground conductor. The propagation constant is calculated for each parameter and frequency. Also we considered convergence by increasing the number of basis functions and verified the numerical analysis results. From the results, we could confirm that as the thicknesses of YIG is increased, the cutoff region is widened and the propagation constant is decreased at the frequency of upper cutoff region. For a larger applied dc magnetic field, the frequency of cutoff region is found to be increased. Also the simulation results for strip line show that the cutoff region is widened and the propagation constant is larger than that of microstrip line.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.08a
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• pp.335-335
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• 2012

III-V 족 반도체 물질 중, GaN는 넓은 밴드갭을 가지고 있어 발광 다이오드나 레이저 다이오드, 트랜지스터, 스핀트로닉스 등의 응용에 유용한 물질이다 [1]. 실시간 성장 제어 및 최적화된 특정 소자 응용을 위해서는 GaN의 다양한 온도에 대한 유전율 함수 정보가 필수적이다. 편광분석법을 이용한 상온에서의 hexagonal GaN 유전율 함수는 이미 여러 연구에서 보고되었고, 80~650 K 사이의 온도 범위에 대한 언구도 수행되었다 [2,3]. 그러나, 온도변화에 대한 GaN 유전율 함수와 $E_0$ 전이점에 대한 해석은 부정확하다. 따라서 본 연구에서는 사파이어 기판 위에 분자살박막증착장치를 이용하여 c-축 방향 (0001)으로 성장 시킨 hexagonal GaN를 0.74~6.42 eV 에너지 구간에서 보다 확장된 온도 영역(26~693 K)의 유전율 함수를 편광분석법을 이용하여 측정하였다. 측정된 GaN의 유전율 함수를 회기분석법을 통한 2차 미분 표준해석법을 이용해 분석 하였고, 그 결과 $E_0$와 excitonic $E_0$ 전이점을 명확히 얻을 수 있었다. 온도가 감소함에 따라 격자상수 및 전자-포논 상호작용이 감소하여 전자 전이점이 청색천이 하고, 그 구조가 명확해 지는 결과를 얻었다. 본 연구의 결과는 GaN 유전율 함수의 온도 의존성에 대한 데이터베이스를 제공함은 물론, 실시간 모니터링과 GaN를 기반으로 하는 광소자 제작 등에 유용할 것이다.