• Journal of Digital Convergence
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• v.14 no.11
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• pp.435-440
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• 2016

The aim of study was to provide the preliminary data to find out characteristics of the difference between both refractive errors through analysis of ocular components variation. We measured spherical equivalent power and corneal radius with KR-8800, and axial length and anterior chamber depth with IOL Master, and the difference of measuring values between the right eye and left eye was applied as the absolute values in 100 adults aged 20~59 years. In all participants, the most common results showed that spherical equivalent power was $-1.83{\pm}2.17D$, axial length was 23.00~24.99mm, corneal radius was 7.50~7.89mm, and anterior chamber depth was 3.60~4.09mm. There are significant correlations between both eyes in axial length and anterior chamber depth with the difference of both spherical equivalent power. The difference of both axial lengths was the biggest with the difference of both refractive errors, and shown the highest correlation. The convergence complex study through classification by aspects is needed since the difference of both refractive errors is closely related with ocular components variation, and poor visual function would be caused by the difference of both refractive errors.

• Journal of Korean Ophthalmic Optics Society
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• v.12 no.1
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• pp.85-90
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• 2007

We deposited thin films of ZnS(Zinc Sulphide), in which was used antireflection coating material of glasses-lens on silicon and slide-glass substrates using spin coating method, and measured spectra of ellipsometry angles ${\Delta}$ and ${\Psi}$ in the photon-energy range of 1.5~5.0 eV using a variable angle spectroscopic ellipsometer. The optical constants, refractive index and extinction coefficient, of ZnS were determined via the dispersion parameters extracted from the curve-fitting process based on Jellison-Modine dispersion function.

• Journal of Korean Ophthalmic Optics Society
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• v.10 no.4
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• pp.267-272
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• 2005

We deposited thin films of organic light-emitting-material $Alq_3$(alumina quinoline) on silicon and slide-glass substrates using thermal evaporation method, and measured spectra of ellipsometry angles ${\Delta}$ and ${\Psi}$ in the photon-energy range of 1.5~5.0 eV using a variable angle spectroscopic ellipsometer. The optical constants, refractive index and extinction coefficient, of $Alq_3$ were determined via the dispersion parameters extracted from the curve-fitting process based on Jellison-Modine dispersion function. The reliability of determined optical constants were verified through the comparison of measured and simulated transmittance curves and the good agreement between simulated absorption-coefficient curves and absorbance spectra measured using a spectrophotometer.

• Journal of Korean Ophthalmic Optics Society
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• v.12 no.3
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• pp.77-81
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• 2007

We sputtered $TiN_x$ (titanium nitride) thin films on silicon substrates using ultra high vacuum RF magnetron sputtering method, and measured spectra of ellipsometry angles ${\Delta}$ and ${\Psi}$ in the photon-energy range of 1.5-5.0 eV using a variable angle spectroscopic ellipsometer. The optical constants, refractive index and extinction coefficient of the $TiN_x$ films were determined via the dispersion parameters extracted from the curve-fitting process based on Drude+Lorentz oscillator dispersion function. The reliability of determined optical constants were verified through the comparison of between simulated reflectance and reflectance spectra measured using a spectrophotometer.

• Journal of Korean Ophthalmic Optics Society
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• v.9 no.1
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• pp.35-41
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• 2004

This study investigated the crystal growth, crystalline structure and the basic optical properties of $PbSnSe/BaF_2$ epilayers. The PbSnSe epilayer was grown on $BaF_2$(111) insulating substrates using a hot wall epitaxy (HWE) technique. It was found from the analysis of X-ray diffraction patterns that $PbSnSe/BaF_2$ epilayer was grown single crystal with a rock-salt structure oriented along [111] the growth direction. Using Rutherford back scattering, the atomic ratios of the PbSnSe was found to be proper stoichiometric. The best values for the full width at half maximum (FWHM) of the DCXRD was 162 arcsec for PbSnSe epilayer. The epilayer-thickness dependence of the FWHM of the DCXRD shows that the quality of the $PbSnSe/BaF_2$ is as expected. The dielectric function ${\varepsilon}(E)$ of a semiconductor is closely related to its electronic energy band structure and such relation can be drawn from features around the critical points(CPs) in the optical spectra. The real and imaginary parts(${\varepsilon}1$ and ${\varepsilon}2$) of the dielectric function ${\varepsilon}$ of PbSe were measured, and the observed spectra reveal distinct structures at energies of the E1, E2 and E3 CPs. These data are analyzed using a theoretical model known as the model dielectric function (MDF). The optical constants related to dielectric function such as the complex refractive index ($n^*=n+ik$), absorption coefficient (${\alpha}$) and normal-incidence reflectivity (R) are also presented for $PbSnSe/BaF_2$.

• Journal of Korean Ophthalmic Optics Society
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• v.5 no.1
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• pp.49-53
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• 2000

Sodium borate silicate glass of composition $10Na_2O-39B_2O_3-50SiO_2-CoO$ and $20Na_2O-14B_2O_3-65SiO_2-CoO$ were prepared by melting oxide mixtures in alumina crucible at $1210^{\circ}C$ in an electric furance in air for 2h, and then quenching in air. The dielectric behavior of the quenched glasses are the subject of the present work. Properties such as dielectric constant and resistivity as a function frequency and temperature are reported. From the dielectric spectra, the glass phase transition temperature has been found to decrease at a rate $Na_2O$ 20 mol% and the dielectric constants increase with increasing $Na_2O$ content. The frequency dependent resistivity response of glass exhibits a non-Debye type relaxation.

• Journal of Korean Ophthalmic Optics Society
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• v.6 no.1
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• pp.31-35
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• 2001

We have studied the auto-lensometer for several years in order to begin korean-made production of it and then developed the auto-lensmeter using with the personal computer. We introduce the most important principal of PSD device and the optical principal of measuring the power of the refraction of the lens by auto-lensometer and also explain the fabrication of the LED optical source system and PSD optical system. Finally, we found the power constant of our auto-lensmeter to be about 30 Diopter/mm.

• Journal of Korean Ophthalmic Optics Society
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• v.5 no.2
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• pp.181-186
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• 2000

The setup of the moir$\acute{e}$ deflectometry using the virtual grating was done, so the convergence and divergence of a pencil of ray was determined. The light source was He-Ne laser(3mW). The focal length of the first lens, the second lens being 18 mm, 250 mm respectively was used for the setup of the beam expander. The optics of the moir$\acute{e}$ deflectometry determining the vergence was used a diffraction grating(pitch = $1.6{\mu}m/line$) and a front flat reflection mirror. The effective focal length of the trial lens set was measured and compared with the theoretical value.

• Journal of Korean Ophthalmic Optics Society
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• v.7 no.2
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• pp.209-215
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• 2002

This study investigated the crystal growth, crystalline structure and the basic optical properties of $SnSe/BaF_2$ epilayers. The SnSe epilayer was grown on $BaF_2$(111) insulating substrates using a hot wall epitaxy(HWE) technique. It was found from the analysis of X-ray diffraction patterns that $SnSe/BaF_2$ epilayer was growing to single crystal with orthorhombic structure oriented [111] along the growth direction. Using Rutherford back scattering(RBS), the atomic ratios of the SnSe was found to be stoichiometric, almost 50 : 50. The best values for the full width at half maximum (FWHM) of the DCXRD was 163 arcsec for SnSe epilarer. The epilayer-thickness dependence of the FWHM of the DCXRD shows that the quality of the $SnSe/BaF_2$ is as expected. The dielectric function ${\varepsilon}$(E) of a semiconductor is closely related to its electronic energy band structure and such relation can be drawn from features around the critical points in the optical spectra. The real and imaginary parts(${\varepsilon}_1$ and ${\varepsilon}_2$) of the dielectric function ${\varepsilon}$ of SnSe were measured. These data are analyzed using a theoretical model known as the model dielectric function(MDF). The optical constants related to dielectric function such as the complex refractive index(n*-n+ik), absorption coefficient (${\alpha}$) and normal- incidence reflectivity (R) are also presented for $SnSe/BaF_2$.

• Journal of Korean Ophthalmic Optics Society
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• v.4 no.2
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• pp.97-103
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• 1999

Zinc sulfide is a ll-VI compound with a large direct band gap in the near-UV region and a promising material for blur-light emitting diode and laser diode. It was identified that the structure had zinc blonde structure through the analysis of X-ray diffraction patterns. It's lattice constant was measured to be $a_o=5.411{\AA}$. The optical absorption, photocurrent, and photoluminescence spectra were measured to investigate the optical properties of zinc sulfide single crystal. The optical energy band gap measured at room temperature was 3.61eV The energy band gap of zinc sulfide annealed in zinc vapor at $800^{\circ}C$ was lower 0.1eV than that of as-grown zinc sulfide through the analysis of the photocurrent spectra. The photoluminescence spectra were measured ranging from 30K to 293K for the two cases of as-grown and annealed zinc sulfide. As-grown ZnS single crystal had peaks at 350nm, 392nm, 465nm, and annealed zinc sulfide had peaks at 349nm.