• Journal of KIISE
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• v.43 no.8
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• pp.883-892
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• 2016

Spectrum-based fault localization (SFL) method assigns a suspicious ratio. The statement is strongly affected by a failed test case compared to a passed test case. A failed test case assigns a suspicious ratio while a passed test case reduces some parts of assigned suspicious ratio. In the absence of a failed test case, it is impossible to localize the fault. Thus, a failed test case is very important for fault localization. However, spectrum-based fault localization has difficulty in reflecting the unique characteristics of a failed test because a failed test case and a passed test case are input at the same time to calculate a suspicious ratio. This paper supplements for this limitation and suggests a test case grouping method for more accurate fault localization. In addition, this paper suggested a filtering method considering test efficiency and verified the effectiveness by applying 65 algorithms. In 90 % of whole methods, the accuracy was improved by 13% and the effectiveness was improved by 72% based on EXAM score.