• Transactions of the Korean Society of Mechanical Engineers A
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• v.24 no.4 s.175
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• pp.955-962
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• 2000

Scanning Probe Microscope (SPM) such as Scanning Tunneling Microscope (STM) and Atomic Force Microscope (AFM) was shown to be the powerful tool for nano-scale characterization of a fracture surface . AFM was used to study cross sectional profiles and dimensions of fatigue striations in 2017-T351 aluminum alloy. Their widths (SW) and heights (SH) were measured from the cross sectional profiles of three-dimension AFM images. The following results that will be helpful to understand the fatigue crack growth mechanism were obtained. (1) Coincidence of the crack growth rate with the striation width was found down to the growth rate of 10-5 mm/cycle. (2) The relation of SH=0.085(SW)1.2 was obtained. (3) The ratio of the striation height to its width SH/SW did not depend on the stress intensity factor range K and the stress ratio R. (4) Not only the SW but also the SH changed linearly with the crack tip opening displacement (CTOD) when plotted in log-log scale. From these results, the applicability of the AFM to nano-fractography is discussed.

• Proceedings of the KSME Conference
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• 2000.04a
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• pp.153-158
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• 2000

Atomic Force Microscope (AFM) was used to study cross sectional profiles and dimensions of fatigue striations in 2017-T351 aluminum alloy. Their widths (SW) and heights $(SH,\;SH_h)$ were measured from the cross sectional Profiles of three-dimension AFM images. The following results that will be helpful to understand the fatigue crack growth mechanism were obtained. (1) Coincidence of the crack growth rate with the striation width was found down to the growth rate of $10^{-5}$ mm/cycle. (2) The relation of $SH={\alpha}(SW)^{1.2}$ was obtained. (3) The ratio of the striation height to its width SH/SW and did not depend on the stress intensity factor range ${\Delta}K$ and the stress ratio R. From these results, the applicability of the AFM to nano-fractography is discussed.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.25 no.7
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• pp.1047-1054
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• 2001

Atomic Force Microscope (AFM) was used to study cross sectional profiles and dimensions of fatigue striations in 2017-T351 aluminum alloy. Their widths(SW) and heights (SH, SH(sub)h, SH(sub)ι) were measured from the cross sectional profiles of three-dimension AFM images. The following results that will be helpful to understand the fatigue crack growth mechanism were obtained. (1) The relation of SH=$\alpha$(SW)(sup)1.2 was obtained. (2) The ratio of the striation height to its width SH/SW, SH(sub)h/SW and SH(sub)ι/SW did not depend on the stress intensity factor range ΔK and the stress ratio R( =P(sub)min/P(sub)max = K(sub)min/K(sub)max). (3) Effect of precipitate on the morphology of striation was changed by the relative dimensional difference between the striation width SW and the precipitates. From these results, the applicability of the AFM to nano-fractography is discussed.