• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.12
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• pp.83-90
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• 2004

This paper proposes an efficient scan testing method for compression of test input data and reduction of test power for SOC. The proposed method determines whether some parts of a test response can be reused as a part of next input test data on the analysis of deterministic test data and its response. Our experimental results show that benchmark circuits have a high similarity between un-compacted deterministic input test data and its response. The proposed testing method achieves the average of 29.4% reduction of power dissipation based on the number of test clock and 69.7% reduction of test data for ISCAS'89 benchmark circuits.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.11
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• pp.69-77
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• 2004

An efficient board-level interconnect test algorithm is proposed considering both the ground bounce effect and the delay fault detection. The proposed algorithm is capable of IEEE 1149.1 interconnect test, negative ground bounce effect prevention, and also detects delay faults as well. The number of final test pattern set is not much different with the previous method, even our method enables to detect the delay faults in addition to the abilities the previous method guarantees.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.10 s.352
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• pp.54-60
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• 2006

In order to test the board with IEEE 1149.1 boundary scan design, the test sequence must be applied as the bit stream However it is very tedious job to generate the test bit sequence since it requires the complete hlowledge about the 1149.1. This fuper introduces a convenient PCI/USB interface controller, named as Test-Ready PCI (TRPCI) ard Test-Ready USB (TRUSB). Test Bus Controller has been developed by TI and Lucent aiming to generate the test bit stream as an instruction level, thus even the novice test engineer can easily generate the test sequence.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.2 s.332
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• pp.73-82
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• 2005

Test data volume and power consumption for scan vectors are two major problems in system-on-a-chip testing. Therefore, this paper proposes a new test data compression/decompression method for low power testing. The method is based on analyzing the factors that influence test parameters: compression ratio, power reduction and hardware overhead. To improve the compression ratio and the power reduction ratio, the proposed method is based on Modified Statistical Coding (MSC), Input Reduction (IR) scheme and the algorithms of reordering scan flip-flops and reordering test pattern sequence in a preprocessing step. Unlike previous approaches using the CSR architecture, the proposed method is to compress original test data, not $T_{diff}$, and decompress the compressed test data without the CSR architecture. Therefore, the proposed method leads to better compression ratio with lower hardware overhead and lower power consumption than previous works. An experimental comparison on ISCAS '89 benchmark circuits validates the proposed method.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.8 no.2
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• pp.201-206
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• 2007

In this paper, we propose the efficient low power test methodology of NoC(Network-on chip) for the test of core-based systems that use this platform. To reduce the power consumption of transferring data through router channel, the scan vectors are partitioned into flits by channel width. The don't cares in unspecified scan vectors are mapped to binary values to minimize the switching rate between flits. Experimental results for full-scanned versions of ISCAS 89 benchmark circuits show that the proposed method leads to about 35% reduction in test power.

• Proceedings of the KIEE Conference
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• 1999.11c
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• pp.833-835
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• 1999

지연 고장 테스트는 디지털 회로의 정확한 동작을 보장하기 위해서 필수적이다. 그러나 순차 회로에는 상태 레지스터들이 존재하기 때문에, 지연 고장을 검출하는 것이 쉽지 않다. 이러한 난점을 해결하기 위해 본 논문에서는 역기능적 지정 방법을 좀 더 효율적으로 적용할 수 있는 테스트 알고리듬을 제안한다. ISCAS89 벤치마크 회로에 대한 실험 결과, 테스트 가능한 경로의 수를 기존의 스캔 기법들에 비해 크게 향상시킬 수 있다는 것을 알 수 있다.

• The Transactions of the Korean Institute of Electrical Engineers D
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• v.52 no.3
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• pp.156-162
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• 2003

For a System-on-a-Chip(SoC) comprised of multiple IP cores, various design techniques have been proposed to provide diverse test link configurations. In this paper, we introduce a new instruction based Wrapped Core Linking Module(WCLM) that enables systematic integration of IEEE 1149.1 TAP'd cotes and P1500 wrapped cores with requiring least amount of area overhead compared with other state-of-art techniques. The design preserves compatibility with standards and scalability for hierarchical access.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.4 no.3
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• pp.209-216
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• 2011

Recently the design of SoCs(System-on-Chips) in which TCM is embedded for high speed operation increases rapidly. In this paper, a parallel test structure for eDRAM-based TCM embedded in SoCs is proposed. In the presented technique, the MUT (Memory Under Test) is changed to parallel structure and it increases testability of MUT with boundary scan chains. The eDRAM is designed in structure for parallel test so that it can be tested for each modules. Dynamic test can be performed based on input-output data. The proposed techniques are verified their performance by circuits simulation.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.3
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• pp.65-70
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• 2004

The SOC(System on Chip) testing has required the core re-use methodology and the efficiency of test method because of increase of its cost. The goal of SOC testing is to minimize the testing time, area overhead, and power consumption during testing. Prior research has concentrated on only one aspect of the test core wrapper design problem at a test time. Our research is concentrated on optimization of test time and area overhead for the core test wrapper, which is one of the important elements for SOC test architecture. In this paper, we propose an efficient wrapper design algorithm that improves on earlier approaches by also reducing the TAM(Test Access Mechanism) width required to achieve these lower testing times.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.47 no.2
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• pp.77-86
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• 2010

This paper presents an efficient secure scan design technique which is based on a fake key and IEEE 1149.1 instruction to protect secret key from scan-based side channel attack for an Advanced Encryption Standard (AES) core embedded on an System-on-a-Chip (SoC). Our proposed secure scan design technique can be applied to crypto IP core which is optimized for applications without the IP core modification. The IEEE 1149.1 standard is kept, and low area, low power consumption, very robust secret-key protection and high fault coverage can be achieved compared to the existing methods.