• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.9
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• pp.45-54
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• 2002

This paper proposes serial test data compression, a novel DFT scheme for embedded cores in SOC. To reduce test data amounts, share bit compression and fault undetectable fault pattern compression techniques was used. A Circuits using serial test data compression method are derived from a scan DFT method including a test-per-clock technique. For an experiment of the proposed compression method, full scan versions of ISCASS85 and ISCASS89 were used. ATALANTA has been used for ATPG and fault simulation. The amount of test data has been reduced by maximum 98% comparing with original data.

• The Journal of the Korea Contents Association
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• v.5 no.4
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• pp.188-196
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• 2005

This paper presents a new test data compression and low power scan test method that can reduce test time and power consumption. A proposed method can reduce the scan-in power and test data volume using a modified scan cell reordering algorithm and hybrid adaptive encoding method. Hybrid test data compression method uses adaptively the Golomb codes and run-length codes according to length of runs in test data, which can reduce efficiently the test data volume compare to previous method. We apply a scan cell reordering technique to minimize the column hamming distance in scan vectors, which can reduce the scan-in power consumption and test data. Experimental results for ISCAS 89 benchmark circuits show that reduced test data and low power scan testing can be achieved in all cases. The proposed method showed an about a 17%-26% better compression ratio, 8%-22% better average power consumption and 13%-60% better peak power consumption than that of previous method.

• Journal of KIISE:Computer Systems and Theory
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• v.26 no.9
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• pp.1177-1184
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• 1999

본 논문에서는 스캔플립프롭 선택 시간이 짧고 높은 고장 검출률(fault coverage)을 얻을 수 있는 새로운 부분스캔 설계 기술을 제안한다. 순차회로에서 테스트패턴 생성을 용이하게 하기 위하여 완전스캔 및 부분스캔 설계 기술이 널리 이용되고 있다. 스캔 설계로 인한 추가영역을 최소화 하고 최대의 고장 검출률을 목표로 하는 부분스캔 기술은 크게 구조분석과 테스트 가능도(testability)에 의한 설계 기술로 나누어 볼 수 있다. 구조분석에 의한 부분스캔은 짧은 시간에 스캔플립프롭을 선택할 수 있지만 고장 검출률은 낮다. 반면 테스트 가능도에 의한 부분스캔은 구조분석에 의한 부분스캔보다 스캔플립프롭의 선택 시간이 많이 걸리는 단점이 있지만 높은 고장 검출률을 나타낸다. 본 논문에서는 구조분석에 의한 부분스캔과 테스트 가능도에 의한 부분스캔 설계 기술의 장단점을 비교.분석하여 통합함으로써 스캔플립프롭 선택 시간을 단축하고 고장 검출률을 높일 수 있는 새로운 부분스캔 설계 기술을 제안한다. 실험결과 대부분의 ISCAS89 벤치마크 회로에서 스캔플립프롭 선택 시간은 현격히 감소하였고 비교적 높은 고장 검출률을 나타내었다.Abstract This paper provides a new partial scan design technique which not only reduces the time for selecting scan flip-flops but also improves fault coverage. To simplify the problem of the test pattern generation in the sequential circuits, full scan and partial scan design techniques have been widely adopted. The partial scan techniques which aim at minimizing the area overhead while maximizing the fault coverage, can be classified into the techniques based on structural analysis and testabilities. In case of the partial scan by structural analysis, it does not take much time to select scan flip-flops, but fault coverage is low. On the other hand, although the partial scan by testabilities generally results in high fault coverage, it requires more time to select scan flip-flops than the former method. In this paper, we analyzed and unified the strengths of the techniques by structural analysis and by testabilities. The new partial scan design technique not only reduces the time for selecting scan flip-flops but also improves fault coverage. Test results demonstrate the remarkable reduction of the time to select the scan flip-flops and high fault coverage in most ISCAS89 benchmark circuits.

• Journal of the Institute of Electronics and Information Engineers
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• v.52 no.6
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• pp.70-76
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• 2015

This paper introduces an FPGA self-test architecture reusing FPGA boundary scan chain as self-test circuits. An FPGA boundary scan cell is two or three times bigger than a normal boundary scan cell because it is used for configuring the function of input/output pins functions as well as testing and debugging. Accordingly, we analyze the architecture of an FPGA boundary scan cell in detail and design a set of built-in self-test (BIST) circuits in which FPGA boundary scan chain and a small amount of FPGA logic elements. By reusing FPGA boundary scan chain for self-test, we can reduce area overhead and perform a processor based on-board FPGA testing/monitoring. Experimental results show the area overhead comparison and simulation results.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.10
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• pp.45-51
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• 2003

In this paper, a scan-based low power BIST (Built-In Self-Test) architecture is proposed. The proposed architecture is based on STUMPS, which uses a LFSR (Linear Feedback Shift Register) as the test generator, a MISR(Multiple Input Shift Register) as the reponse compactor, and SRL(Shift Register Latch) channels as multiple scan paths. In the proposed BIST a degenerate MISR structure is used for every SRL channel; this offers reduced area overheads and has less impact on performance than the STUMPS techniques. The proposed BIST is designed to support both test-per-clock and test-per-scan techniques, and in test-per-scan the total power consumption of the circuit can be reduced dramatically by suppressing the effects of scan data on the circuits. Results of the experiments on ISCAS 89 benchmark circuits show that this architecture is also suitable for detecting path delay faults, when the hamming distance of the data in the SRL channel is considered.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.3
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• pp.26-31
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• 2009

A new LFSR based test compression scheme is proposed by reducing the maximum number of specified bits in the test cube set, smax, virtually. The performance of a conventional LFSR reseeding scheme highly depends on smax. In this paper, by using different clock frequencies between an LFSR and scan chains, and grouping the scan cells, we could reduce smax virtually. H the clock frequency which is slower than the clock frequency for the scan chain by n times is used for LFSR, successive n scan cells are filled with the same data; such that the number of specified bits can be reduced with an efficient grouping of scan cells. Since the efficiency of the proposed scheme depends on the grouping mechanism, a new graph-based scan cell grouping heuristic has been proposed. The simulation results on the largest ISCAS 89 benchmark circuit show that the proposed scheme requires less memory storage with significantly smaller area overhead compared to the previous test compression schemes.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.38 no.8
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• pp.72-84
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• 2001

The timings of all computational elements in the micropipeline circuits are important. The previous researches on path delay testing using scan methods make little account of the characteristic of the path delay tests that the second test pattern must be more controllable. In this paper, a new scan latch is proposed which is suitable to path delay testing of the micropipelines and has small area overhead. Results show that path delay faults in the micropipeline circuits using the new scan are testable robustly and the fault coverage is higher than the previous researches. In addition, the new scan latch for path delay faults testing in the micropipeline circuits can be easily expanded to the applications such as BIST for stuck-at faults.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.8
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• pp.9-16
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• 2004

For a System-on-a-Chip(SoC) comprised of multiple IP cores, test control techniques have been developed to perform the internal and external test efficiently relying on the various design for testability techniques such as scan and BIST(Built-In Self-Test). However the test area overhead is too expensive to guarantee diverse test link configurations. In this paper, at first we introduce a new flag based Wrapped Core Linking Module(WCLM) that enables systematic integration of IEEE 1149.1 TAP'd cores and P1500 wrapped cores. Then a simple test control technique, which can interconnect internal scan chains of different cores, is described with requiring least amount of area overhead compared with other state-of-art techniques. The design preserves compatibility with standards and scalability for hierarchical access.

• Journal of KIISE:Computer Systems and Theory
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• v.28 no.5
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• pp.259-267
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• 2001

칩의 집적도에 비례하여 설계검증 및 칩 제작 후의 결함점검은 갈수록 어려워지며 이러한 테스트 문제의 원초적 해결을 위하여 다양한 테스트설계 기술이 널리 개발되고 있다. 상위 수준의 테스트설계에서는 회로의 기능에 대해서는 알 수 있으나 구조에 대해서는 알 수 없고, 하위 수준의 테스트설계에서는 회로의 구조를 알 수 있으나 기능은 알 수 없다. 따라서 테스트 설계는 기능을 기술하는 상위 수준에서부터 고려되어 하위 게이트수준에서 스캔플립플롭을 선택하여야 최적화된 성능을 얻을 수 있다. 본 논문에서는 테스트용이도를 증진시키기 위해, 상위수준의 기능정보에 대해서는 테스트점을 삽입하여 제어흐름(control flow)을 변경하고, 상위 수준의 합성 후에 하위 수준에서 스캔플립플롭을 선택하여 다시 합성하는 상위.하위 수준에서 통합된 테스트 합성 기술을 제안한다. 실험결과 통합된 테스트 합성 기술이 대부분의 벤치마크 회로에서 높은 고장검출율을 보여주고 있다.

• 전자공학회논문지 IE
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• v.45 no.3
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• pp.5-12
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• 2008

We propose efficient scan testing method capable of reducing the test data and power dissipation for digital logic circuits. The proposed testing method is based on a hybrid run-length encoding which reduces test data storage on the tester. We also introduce modified Bus-invert coding method and scan cell design in scan cell reordering, thus providing increased power saving in scan in operation. Experimental results for ISCAS'89 benchmark circuits show that average power of 96.7% and peak power of 84% are reduced on the average without fault coverage degrading. We have obtained a high reduction of 78.2% on the test data compared the existing compression methods.