• 제목/요약/키워드: 스캐닝 프로프

검색결과 1건 처리시간 0.014초

OMM 시스템에서의 측정오차 해석 (The Analysis of Measuring Error in OMM System)

  • 이상준;김선호;김옥현
    • 한국정밀공학회지
    • /
    • 제15권5호
    • /
    • pp.34-42
    • /
    • 1998
  • This paper describes an analysis of measuring error of on the machine measuring(OMM) system which directly measures machined surface dimensions using scanning probe on a CNC milling machine. 21 inch TV shadow mask mould clamped to a pallet was measured using PTP(point to point) measuring algorithm in OMM system and the results were compared with those using coordinate measuring machine(CMM). The OMM error was evaluated by probe error, stylus contact error, center shift error, repeatability, work-piece clamping error and etc. The results show that elastic deformation of the pallet is most affecting factor on the measuring error, thus pallet design and clamping method need very careful cosiderations.

  • PDF