• Title/Summary/Keyword: 수명예측장치

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High Efficiency Life Prediction and Exception Processing Method of NAND Flash Memory-based Storage using Gradient Descent Method (경사하강법을 이용한 낸드 플래시 메모리기반 저장 장치의 고효율 수명 예측 및 예외처리 방법)

  • Lee, Hyun-Seob
    • Journal of Convergence for Information Technology
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    • v.11 no.11
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    • pp.44-50
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    • 2021
  • Recently, enterprise storage systems that require large-capacity storage devices to accommodate big data have used large-capacity flash memory-based storage devices with high density compared to cost and size. This paper proposes a high-efficiency life prediction method with slope descent to maximize the life of flash memory media that directly affects the reliability and usability of large enterprise storage devices. To this end, this paper proposes the structure of a matrix for storing metadata for learning the frequency of defects and proposes a cost model using metadata. It also proposes a life expectancy prediction policy in exceptional situations when defects outside the learned range occur. Lastly, it was verified through simulation that a method proposed by this paper can maximize its life compared to a life prediction method based on the fixed number of times and the life prediction method based on the remaining ratio of spare blocks, which has been used to predict the life of flash memory.

A method for optimizing lifetime prediction of a storage device using the frequency of occurrence of defects in NAND flash memory (낸드 플래시 메모리의 불량 발생빈도를 이용한 저장장치의 수명 예측 최적화 방법)

  • Lee, Hyun-Seob
    • Journal of Internet of Things and Convergence
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    • v.7 no.4
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    • pp.9-14
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    • 2021
  • In computing systems that require high reliability, the method of predicting the lifetime of a storage device is one of the important factors for system management because it can maximize usability as well as data protection. The life of a solid state drive (SSD) that has recently been used as a storage device in several storage systems is linked to the life of the NAND flash memory that constitutes it. Therefore, in a storage system configured using an SSD, a method of accurately and efficiently predicting the lifespan of a NAND flash memory is required. In this paper, a method for optimizing the lifetime prediction of a flash memory-based storage device using the frequency of NAND flash memory failure is proposed. For this, we design a cost matrix to collect the frequency of defects that occur when processing data in units of Drive Writes Per Day (DWPD). In addition, a method of predicting the remaining cost to the slope where the life-long finish occurs using the Gradient Descent method is proposed. Finally, we proved the excellence of the proposed idea when any defect occurs with simulation.

A Study of assessment criteria and lifetime prediction for power supply of electrodeless fluorescent lamp (무전극형광램프용 전원장치의 평가기준 및 수명예측)

  • Ham, Jung-Keol;Shin, Jong-Wook
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 2004.11a
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    • pp.25-30
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    • 2004
  • This paper gives an assessment criteria and average failure lifetime prediction for power supply of electrodeless fluorescent lamp. The paper present electric appliance safety standard and performance standard for power supply of electrodeless fluorescent lamp. also, It presents the Failure Rate or Mean Time To Failure(MTTF) for power supply of electrodeless fluorescent lamp. We suggest the assessment criteria and improve methods of the reliability on the design basis for the electrodeless fluorescent system.

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A Study of assessment criteria and reliability improvement for power supply of electrodeless fluorescent lamp (고효율 무전극형광등용 전원장치의 평가기준 및 신뢰성향상 연구)

  • 함증걸;신종욱
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.17 no.2
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    • pp.34-40
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    • 2003
  • This paper gives an assessment criteria and reliability improvement for high frequency power supply of high efficacy electrodeless fluorescent lamp. The electrodeless fluorescent lamp system consist of electrodeless fluorescent lamp, high frequency power supply and lighting fixtures. The high frequency power supply has a shortest life at the system. Therefore It is need th assess the Failure Rate or mean Time To Failure(MTTF) for the high frequency power supply of electrodeless fluorescent lamp system and improve the reliability at design. We suggest the assessment criteria and improve methods of the reliability on the design basis for the electodeless fluorescent system.

기계장치의 잔존수명예측 및 평가

  • 김건영
    • Journal of the KSME
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    • v.30 no.2
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    • pp.163-171
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    • 1990
  • 기계 구조물의 수명예측 및 평가에 대하여 기초이론과 실례를 중심으로 기술하였다. 기계설비의 파손방지 및 수명예측, 평가기술은 학문적으로나 산업분야에서나 종합적이므로 제작자, 설계자, 사용자, 연구자, 기술자 등이 서로 긴밀한 협력체제를 구축하여 지속적으로 설계, 재료, 운전, 시험, 검사, 보수 등 각자의 전문분야를 조화 있게 연구개발 하여야만 문제를 해결 할 수 있다는 뜻이다. 따라서 관련종사자는 협력체제를 설비 및 기업특성에 맞게 구축하는 것이 가장 중요하고 시급한 과제이다.

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Lifetime Prediction of PTFE Electrical Insulation Material Using Thermal Analysis Technique (열분석장치를 적용한 PTFE 전기절연재의 수명 예측 연구)

  • Yoon, Sung-Ho
    • Proceedings of the Korean Society of Propulsion Engineers Conference
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    • 2011.04a
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    • pp.296-297
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    • 2011
  • A series of thermogravimetric analysis tests were conducted to predict the lifetime of the PTFE electrical insulation material. The prepared PTFE samples were heated from $25^{\circ}C$ to $700^{\circ}C$ at different heating rates. The kinetic energy of the PTFE was calculated from the logarithmic heating rate versus reciprocal temperature curves at constant conversion levels. Also, the lifetime of the PTFE for a given operating temperature can be predicted using the relationship between the activation energy and the estimated lifetime proposed by Toop.

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Fault Diagnosis Technology of Power Supply Insulation System in Metro Substation (도시철도 절연기기의 진단데이터 획득 기술)

  • Park, Young;Jung, Ho-Sung;Kim, Hyung-Chul;Oh, Seok-Yong;Song, Joon-Tae
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.06a
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    • pp.266-266
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    • 2009
  • This paper describes important parameters used to evaluate the insulation performance of power supply components in metro substations. For online fault diagnosis of power supply components, we have developed a new remote condition monitoring system using wireless technology. Our developed system can continuously monitor electric power equipment such as transformers, circuit brakers, and rectifiers and have powerful wireless networking functions.

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화력발전용 보일러 튜브의 수명평가

  • 김건영
    • Journal of the KSME
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    • v.32 no.4
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    • pp.335-339
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    • 1992
  • 보일러 튜브의 열화원인에 근거하여 수명을 평가하는 방법 중 실제 현장에서 실용화되고 있는 방법들에 대하여 개략적이나마 기술하여 개념을 정립코자 하였다. 그러나 실제 보일러는 설비가 방대할 뿐만 아니라 사용조건이 가혹하여 수명예측을 위한 평가기술만으로 설비를 사고없이 안 전하게 운용하기는 대단히 힘들다. 또한 기술분야도 재료, 강도, 설계, 부식, 연소 등 대단히 광 범위하여 많은 관련자를 필요로 하므로 설계자, 제작자, 사용자, 연구자 및 기능 분야 등이 독 립적이고 종합적인 협조하에서만 사고를 예방할 수 있다. 따라서 경년열화 및 수명평가 연구에 관심이 있는 각 분야의 종사자들이 꾸준히 함께 노력 할 때만이 우리 나라 장치산업의 운용기술 축적이 가능하리라 여기며 상호간의 노력을 다짐한다.

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Conceptual Design for Lifetime Test System for LED Headlamps on Rolling Stock (철도차량용 LED전조등의 수명시험 장치 구축을 위한 개념설계)

  • Ohn, Jung-Ghun;Jeong, Ki-Seok;Chung, Jong-Duk
    • Journal of the Korean Society for Railway
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    • v.18 no.2
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    • pp.111-116
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    • 2015
  • LED luminaires as a lighting system have attracted much research attention due to their high efficiency and long lifetimes. However, disappointing outcomes have been noted in terms of performance levels and lifetimes as compared to desired system requirements in practice due to certain electrical and thermal characteristics of LEDs. LM-80 and TM-21 established by IESNA are the best known standards for lifetime test procedures and estimation techniques. However, they only handle LED light sources without guaranteeing the LED luminaire in a reliability test. They also operate for more than 6,000 hours and undergo various stresses, such as the operating current and temperature. Therefore, a lifetime standard for LED luminaires has not yet been established. This paper proposes a conceptual design of a lifetime test system for LED headlamps depending on the operating environment. Eventually, this method can assist with evaluations of the validity of lifetime standard tests of LED headlamps.

Fatigue Test and Evaluation of Landing Gear (착륙장치 피로 시험평가)

  • Lee, Sang-Wook;Lee, Seung-Gyu;Shin, Jeong-Woo;Kim, Tae-Uk;Kim, Sung-Chan;Hwang, In-Hee;Lee, Je-Dong
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.36 no.10
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    • pp.1181-1187
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    • 2012
  • For the fatigue design of aircraft landing gear, the safe-life approach is applied. Structural defects such as cracks or detrimental deformations should not occur under the fatigue load spectrum depicting the entire lifetime usage of the aircraft. In the design phase, the fatigue life of the landing gear is estimated analytically by adopting the stress-based approach because the fatigue of aircraft landing gear is generally high-cycle fatigue. This utilizes S-N curves that are factored to produce design curves that account for the scatter and surface finish of the material. In the test and evaluation phases, a fatigue test should be conducted for full-scale landing gear to substantiate the fatigue design requirement in the end. In this study, the procedure for the fatigue test and evaluation of aircraft landing gear is presented with real application cases.