• The KIPS Transactions:PartD
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• v.15D no.3
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• pp.313-320
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• 2008

A typical software development life cycle consists of a series of phases, each of which has some ability to insert and detect defects. To achieve desired quality, we should progress the defect removal with the all phases of the software development. The well-known model of phase-based defect profile is Gaffney model. This model assumes that the defect removal profile follows Rayleigh curve and uses the parameters as the phase index number. However, these is a problem that the location parameter cannot present the peak point of removed defects when you apply Gaffney model to the actual situation. Therefore, Gaffney model failed to represent the actual defect profile. This paper suggests two different models: One is modified Gaffney model that introduce the parameter of Putnam's SLIM model to replace of the location parameter, the other is the growth function model because the cumulative defect profile shows S-shaped. Suggested model is analyzed and verified by the defect profile sets that are obtained from 5 different software projects. We could see from the experiment, the suggested model performed better result than Gaffney model.