• Title/Summary/Keyword: 비유전손율

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A Study on the Dielectric Characteristics of Si-Doped ZNR (Si가 첨가된 ZNR의 유전특성에 관한 연구)

  • Nam, Chun-U;Jeong, Sun-Cheol
    • Korean Journal of Materials Research
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    • v.7 no.12
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    • pp.1033-1040
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    • 1997
  • Si가 첨가된 ZNR의 겉보기 유전상구, 겉보기 비유전손율, 유전비저항의 주파수 특성을 여러 측정온도에서 조사하였다. 모든 ZNR에 대하여 유전분산현상 및 유전흡수현상이 뚜렷이 나타났으며, 비슷한 경향의 유전성질을 나타냈다. SiO$_{2}$첨가량이 증가함에 따라 겉보기 유전상수, 피이크 겉보기 비유전손율은 감소하였으며, 유전비저항은 증가하였다. 온도상승시 겉보기 유전상수, 피이크 겉보기 비유전손율은 증가하였으며, 흡수 피이크 주파수는 고주파측으로 이동하였다. SiO$_{2}$첨가량이 증가함에 따라 ZNR은 Cole-Cole원호에서 0.68-0.72범위 내에서 증가하는 $\beta$값을 가지며, 완화시간의 분포가 좁아지는 유전특성을 나타냈다.

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Microstructure and Electrical Properties of $SiO_2$-Doped Zinc Oxide Varistors ($SiO_2$가 첨가된 산화아연 바리스터의 미세구조 및 전기적 특성)

  • 남춘우;정순철
    • Electrical & Electronic Materials
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    • v.10 no.7
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    • pp.659-667
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    • 1997
  • The influence of SiO$_2$on the microstructure and electrical properties of zinc oxide varistor was investigated. Zn$_2$SiO$_4$third phase in the sintered body was found at grain boundaries, multiple grain junctions, and occasionally within ZnO grains. This phase acted as a grain growth inhibitor, which retard the grain growth of the ZnO matrix by impeding migration on the grain boundaries. As SiO$_2$ addition increases, average grain size decreased from 40.6${\mu}{\textrm}{m}$ to 26.9${\mu}{\textrm}{m}$ due to the pinning effect by Zn$_2$SiO$_4$ and drag effect by Si segregation at grain boundaries, the breakdown voltage consequently increased. When SiO$_2$ addition is increased, interface state density decreased, however, the barrier height increased by decrease of donor concentration, as a result, the nonlinear exponent increased and leakage current decreased. While, as SiO$_2$ addition increase, it was found that the apparent dielectric loss factor shows a tendency of decrease. Wholly, electrical properties of zinc oxide varistor can be said to be improved by SiO$_2$addition.

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