• Title/Summary/Keyword: 반알렌

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정보 마당

  • Korea Radioisotope Association
    • 동위원소뉴스
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    • no.1 s.97
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    • pp.9-11
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    • 2005
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Algorithm to cope with SEUs(Single Event Upsets) on STSAT-1 OBC(On-board Computer) (과학기술위성 1호 탑재 컴퓨터(On-board Computer)에서의 SEUs(Single Event Upsets) 극복 알고리즘)

  • Chung, Sung-In;Park, Hong-Young;Lee, Heung-Ho
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.45 no.10
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    • pp.10-16
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    • 2008
  • Generally, the satellite circling round in a low orbit goes through Van Allen belt connecting with the magnetic fold, in which electronic components are easily damaged and shortened by charged particles moving in a cycle between the South Pole and the North Pole. In particular, Single Event Upset(SEU) by radiation could cause electronic device on satellite to malfunction. Based on the idea mentioned above, this study considersabout SEU effect on the On-board Computer(OBC) of STSAT-1 in the space environment radiation, and shows algorithm to cope with SEUs. In this experiment, it also is shown that the repetitive memory read/write operation called memory wash is needed to prevent the accumulation of SEUs and the choice for the period of memory wash is examined. In conclusion, it is expected that this research not only contributes to understand low capacity of On-board Computer(OBC) on Low Earth Orbit satellite(LEOS) and SaTReC Technology satellite(STSAT) series, but also makes good use of each module development of Korea Multi-Purpose Satellite(COMPSAT) series.

A study on the radiation effect of silicon solar cells in a low Earth orbit satellite by using high energy electron beams (고에너지 전자빔을 이용하여 저궤도 인공위성의 실리콘 태양센서의 내방사선 특성 연구)

  • Chung, Sung-In;Lee, Jae-Jin;Lee, Heung-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.45 no.3
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    • pp.1-5
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    • 2008
  • This paper analyzes on the radiation effect of silicon solar cells in a low Earth orbit satellite by using high energy electron beams. Generally, the satellite circling round in a low orbit go through Van Allen belt, in which electronic components are easily damaged and shortened by charged particles moving in a cycle between the South Pole and the North Pole. For example, Single Event Upset (SEU) by radiation could cause electronic devices on satellite to malfunction. From the ground experiment in which we used the high energy electron beam facility at Knrea Atomic Energy Research Institute (KAERI), we tried to explain sun sensor degradations on orbit could he caused by high energy electrons. While we focused on the solar cells used for light detectors, We convince our research also contributes to understand the radiation effect of solar cells generating electric powers on satellites.