• Title/Summary/Keyword: 띠 굽힘 시험

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Mechanical characterization of 100 nm-thick Au thin film using strip bending test (띠 굽힘 시험을 통한 100 nm 두께 금 박막의 기계적 특성 평가)

  • Kim, J.H.;Lee, H.J.;Han, S.W.;Baek, C.W.;Kim, J.M.;Kim, Y.K.
    • Proceedings of the KSME Conference
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    • 2004.04a
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    • pp.252-257
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    • 2004

  • Nanometer-sized structures are being applied to many devices including micro/nano electronics, optoelectronics, quantum devices, MEMS/NEMS, biosensors, etc. Especially, the thin film with submicron thickness is a basic structure for fabricating these devices, but its mechanical behaviors are not well understood. The mechanical properties of the thin film are different from those of the bulk structure and are difficult to measure because of its handling inconvenience. Several techniques have been applied to mechanical characterization of the thin film, such as nanoindentation test, micro/nano tensile test, strip bending test, etc. In this study, we focus on the strip bending test because of its high accuracy and moderate specimen preparation efforts, and measure Au thin film, which is a very popular material in micro/nano electronic devices. Au film is deposited on Si substrate by evaporation process, of which thickness is 100nm. Using the strip bending test, we obtain elastic modulus, yield and ultimate tensile strength, and residual stress of Au thin film.

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