• The monthly packaging world
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• s.143
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• pp.57-66
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• 2005

• The monthly packaging world
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• s.143
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• pp.70-71
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• 2005

• The monthly packaging world
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• s.143
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• pp.72-75
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• 2005

• The monthly packaging world
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• s.143
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• pp.76-78
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• 2005

• The monthly packaging world
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• s.101
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• pp.90-92
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• 2001

• The monthly packaging world
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• s.95
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• pp.104-108
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• 2001

• 전기의세계
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• v.16 no.4
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• pp.19-23
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• 1967

금성사는 전기, 전자, 통신기술뿐 아니라 기계, 금속화공등 각종전문기술의 총합으로 이루어진 회사인만큼 실험설비나 측정기구도 다양다종하기 이를바 없다. 그러므로 여기서는 다만 가전기기공장 시설중에서 대표적인것만 한종류씩 들어서 간단히 소개하고저 한다.

• Korean Journal of Optics and Photonics
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• v.15 no.4
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• pp.331-336
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• 2004

The phase change due to the reflection from target surfaces in a white-light interferometer induces measurement errors when target surfaces are composed of dissimilar materials. We prove that this phase change on reflection as the polarization of the white-light changes causes a shift of both envelope peak position and fringe peak position of several tens of nanometers as the polarization of the white-light changes. In addition, we propose a new equation for white-light interference fringes depending on the polarization of the source.

• Journal of the Korean Society of Costume
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• v.58 no.9
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• pp.129-141
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• 2008

Jikgeum(woven with supplementary golden wefts) hyungbae(rank badge) of danryung(official uniform) excavated from Im Backryung'tomb($1498{\sim}1546$) of the Joseon dynasty($1392{\sim}1910$) at Goyang, Gyunggi-Do in 2007, was in a critical condition because of serious collapse of substrate in metal thread. For conservation of hyungbae, metal thread was examined by different scientific methods(Light Microscope, Scanning Electron Microscope and Energy Dispersive X-Rray Spectrometry(SEM-EDS), Fourier Transform Infrared Spectroscopy(FT-IR)). Analytical data showed that metal thread was gilt membrane strip composed of gold leaves and proteinaceous substrate which was probably parchment. To protect collapse of substrate, 1% solution of Paraloid B-72 was infilterated into substrate for consolidation of substrate and it was adhered to warp of fabric in hyungbae, before wet cleaning. After wet cleaning, the most of the gold leaves were restored, which was confirmed by both the examination with the naked eye and the microscopic examination.

• Journal of the Korean Vacuum Society
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• v.8 no.1
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• pp.13-19
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• 1999

Total reflection X-ray fluorescence spectroscopy using synchrotron radiation source called as TRSFA was explored to achieve high sensitivities to impurity metals on Si wafer surface. It consists of monochromating part to select a specific wavelength, slit part to shield direct beam and to control monochromated beam, and main chamber to dectect fluorescent X-ray counts of impurities on si wafer. Monochromated X-ray of 10.90 KeV was selected and the optimum total reflection condition on silicon wafer was obtained through tuning the dead time and fluorescent X-ray count of Si and Fe. TRSFA system could increase the sensitivity as high as 50 times in comparision with TRXFA using normal X-ray source. But the trend was varied since the surface conditions of Si wafers and, therefore, the reflectivities were different. Furthemore, there seems to be a promising path to reaching a detection limit useful to the next generation metal impurities control, because Fe impurity below to the $5\times10^{9}\textrm{atomas/cm}^2$ can be detectable through the developed TRSFA system.