• Korean Journal of Optics and Photonics
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• v.28 no.6
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• pp.281-289
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• 2017

In the present research, the optical measurement error induced by vibration of the optical measurement tower for large mirrors at KRISS (Korea Research Institute of Standards and Science) is investigated. The vibrations of the tower structure, the interferometer, and the null lens are measured while the surface errors of the 600-mm-diameter on-axis aspheric mirror are measuring, under various environmental conditions. The increase of surface error induced by alignment error with respect to vibration is analyzed. As a result, the interferometer and the null lens, which are located on the top of the tower, are highly sensitive to vibration. Additionally, the surface error of the mirror is strongly increased when the vibration directions of the interferometer and the null lens are different. To reduce the alignment error and the surface error induced by vibration, the tower structure should be improved, to be insensitive to low-frequency vibration. Alternatively, optical measuring under stable conditions by vibration monitoring can improve the reliability of the surface error measurement.

• The Optical Journal
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• s.150
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• pp.42-43
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• 2014

CODE V$^{(R)}$, Light Tools S/W 및 광학측정 업체인 (주)모던하이테크(대표이사 김명중)는 3월 17일(월)부터 19일(수)까지 사흘간 (주) 모던하이테크 세미나실(서울시 강남구 영동대로 511 무역센터 트레이드타워 1002호)에서 미국 ORA 광학 설계 프로그램 기술 매니저가 직접 내한하여 광학설계 특별 교육 세미나를 성공적으로 개최했다.

• Proceedings of the Optical Society of Korea Conference
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• 2006.02a
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• pp.277-278
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• 2006

• Korean Journal of Optics and Photonics
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• v.8 no.4
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• pp.277-282
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• 1997

The complex refractive index of Diamond-like Carbon (DLC) thin films, which can be applied to optical devices or electrical devices, have been determined using optical methods. DLC thin films are grown on Si(100) substrates and vitreous silica substrates respectively, using the technique of plasma enhanced chemical vapor deposition (PECVD). The spectroscopic ellipsometry data($\psi$, $\Delta$) and the transmission spectra of these DLC films are obtained. These optical spectra are analyzed with the help of the Sellmeier dipersion relation and a quantum mechanically derived dispersion relation. Using spectroscopic ellipsometry data at their transparent region, the refractive index and the effective thickness of DLC films on vitreous silica are model calculated, Then the transmission spectra are inverted to yield the extinction coefficient spectra k(λ) at absorbing region. These spectra are fit to the quantum mechanical dispersion relation and the best fit dispersion constants are determined. The complex refractive indices are easily calculated with these constants. The spectroscopic ellipsometry data at the absorbing region in model calculated to give the packing densities and the degrees of surface microroughness of DLC films. Discussions are made in correlation with the growth condition of DLC films.