• 제목/요약/키워드: 공초점현미경

검색결과 184건 처리시간 0.028초

공초점 현미경을 이용한 마이크로믹서 내부의 3차원 이미지화 (3-D Imaging in a Chaotic Micromixer Using Confocal Laser Scanning Microscopy (CLSM))

  • 김현동;김경천
    • 한국가시화정보학회:학술대회논문집
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    • 한국가시화정보학회 2006년도 추계학술대회 논문집
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    • pp.96-101
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    • 2006

  • 3-D visualization using confocal laser scanning microscopy (CLSM) in a chaotic micromixer was performed as a reproduction experiment and the feasibility of 3-0 imaging technique in the microscale was confirmed. For diagonal micromixer (DM) and two types of staggered herringbone micromixers (SHM) designed by Whitesides et al., to verify the evolution of mixing, cross sectional images are reconstructed at the end of every cycle. In a DM, clockwise rotational flow motion generated by diagonal ridges placed on the floor of micromixer is observed and this motion makes the fluid commingle. On the contrary, there are two rotational flow structures in the SHM and the centers of rotation exchange their position each other every half cycle because of the V shape of ridges varying their orientation every half cycle. Local rotational flow and local extensional flow generated by the complicate ridge pattern make the flow be chaotic and accelerate the mixing of fluid. The dominant parameter that influences on the mixing characteristic of SHM is not the length of micromixer but the number of ridges under the same flow configurations.

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고배율 현미경의 자동초점장치 (An Auto-focusing system for a Iligh Resoulution Microscope)

  • 이호재;이상윤;공인복;김승우
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 1993년도 추계학술대회 논문집
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    • pp.255-260
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    • 1993

  • This study proposed a new autofocusing method for a high resolution microscope with a depth of focus of a submicron range. The experimental setup was characterized by nulling method for bi-cell prhotodiode which had two active areas on sensor surface. The optical systems used in this method had was very simple and was easily matched to microscopes which had used widely. It was shown that the resolution was very high (about 20 nm) by experimental results. This method can be used in the semiconduct industry because it can find defects on the silcon wafer.

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