• Journal of the Institute of Electronics Engineers of Korea SD
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• v.44 no.6 s.360
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• pp.34-41
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• 2007

We popose a programmed on-line to FSM-based Programmable BIST(Buit-In Self-Test) with selected command, to select a test algorithm from a predetermined set of algorithms that are built in the Flash memory BIST. Thus, the proposed scheme greatly simplifies the testing process. Besides, the proposed FSM-based Programmable BIST is more efficient in terms of circuit size and test data to be applied, and it requires less time to configure the Flash memory BIST. We also will develop a programmable Flash memory BIST generator that automatically produces Verilog code of the proposed BIST architecture for a given set of test algorithms. If experiment the proposed method, the proposed method will achieves a good flexibility with smaller circuit size compared with previous methods.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.6
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• pp.48-55
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• 1998

In this work, the testable CAM(Content Addressable Memory) is designed to perform the test effectively by inserting the ECC(Error Checking Circuit) inside the CAM. The designed CAM has the circuit which is capable of testing the functional faults in read, write, and match operations. In general the test circuit inserted causes the increase of total circuit area, Thus this work, utilizes the new MTA code to reduce the overhead of an area of the built-in test circuit which has a conventional parallel comparator. The designed circuit was verified using the VHDL simulator and the layout was performed using the 0.8${\mu}{\textrm}{m}$ double metal CMOS process. About 30% reduction of a circuit area wad achieved in the proposed CAM using the XOR circuit

• KIPS Transactions on Software and Data Engineering
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• v.4 no.1
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• pp.9-18
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• 2015

Software Reliability Growth Models (SRGMs) are useful for determining the software release date or additional testing efforts by using software failure data. It is not appropriate for a SRGM to apply to all software. And besides a large number of SRGMs have already been proposed to estimate software reliability measures. Therefore selection of an optimal SRGM for use in a particular case has been an important issue. The existing methods for selecting a SRGM use the entire collected failure data. However, initial failure data may not affect the future failure occurrence and, in some cases, it results in the distorted result when evaluating the future failure. In this paper, we suggest a method for selecting a SRGM based on the evaluation goodness-of-fit using partial data. Our approach uses partial data except for inordinately unstable failure data in the entire failure data. We will find a portion of data used to select a SRGM through the comparison between the entire failure data and the partial failure data excluded the initial failure data with respect to the predictive ability of future failures. To justify our approach this paper shows that the predictive ability of future failures using partial data is more accurate than using the entire failure data with the real collected failure data.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.10
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• pp.45-51
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• 2003

In this paper, a scan-based low power BIST (Built-In Self-Test) architecture is proposed. The proposed architecture is based on STUMPS, which uses a LFSR (Linear Feedback Shift Register) as the test generator, a MISR(Multiple Input Shift Register) as the reponse compactor, and SRL(Shift Register Latch) channels as multiple scan paths. In the proposed BIST a degenerate MISR structure is used for every SRL channel; this offers reduced area overheads and has less impact on performance than the STUMPS techniques. The proposed BIST is designed to support both test-per-clock and test-per-scan techniques, and in test-per-scan the total power consumption of the circuit can be reduced dramatically by suppressing the effects of scan data on the circuits. Results of the experiments on ISCAS 89 benchmark circuits show that this architecture is also suitable for detecting path delay faults, when the hamming distance of the data in the SRL channel is considered.

• Proceedings of the KIEE Conference
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• 2008.07a
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• pp.1855-1856
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• 2008

본 연구에서는 공정 중에 민감하게 반응하는 플라즈마로부터 수집되는 이온에너지 분포(IED : Ion Energy Distribution)와 시계열 신경망 모델링을 결합한 플라즈마 감시 기술을 개발하였다. NIEA(Non-invasive ion analyzer)를 이용하여 IED를 측정하였으며, 모델링에 사용된 신경망은 자기 상관 시계열 신경망(A-NTS : Auto-Correlated Neural Time-Series)이다. 모델 개발을 위한 학습과 테스트 데이터로는 Duty ratio 100%에서 수집한 IED를 이용하였으며, 개발된 모델의 감시 성능은 60%에서 수집된 IED로 평가하였다. 학습인자 k와 m의 범위는 각각 1-3 으로 총 9종류의 (k, m) 조합에 대해서 모델 성능을 평가하였다. 신경망 은닉층 뉴런수는 2-9의 범위에서 최적화하였다. 최적화된 모델은 (2, 3)과 뉴런수 2에서 구해졌으며, 0.335의 예측 에러를 보였다. 60% IED 데이터로 평가한 결과 플라즈마 고장에의 민감도는 62% 이상이었다. 이는 IED의 A-NTS 모델이 플라즈마 고장의 감시에 효과적으로 적용될 수 있음을 의미한다.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.34C no.1
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• pp.1-11
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• 1997

A BiCMOS circuit consists of the CMOS part which performs the logic function, and the bipolar part which drives output load. In BiCMOS circuits, transistor stuck-open faults exhibit delay faults in addition to sequential beavior. Also, stuck-on faults enhanced IDDQ (quiscent power supply current) at steady state. In this paper, a method is proposed which efficiently generates test patterns to detect stuck-open faults and stuck-on faults in BiCMOS circuits. The proposed method divides the BiCMOS circuit into pull-up part and pull-down part, and generates test patterns detect faults occured in each part by structural property of the BiCMOS circuit.

• Journal of the Korea Society of Computer and Information
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• v.12 no.6
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• pp.89-96
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• 2007

Finite failure NHPP models presented in the literature exhibit either constant. monotonic increasing or monotonic decreasing failure occurrence rates per fault. Accurate predictions of software release times. and estimation of the reliability and availability of a software product require quality of a critical element of the software testing process : test coverage. This model called Enhanced non-homogeneous Poission process(ENHPP). In this paper, exponential coverage and S-type model was reviewed, proposes modified(the superosition and mixture) model, which make out efficiency application for software reliability. Algorithm to estimate the parameters used to maximum likelihood estimator and bisection method. model selection based on SSE statistics for the sake of efficient model, was employed.

• Convergence Security Journal
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• v.7 no.3
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• pp.7-13
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• 2007

Finite failure NHPP models presented in the literature exhibit either constant, monotonic increasing or monotonic decreasing failure occurrence rates per fault. Accurate predictions of software release times, and estimation of the reliability and availability of a software product require quantification of a critical element of the software testing process : test coverage. This model called Enhanced non-homogeneous poission process (ENHPP). In this paper, exponential coverage and S-shaped model was reviewed, proposes the superposition model, which maked out efficiency application for software reliability. Algorithm to estimate the parameters used to maximum likelihood estimator and bisection method, model selection based on SSE statistics for the sake of efficient model, was employed.

• The Journal of the Acoustical Society of Korea
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• v.26 no.6
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• pp.269-275
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• 2007

Pervasive Multi-channel audio systems are being realized due to advances in digital technology. This paper proposes an efficient system that serially connects individual speakers with bidirectional digital communication capability by means of SoC design. In particular, each speaker can identify the bit stream assigned to the speaker and convert it into analog audio. Furthermore, the speaker can self-diagnose the speaker functionality by utilizing the designed capability to measure frequencies of various square wave test signals. The proposed system running on 200MHz clock yielded restoration of analog output signal with latency of only $500{\mu}s$ compared to directly driving the speakers in a traditional way.

• Convergence Security Journal
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• v.12 no.6
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• pp.85-92
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• 2012

There are many software reliability models that are based on the times of occurrences of errors in the debugging of software. It is shown that it is possible to do asymptotic likelihood inference for software reliability models based on infinite failure model and non-homogeneous Poisson Processes (NHPP). For someone making a decision about when to market software, the conditional failure rate is an important variables. The finite failure model are used in a wide variety of practical situations. Their use in characterization problems, detection of outliers, linear estimation, study of system reliability, life-testing, survival analysis, data compression and many other fields can be seen from the many study. Statistical Process Control (SPC) can monitor the forecasting of software failure and there by contribute significantly to the improvement of software reliability. Control charts are widely used for software process control in the software industry. In this paper, we proposed a control mechanism based on NHPP using mean value function of log Poission, log-linear and Parto distribution.