• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2004.10a
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• pp.134-138
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• 2004

The discrepancies between theoretical values and measured data of PEFC(Proton Exchange Fuel Cell) is carried out for the machine tool power generation. Rudimental approach of theoretical fuel cell open circuit potential using Gibbs free energy is employed for the examination of PEFC module. The stack temperature, stack voltage and stack current are measured during the operation of PEFC module. It is found that stack voltage and current values show the pronounced discrepancy with the results calculated by Gibbs free energy approach. It is analysed that the discrepancy is due to activation polarization, concentration overvoltage and ohmic overvoltage.

• Transactions of the Korean Society of Machine Tool Engineers
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• v.14 no.1
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• pp.1-7
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• 2005

PEMFC (Proton Exchange Membrane Fuel Cell) is considered as an attractive option to produce electric power in manyapplications. A fundamental step of theoretical fuel cell open circuit potential is examined and compared with the measured data from 1.2KW PEMFC module. The hydrogen pressure and stack temperature are also measured during the operation of PEMFC module. It is found that the stack voltage and current data agree in general with the results calculated by chemical potential approach though they still have a discrepancy. It is analysed that the discrepancy is due to activation polarization, concentration overvoltage and ohmic overvoltage.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.35D no.9
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• pp.26-34
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• 1998

This paper presents a characterization method for faults of circuit patterns on MCM(Multichip Module) or PCB(Printed Circuit Board) substrates with electron beams of a SEM(Scanning Electron Microscope) by inducing voltage contrast on the signal line. The experimentation employes dual potential electron beams for the fault characterization of circuit patterns with a commercial SEM without modifying its structure. The testing procedure utilizes only one electron gun for the generation of dual potential electron beams by two different accelerating voltages, one for charging electron beam which introduces the yield of secondary electron $\delta$ < 1 and the other for reading beam which introduces $\delta$ > 1. Reading beam can read open's/short's of a specific net among many test nets, simultaneously discharging during the reading process for the next step, by removing its voltage contrast. The experimental results of testing the copper signal lines on glass-epoxy substrates showed that the state of open's/short's had generated the brightness contrast due to the voltage contrast on the surface of copper conductor line, when the net had charged with charging electron beams of 7KV accelerating voltages and then read with scanning reading electron beams of 2KV accelerating voltages in 10 seconds. The experimental results with Au pads of a IC die and Au plated Cu pads of BGA substrates provided the simple test method of circuit lines with 7KV charging electron beam and 2KV reading beam. Thus the characterization method showed that we can test open and short circuits of the net nondestructively by using dual potential electron beams with one SEM gun.